DC, RF and Optical Probe Positioning for Highest Accuracy Measurements FormFactor offers a wide variety of manual and motorized probe positioners for any application from DC to terahertz measurements and beyond.

Accommodates a combination of up to four Cascade Microtech probes Configurable for mixed-signal RF/mmW testing Quick and easy repairs to be performed in the field, by simply replacing individual probes

Can help to stabilize oscillations in high-gain devices Impedance match to low dynamic resistance laser diodes Custom configured for your application

Light-tight version and EMI-shielded version for low noise and light-sensitive measurements Application flexibility, ideal for use in high frequency applications Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system

Re-configurable for DC, RF, mmW, FA, WLR and more Thermal range: -60˚C to 300˚C available Upgrade path to meet your future needs Stable and repeatable measurements over a wide thermal range

Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies Enables up to 5x faster time to accurate data

Low insertion loss Low contact resistance Lithographically defined probe tip   Nickel contacts

On-wafer power device characterization up to 10,000 V DC / 600 A Safe and convenient integration kits to support T.I.P.S. “LuPo” High Voltage / High Power Probe Cards Prevent thin wafers from curling and breaking

Advanced MicroVac chuck surface for minimum contact resistance between wafer and chuck Safety-rated interlock system for high-power testing (meets EN 60947-5-1, EN 60204-1)

Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown Even distribution of high current with innovative multi-fingertip design Compatible with TESLA 200/300 mm power device characterization system

Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz Online design configuration tool helps you to specify your probe in minutes All designs are fully quadrant compatible

Easy and fast setup of camera views Go to Light and Image Settings of the selected camera view with only one mouse click Guided workflows for wafer setups, alignment tools and Autonomous Assistants Workflow wizard shows task-relevant settings and options only