PSI University Resources Page

Using TDR Technology to Debug and Solve Signal Integrity Impairments

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

Using TDR Technology to Debug and Solve Signal Integrity Impairments Join Teledyne LeCroy to learn how to measure and analyze impedance on cables, connectors and PCBs using TDR (Time Domain Reflectometry) instruments.

Topics to be included:

  • TDR Basics
  • Rise Time of the TDR-Pulse vs Resolution
  • Why we use filtered impedance curves
  • How to convert the impedance plot into distance
  • What additional information provides the frequency range?
  • How to probe PCBs using TDR probes

Who should attend? Engineers dealing with high-speed data signals who want to identify and evaluate the effect of impedance changes in cables, connectors and printed circuit boards.

What attendees will learn? To learn how to measure and analyze impedance on cables, connectors and PCBs using TDR.

Presenter: Thomas Stueber, Group Leader Applications, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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4 Practical Real-world Examples of Embedded System Validation and Debug

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

4 Practical Real-world Examples of Embedded System Validation and Debug

In this session (Part 3), we apply the display, measurement and waveform math tools covered in Part 1 and 2 to specific embedded design application examples.

Topics to be included:

  • Power rail integrity measurements and probing power rails
  • Power rail sequence measurements
  • Low-speed event correlation to high-speed event
  • Correlating sensor signals with embedded serial data

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

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Debug Embedded Systems with Your Oscilloscope - Part Two: Advanced Measurements and Math Fundamentals

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Advanced Measurements and Math

In this session (Part 2), we will develop skills for acquiring and performing measurements, waveform math, and analysis that isolate and help us locate amplitude and timing errors within an embedded design.

Topics to be included:

  • Plotting measurement values over time
  • Waveform math tools
  • Measurement parameter Tracks and Trends
  • Serial data triggering and decode
  • Mixed signal digital capture and integration

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

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Junkosha: Phase Stability against Bending in Microwave and Millimeter wave

During microwave and mmWave measurement processes, a cable's reliability – particularly its phase stability – is critical. Junkosha has developed a cable with minimal phase fluctuation against bending, which has been achieved through innovative materials and processing technology.

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USB Type-C® Technologies Webinar Series Part 3: USB3.2 Physical Layer Compliance Testing and Debug

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USB Type-C® Technologies Webinar Series

Join Teledyne LeCroy for our webinar series on USB Type-C technologies with a focus on the physical layer, from an introduction to the various technologies in the Type-C ecosystem to USB 3.2, USB4™, Thunderbolt™, DisplayPort™, USB4 Type-C sideband (USB Power Delivery, DisplayPort AUX, USB4 SB) testing.

USB3.2 Physical Layer Compliance Testing and Debug

In Part 3, we will focus on the USB3.2 specification given its ubiquitous use for USB peripherals. We will cover new test requirements for the USB3.2 CTS and the tools for testing it.

Topics to be covered in this webinar:

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ACT: Heat Pipe Reliability Guide

ADVANCED COOLING TECHNOLOGIES, INC. (ACT) HAS WORKED EXTENSIVELY ON HEAT PIPE PRODUCT RELIABILITY. This guide provides information for designing, modeling, and practical reliability surrounding copper/water heat pipes.

A heat pipe is a two phase heat transfer device with very high “effective” thermal conductivity. It is a vacuum tight device consisting of an envelope, a working fluid, and a wick structure. As shown below, the heat input vaporizes the liquid working fluid inside the wick in the evaporator section. The saturated vapor, carrying the latent heat of vaporization, flows towards the colder condenser section. In the condenser, the vapor condenses and gives up its latent heat. The condensed liquid returns to the evaporator through the wick structure by capillary action. The phase change processes and two phase flow circulation continue as long as the temperature gradient between the evaporator and condenser are maintained.

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Hands-on Workshop: Fast and easy hardware testing with JTAG Boundary Scan

This highly technical on-line training comes in the form of a series of videos in which our experts will provide you with a hands-on introduction to JTAG boundary scan. You will connect to a remote PC from your browser to use a full XJTAG development system connected to live demo hardware. These practical sessions are interspersed with theory to explain the principles you are applying. 

By the end, you will have a solid understanding of how boundary scan works, how it helps to bring-up a prototype and debug a failing board; and how to create and run tests. 

The course is expected to take about 3 hours in total but can be completed in several sittings. 

What you’ll learn 

Learn the basics of boundary scan and how you can use it across the full product life-cycle to improve designs and reduce re-spins, and to enhance test coverage, fault diagnosis and production yields on complex high-density electronics. The following topics are covered: 

  • Why the JTAG standard was developed 
  • How a JTAG devices’ boundary scan cells are used for testing an assembled board 
  • How the JTAG signals control a JTAG IC’s internal registers 
  • Setting up an XJLink to access a board using JTAG (practical) 
  • Get a JTAG chain running and check its high-speed performance (practical) 
  • BSDL files – contents and format 
  • Use the XJAnalyser software to set and read pins on JTAG devices (practical) 
  • Explore the different JTAG modes (practical) 
  • Use XJAnalyser to manually test LEDs and an oscillator (practical) 
  • How XJTAG’s automatically generated interconnect test works 
  • How boundary scan can test non-JTAG devices 
  • Run tests and debug a failing board (practical) 
  • What circuit data is used when developing boundary scan tests 
  • Create a test project to test a board (practical) 

Course requirements: A PC with a browser to connect to a remote PC.No prior knowledge of JTAG is required. 

Who is this course for? Engineers working in electronic design, development, test, or manufacturing.

Click here to register

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5 Tips for Power Integrity Debug Part 5: How to Become an Expert in Power Integrity Testing

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How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

5 Tips for Power Integrity Debug

In this session (Part 5), Dr. Eric Bogatin will begin to steer our 8-part series from fundamentals to detailed real-world advice to help you debug power integrity problems faster. This webinar will include demonstrations of multiple techniques on an example microcontroller board.

Topics to be covered in this webinar:

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Teledyne LeCroy: How Do I Rescale a Sensor to Use With an Oscilloscope?

Teledyne LeCroy: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?

Time: 11 AM Pacific | 2 PM Eastern

Duration: 30 minutes

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.  Click here to access the entire series.

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Debug Embedded Systems with Your Oscilloscope - Part One: Signal Display and Measurement Fundamentals

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Signal Display and Measurements

In this session (Part 1), we will discuss the various signal display and measurement tools available in oscilloscopes and how to avoid the traps and pitfalls that lead to inaccurate or inefficient measurements. We will also review how to extract circuit details from both short and long record acquisitions to aid in debugging of embedded designs.

Topics to be included:

  • Improving measurements with multi-grids
  • Analytical waveform views
  • Using measurement parameters effectively
  • Best uses of statistical data and views
  • Pass/Fail parameter testing

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

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How to Become an Expert in Automotive Ethernet Testing - Part 4: Debugging PHY Layer Link Communication Learning Lab

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Debugging PHY Layer Link Communication Learning Lab

In this session (Part 4), we review Automotive Ethernet link communication and explore how to debug and troubleshoot these links using an oscilloscope during an interactive session with live signals. We will look at both the physical and protocol layers during this Learning Lab webinar.

Topics to be covered in this webinar:

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Junkosha: Cable Flexibility

Cable flexibility is important for stable measurement and wiring efficiency between the measuring equipment and device under test. Junkosha provides flexible and low resilience coaxial cables which improve workability with complex wiring and reduces the risk of damage to the instruments and DUT.

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How to De-embed Interconnect Elements in Both Frequency and Time Domains

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Join Teledyne LeCroy as we describe and demonstrate best practices for de-embedding test fixtures, cables, and probes from serial data link and other signal integrity measurements. This is a critically important process to ensure that the signal integrity measurements for the DUT are not contaminated by the interconnection elements.

Topics to be covered in this webinar:

  • Why de-embedding is almost always necessary
  • Best practices for reference-plane calibration
  • Traditional Frequency-domain de-embedding
  • Time-domain gating and peeling (i.e. fixture removal, in-situ de-embedding (ISD))
  • Causality conditions

Who should attend? Hardware engineers who use a Vector Network Analyzer (VNA) to obtain S-parameters for use in emulation software.

What attendees will learn? How to accurately measure S-parameters of high-speed interconnects.

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Debugging Automotive Ethernet Links

Have you ever had a device which passed compliance but did not establish a communication link between Master and Slave? Join Teledyne LeCroy for this webinar as we explore some of the different approaches for debugging Automotive Ethernet links by looking at both the physical and protocol layers.

Who should attend: Engineers and technicians who have worked on or will work on Automotive Ethernet. This session will start with the basics and build on them to cover debugging techniques.

What attendees learn: A working knowledge of how Automotive Ethernet frames compare to standard Ethernet frames, how the link startup sequence works, and how to debug Automotive Ethernet links.

Presenter: Bob Mart, Director of Product Management, Teledyne LeCroy

Register now

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Teledyne LeCroy: Mode-Multiplexed 620-GBd QPSK Transmission over 1200-km DGD-Compensated Few-Mode Fiber

Low differential group delay (DGD) between the modes of a graded-index few-mode fiber is obtained by combining segments with DGD of opposite sign. Transmission of mode-multiplexed 620-GBd QPSK over a record distance of 1200 km is demonstrated.

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Overview of DisplayPort 2.0 Physical Layer and Link Layer Protocols Webinar

Join Teledyne LeCroy for this free webinar for an overview of the DisplayPort 2.0 Physical Layer and Link Layer protocols

The physical layer (PHY) segment of this webinar will cover best known methods for early DP 2.0 PHY Source and Sink testing. While the PHY Compliance Test Specification (CTS) is still under development, PHY testing is largely based on the USB4 and Thunderbolt test methodologies. The PHY segment will ‘connect the dots’ between these test specifications and give guidance on early DisplayPort 2.0 PHY testing.

The Link Layer protocol segment will cover the new protocol elements introduced in the DisplayPort 2.0 specification and how they are structured and represented in a protocol analyzer test instrument.

Presenters:
Mike Engbretson, Teledyne LeCroy Product Manager High Speed Oscilloscopes
Neal Kendall, Teledyne LeCroy QuantumData Video Analyzer Marketing Manager

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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What is Oscilloscope Sample Rate and How Much Do I Need? by Teledyne LeCroy

Teledyne LeCroy: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?

In this webinar we define what sample rate is and what high sample rate provides. We also describe minimum sample rates required and maximum practical sample rates needed for your signal and your oscilloscope.

Register Here

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

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Teledyne LeCroy: DesignCon 2012 - Robust Method for Addressing 12 Gbps Interoperability for High-Loss and Crosstalk-Aggressed Channels

This paper addresses a new methodology for 12 Gbps interoperability that combines a concerted family of pathological channels, internal eye monitoring, and external EQ simulation tools, providing insight into an EQ optimization strategy that addresses the specific channel’s mix of crosstalk noise, jitter, and channel loss. This also provides a backplane designer the ability to configure a high-loss, crosstalk aggressed system.

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Teledyne LeCroy: Enhanced Sample Rate Mode Measurement Precision

Enhanced Sample Rate, combined with the low-noise system architecture and the tailored brick-wall frequency response in the HDO4000A, HDO6000A, HDO8000A and MDA800A series oscilloscopes dramatically improves the measurement precision when the input frequency signals are very high frequency, such as a high-frequency sine wave or fast edge.

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Selecting a Battery Cycler or Building Your Own: Top 10 Considerations

Selecting battery test equipment is not as obvious as it might seem. The wrong choice will lead to major integration challenges as well as setbacks including hidden development costs, delayed test start dates, increased complexity, project risks and reduced safety.

This presentation will cover the top 10 factors to consider when deciding to buy a battery cycler, or building your own battery test system with sources and loads, or bidirectional power supplies. In this webinar, we’ll explain key considerations for testing batteries to ensure safety, product performance, flexibility, and time to market. Key topics include:

  • Fundamental differences between battery cyclers and build your own approaches
  • The hidden technical challenges in building your own test system
  • Future-proofing your test solutions
  • How to reduce time to market and improve engineering productivity 

Register Now!

If you cannot attend the live event, please register and we will send you the recording.

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How to Debug USB4® PHY-logic and Sideband Link Layers by Teledyne LeCroy

Presenter: Mike Engbretson and Mike Micheletti

Have you thought about using an oscilloscope and a protocol analyzer together to debug USB system level interoperability failures? In this webinar learn practical methods for uncovering compliance and interoperability issues using an oscilloscope.

Register Here

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Advanced Illumination: Photometric Stereo Technique for Machine Vision

Objects with unique 3D aspects can make identifying surface defects with standard machine vision configurations more difficult. One solution to achieve feature-appropriate surface contrast is Photometric Stereo.

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How Can I Reduce Noise on Signals Measured With an Oscilloscope? by Teledyne LeCroy

Teledyne LeCroy: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?

In this webinar we describe common causes of oscilloscope noise and how additive noise from the oscilloscope can be reduced to improve the quality of your measurement result, regardless of the starting resolution/noise of your oscilloscope.

Register Here

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

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Fundamentals of Advanced Measurements and Math

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Advanced Measurements and Math

In this session (Part 2), we will develop skills for acquiring and performing measurements, waveform math, and analysis that isolate and help us locate amplitude and timing errors within an embedded design.

Topics to be included:

  • Plotting measurement values over time
  • Waveform math tools
  • Measurement parameter Tracks and Trends
  • Serial data triggering and decode
  • Mixed signal digital capture and integration

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

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Free Hands-on Webinar: Fast & easy hardware testing using JTAG Boundary Scan

Testing your high-density circuit boards is time consuming and expensive? Now is the time to learn how you can quickly find and fix faults on your electronics using JTAG testing. 

This 2 to 3-hour webinar is designed to provide PCB design, development, test, and production engineers with a hands-on introduction to JTAG boundary scan, using real hardware.

Thursday, March 7, 2024 – 11 am EST 

Free Webinar & Interactive Workshop, presented in English


What you will learn:

Learn how to setup and run boundary scan tests on your board. Discover how you can use JTAG right across the product life-cycle to improve designs, reduce re-spins and enhance test coverage, fault diagnosis and production yields on complex BGA-populated circuits. 

You will have access to a full XJTAG development system to give you the experience of developing and running boundary scan tests. 

The webinar will be run by our expert test engineer (all you need is a web browser). No prior knowledge of JTAG is required. 

Further hardware access time will be made available to you afterwards, should you wish to review some of the exercises covered during the session.

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How to Become an Expert in Automotive Ethernet Testing - Part 3: Mastering Transmitter Droop, Distortion, Jitter and Spectral Density Test

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Mastering Transmitter Droop, Distortion, Jitter and Spectral Density Test

In this session (Part 3), we will describe the requirements for the Physical Media Attachment (PMA) compliance tests with practical demonstrations using complex signals while indicating the procedures for obtaining the best measurement results and signal integrity.

Topics to be covered in this webinar:

  • Maximum Output Droop
  • Transmitter Distortion
  • Transmitter Timing Jitter, Master and Slave
  • Transmitter Power Spectral Density (PSD)
  • Transmitter Peak Differential Output
  • Transmitter Clock Frequency

Who should attend? Engineers and technicians looking to learn more about the physical layer compliance test process for Automotive Ethernet.

What attendees will learn? What to expect when setting-up and performing Automotive Ethernet physical layer tests. Each of the different tests will be covered in detail with hands-on experience.

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The Impact of Power Rail Noise on Clock Jitter

Noise on the power rail may not only create bit errors due to voltage spikes, but it may also increase clock jitter. Clock jitter is an insidious source of noise difficult to debug.

In this webinar, we demonstrate how to measure the jitter in both clocks and data and identify the contribution from noise on the power rail. These techniques can be applied to any system in which minimizing clock and data jitter is important.

Topics to be covered in this webinar:

  • Using time interval error (TIE) to measure jitter
  • The statistics and spectrum of TIE as a way of characterizing jitter
  • Typical jitter in various types of oscillator circuits
  • Best practices to measure power rail noise
  • The impact power noise can have on clock jitter
  • Examples of clocked systems with high and low jitter sensitivity to power rail noise

Who should attend? Hardware and circuit engineers who design interconnects and clocked circuits.

What attendees will learn? This webinar will introduce you to how to measure jitter and power rail noise, and how to reduce the sensitivity of your clocks to power rail noise.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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PRODUCT DEMO: AR Automotive EMC Chambers

Amplifier Research

EMC Live: Automotive 

Automotive electronics developments have impacted automotive EMC testing by exposing higher frequency RF technologies to the lab. AR is making this easier for the lab and Test Engineering by bringing state-of-the-art shielding capabilities to their product line-up by joining forces with Comtest, a leader in shielding technologies and RF absorber techniques. In addition to being a technology leader, AR is now a full-service EMC solution provider. We will discuss how AR chambers use the latest in RF technologies to make testing repeatable, reproducible, and safe from 10 kHz to above 40 GHz to support these new technologies in ways that legacy shielding could not. 

REGISTER NOW

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Teledyne LeCroy: How to Perform Double Pulse Testing (DPT) on GaN and SiC Devices

Date: Wednesday, September 6, 2023

Time: 11 AM Pacific | 2 PM Eastern

Duration: 60 minutes

How to Perform Double Pulse Testing (DPT) on GaN and SiC Devices

Join Teledyne LeCroy to see Double Pulse Testing performed on Gallium nitride (GaN) and Silicon carbide (SiC) power semiconductor devices. Learn more about various safety measures that need to be addressed before making measurements and what to infer from the captured waveforms.



Topics to be covered in this webinar:

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ACT: Thermal Solutions for Power Electronics

Power Electronics are the most critical components in a large number of applications; including power generation and operational equipment. Power Electronics module manufacturers invest millions of dollars to make these devices as effcient as possible, aiming primarily to reduce waste heat. However, even with effciency gains at the module level, overall waste heat is rising across the industry due to more system and user driven functional requirements. Increased system capability leads to higher power densities and more waste heat! Selecting off the shelf thermal solutions is no longer a viable option for applications that are pushing the envelope on power and operating effciency.

Investing in an optimal thermal solution can be the design change with the largest payback potential in a high power system. If properly designed, the thermal management system should not only meet performance requirements, but do so while minimizing energy usage. This eBook provides a guide for designers looking to expand the operating limits of traditional air and liquid cooled thermal solutions.

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Back to Basics with AR
An All Day Webinar Event
 
Date: Thursday, July 08, 2021
 
Time: 10:00 AM - 4:00 PM EDT
 
Join Amplifier Research on July 8th for a full day virtual event and learn the fundamentals of EMC Testing. Register for one or more webinars.
 
AGENDA
 
10:00 AM
EMC 101
11:00 AM
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Teledyne LeCroy: All-ETDM 80-Gbaud (160-Gb/s) QPSK Generation and Coherent Detection

A single-polarization 160-Gb/s (80-Gbaud) electronically time-division-multiplexed (ETDM) quadrature phase-shift-keyed (QPSK) signal is generated and coherently detected using two 45-GHz-bandwidth oscilloscope prototypes and offline processing.

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Free Webinar: AC Load Testing Fundamentals

This webinar will review the fundamentals of ac loading for testing applications across residential, commercial, electric vehicles, aerospace, and military markets. We’ll dive into key features and functions of both traditional and modern ac loading conditions and their many applications across these industries. The ability for ac loads to emulate complex load profiles to include harmonics and sub-cycle transients is important for testing the device and/or the grid to meet modern day requirements.

Learn about the most effective test approaches and test solutions to ensure accuracy, product performance, safety, and reduced time to market. Example applications include testing the grid, inverters, lock rotor current, EVSE, avionics, UPS, switch and fuses, and more.

Key Technical Concepts:

  • Regenerative power
  • AC load 4 quadrant operation
  • True power factor shift
  • Linear, non-linear, inductive and capacitive loading
  • Testing in various emulation modes: CC, CR, CP, SC
  • How to create complex load profiles
  • Harmonics and sub-cycle transients

Click here to register!

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A Systematic Approach to cooling in the Energy and Power Electronic Industries

Advanced Cooling Technologies, Inc.

A Systematic Approach to cooling in the Energy and Power Electronic industries

Thermal management with respect to the energy and power electronic industries becomes a balance of understanding the systems waste heat and minimizing the parasitic energy losses. In this webinar we will take a systematic approach to thermal engineering and analyze multiple technologies coupled together to drive the most efficient design. Join us as we dive into solving one of the most demanding and continuously evolving challenges in thermal engineering. Designers looking to enhance passive heat transfer to reduce overall energy consumption will learn about two phase technology, while the system engineers will learn how to ingrate component-based cooling with ultimate heat rejection technique. Viewers will leave with a strong understanding of how to apply multiple thermal technologies to support system cooling.

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Mastering the TDR in 45 Minutes

The workhorse instrument used to characterize all PCB traces is the Time Domain Reflectometer (TDR). But its measurements are often mis-interpreted because the impedance properties of transmission lines are confusing.

Join Eric Bogatin and Teledyne LeCroy for this webinar that will show you the right way to think about signals on transmission lines and how to interpret TDR results. Using live measurements, we’ll look at some cool examples of the properties of real circuit board traces.

Topics to be covered in this webinar:

  • What is characteristic and instantaneous impedance?
  • How a TDR measures instantaneous impedance
  • How to read the characteristic impedance off the front screen of a TDR
  • How to interpret discontinuities
  • The limitations to a single channel TDR

Who should attend? Any engineer who uses a TDR or uses TDR measurements.

What attendees will learn? How to get the most value from TDR measurements to analyze your interconnects.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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ACT: ICE-Lok™ - Thermally Enhanced Wedgelocks for Embedded Computing

Embedded computing systems are rapidly increasing in power densities, making thermal solutions a major design concern. In most cases, designers prefer a predominantly conduction cooled approach, which provides the highest reliability.

ACT’s Isothermal Card Edge, or ICE-Lok™ wedgelocks, are designed to enhance card-to-chassis conduction by enhancing the heat flow through the wedgelocks by making additional contact between the card and the chassis. Learn more about ICE-Lok™ and see how it is utilized to improve thermal efficiency in embedded computing systems. ICE-Lok™ is a patented product. Copyright ACT 2018. All rights reserved.

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Xena Networks: How to test BroadR-Reach? Automotive Ethernet Solutions

Companies manufacturing all sorts of products use Quality assurance (QA) to prevent errors and mistakes in their products and ensure flawless product deliveries to their customers. This willimprovecustomer satisfaction and reducethe need for after-salestroubleshooting and support.

QA give companies get a systematic process to find outif their products meet what is required. QA defines requirements for developing and manufacturing reliable products.A driving force behind QA is the ISO(International Organization for Standardization). ISOhas developed the ISO 9000international standard, on which many companies base their QA system.

QA testing is done during and after development andprovidesinformationtodevelopers if changes or improvements are required.During product development the development team will do thorough testing of the product, covering e.g. functional and stress testing of the basic functionality of the product. QA testing of physical products normally includes stress testing of a number of environmental conditions.QA tests that may be conducted include:

  • EMC Tests •Mechanical Tests
  • Thermal/Humidity Tests
  • Hi-Pot Tests
  • Sand and Dust Tests
  • Salt Spray Tests

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Teledyne LeCroy: Put a Current Probe on Every Channel

Teledyne LeCroy current probes are supported on every channel of every oscilloscope we make for the widest view of all your signals.

  • 30 - 500 A input with high sensitivity for precise low-current measurements
  • Powered from the oscilloscope, no external power supply required
  • Like using your 3rd-party probe/sensor? Use the CA10 to adapt it to Teledyne LeCroy oscilloscopes

Teledyne LeCroy - Video Library

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Debug Embedded Systems with Your Oscilloscope - Part Three: Real-world Examples

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

4 Practical Real-world Examples of Embedded System Validation and Debug

In this session (Part 3), we apply the display, measurement and waveform math tools covered in Part 1 and 2 to specific embedded design application examples.

Topics to be included:

  • Power rail integrity measurements and probing power rails
  • Power rail sequence measurements
  • Low-speed event correlation to high-speed event
  • Correlating sensor signals with embedded serial data

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

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Thermal Management of Advanced Aviation Systems

Advanced Cooling Technologies, Inc.

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SI/PI Measurements on a Budget Webinar Part 4: How to Become an Expert in Power Integrity Testing

Register Now

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

SI/PI Measurements on a Budget

In this session (Part 4), we will show you how you get the most out of your oscilloscope for power integrity measurements without spending a lot of money, including the right way you can do five common SI and PI measurements with a budget scope and some simple probes you probably already have around your lab. We’ll also show some of the common artifacts to avoid so you can get meaningful measurements.

Topics to be covered in this webinar:

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Teledyne LeCroy: MAUI Studio – Pro LabNotebook

In this video, we show how to use LabNotebook with the Teledyne LeCroy MAUI Studio oscilloscope software. With LabNotebook, you can save your signals, setups and screenshots to share with a colleague or add to a report. For additional information visit, teledynelecroy.com/mauistudio.

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Teledyne LeCroy: Space-Division Multiplexed Transmission over 4200-km 3-Core Microstructured Fiber

We experimentally demonstrate multiple-input-multiple-output transmission of a combined 3-space-, and 2-polarization-, and 5-wavelength-division multiplex in a 3-core microstructured fiber over 4200 km. This is the record transmission distance for spatial-division multiplexing in a fiber.

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Teledyne LeCroy: 12 x 12 MIMO Transmission over 130-km Few-Mode Fiber

We demonstrate 12 x 12 multiple-input multiple-output mode multiplexed transmission over 130-km of few-mode fiber of a combined 6-space-, 2-polarization-, and 8-wavelength-division multiplex, using low-loss photonic lantern and 3D-waveguide mode multiplexers.

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Probe Safety Demystified: Dynamic Range and Voltage Swing

One of the most basic things to know when using any probe is “what is the maximum voltage the device can safely measure?” The answer isn’t as straightforward as you might imagine, it requires understanding several key probe specifications as well as the nature of your signal.

Single-ended Range

Everyone is pretty familiar with single-ended range: that's the maximum safe voltage input to ground, shown in Figure 1. Ground is directly tied to oscilloscope ground, which is tied to building ground. Therefore, when measuring voltage within this range using a single-ended probe, the ground connection cannot be a floating voltage, or you could damage the probe, the DUT, the oscilloscope...maybe yourself, as well. Single-ended voltage must be a grounded voltage on your board or something that could be tied to ground.

Dynamic Range and Maximum Non-destruct Input Voltage

Differential mode range is measured between inputs.

Figure 2. Differential mode range is measured between inputs.

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Teledyne LeCroy: MAUI Studio – Embed Real-time Scripts

In this video, we show how you can use scripts to exchange data in real time between Teledyne LeCroy MAUI Studio oscilloscope software and third-party applications like MATLAB, Excel and LabVIEW. For additional information visit, teledynelecroy.com/mauistudio.

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How Much Memory Do I Need to Use in my Oscilloscope by Teledyne LeCroy

Teledyne LeCroy: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?

In this webinar we define what acquisition memory is in a digital oscilloscope. We also define how acquisition memory, sample rate and capture time are interrelated.

Register Here

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

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Teledyne LeCroy: 32-bit/s/Hz Spectral Efficiency WDM Transmission over 177-km Few-Mode Fiber

We transmit 32 WDM channels over 12 spatial and polarization modes of 177 km few-mode fiber at a record spectral efficiency of 32 bit/s/Hz. The transmitted signals are strongly coupled and recovered using 12 x 12 multiple-input multiple-output digital signal processing.

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Teledyne LeCroy: How to Debug PCI Express® Power Management Behaviors

Time: 11 AM Pacific | 2 PM Eastern

Duration: 60 minutes

How to Debug PCI Express® Power Management Behaviors

Do you struggle to debug PCIe® interactions between protocol and electrical behaviors during power management transitions or during rapid or unpredictable rail voltage loads that cause power integrity issues? Join Teledyne LeCroy industry experts to learn advanced debugging techniques that can drastically improve time-to-market.



Topics to be covered in this webinar:

  • Debugging power management transitions including L1 and L1 substates
  • Dynamic power characterization during Active State Power Management (ASPM)
  • Precise time measurements between protocol commands and electrical behaviors

Who should attend? PCI Express validation, interoperability, applications and test engineers.

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Teledyne LeCroy: How Do I Make an XY Display on an Oscilloscope?

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Best Practices for 48V Power Conversion Testing

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Best Practices for 48V Power Conversion Testing

48 Vdc battery-powered system volumes will grow quickly in automotive and consumer applications. While the voltages are not inherently challenging, oscilloscope, probe and power analyzer innovation have lagged the trend towards >12V battery voltages.

Join Teledyne LeCroy as we describe new products and best practices and measurement techniques for validation and debug of 48 V power conversion systems.

Topics to be covered in this webinar:

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ACT: Webinar - Thermal Considerations for Medical Technology view" >Learn More ❯
ACT: Sealed Enclosure Coolers - Effective Thermal Solutions for Harsh Environments

All electronics dissipate waste heat. In typical high-power electronics cabinets this waste heat can become significant, in the range of 100’s to 1,000’s of Watts. At these levels dissipating the waste heat becomes a critical design issue. Most cabinets that operate in controlled indoor environments use fan filter systems, which duct ambient air through the cabinet, because they are the most eective and ecient way of dissipating the waste heat load. This is also feasible for some outdoor applications assuming rain guards and filters are used.

However, in many applications such as dirty / dusty environments, hose down / wash down facilities in the food industry, harsh outdoor applications, and many others it is not possible or advisable to allow ambient air to flow through and cool the sensitive and expensive components inside your enclosure. The best way to protect electronics is to use a sealed cabinet that does not allow any contaminated ambient air, even filtered air, from entering the cabinet. This is where sealed air-to-air heat exchangers, or sealed enclosure coolers, become an invaluable part of the overall system.

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Junkosha: Phase Stability for Digital Transmission

When measuring the performance of the DUT, if the shift of the data transmission timing – also known as skew – occurs between multiple cable connections, the performance of the DUT cannot be accurately determined. Junkosha has developed a stable transmission rate cable against bending.

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Power Integrity of Multi-Rail Embedded Designs Hands on Webinar

Join Teledyne LeCroy for this hands-on webinar to learn how to characterize and validate the integrity of multiple power rails in a PDN network. The interactions and control of VRM’s, POL’s, LDO’s by Power Management ICs in embedded designs will be analyzed in this webinar.

Topics to be covered in this webinar:

  • Best practices for power rail probing
  • Multi-rail static and transient power analysis
  • Validation of start-up and shutdown delays and sequences
  • Correlation of embedded serial control signals - I2C, SMBus, PMBus, and SPMI - to power management events

Pre-work Recommended Before Hands-on Webinar

It is recommended that prior to the start of the webinar you should download and register (at no cost) MAUI Studio and download LabNotebook (waveform plus setup files) .lnb files (they will be combined into one .zip file that will need extracting).

MAUI Studio
>> https://teledynelecroy.com/mauistudio/

Zip file with Lab Notebook files
>> Click here to download the zip file

These files will allow you to load the various waveform examples shown during the webinar and participate in hands-on instruction on how to make critical power integrity measurements.

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High Speed Serial Data Debugging using a Digital Oscilloscope - Part 3

Time: 15:00 CET

High-speed serial data debugging is becoming more common and demanding at the same time. Data rates are increasing, and operating ranges are narrower. In this 3-part webinar series we will show you how to debug serial data links, starting with captured traces from a digital oscilloscope. 

Topics to be covered in this webinar: 

  • Jitter definitions 
  • Jitter measurements 
  • CDR and PLL: to remove high frequency jitter 
  • The effect jitter has on BER and how to extrapolate to target value 

Requirements: An understanding of high-speed serial data and familiarity with basic concepts related to signal integrity and jitter analysis 

Who should attend?: Engineers getting involved in high-speed serial data links design, debugging and compliance 

Presenter: Maurizio Mastrofini, Teledyne LeCroy 

Can't attend live? Click here to register anyway and we will send you the recording afterward.

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Beyond DDR Compliance Testing — Using Advanced Debug Tools - Part Two of Four

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Become an Expert in DDR Memory Physical Layer Testing Series

Join Teledyne LeCroy for this 4-part DDR Memory Master Class to learn about the basics of DDR testing with oscilloscopes, including common test preparation and challenges, the difference between compliance and debug test tools, and practical tips and techniques to increase your DDR validation efficiency and apply the correct debug tools.

Beyond DDR Compliance Testing — Using Advanced Debug Tools

In this session (Part 2), we review the latest DDR test requirements and provide practical advice on solving test challenges. We will provide guidance on how to test to the latest JEDEC standards and proper use of debug tools to overcome test and validation challenges.

Topics to be included:

  • DDR/LPDDR4, LPDDR4X, and DDR/LPDDR5 specification review
  • Test system ‘bring-up’ and debug
  • When are you ready to move from ‘debug’ to ‘compliance’?
  • Implications of fully encoded command bus and DFE in LPDDR5 and DDR5
  • How to send the proper test signals
  • Read/Write eye separation
  • Eye and jitter measurements

Who should attend? Design and validation engineers working to validate and debug DDR in embedded systems.

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Teledyne LeCroy Jitter Basics - Part 2

Time: 10:00 CET

The demand for more and more data requires faster and faster data transfer rates, where timing uncertainty (i.e., jitter) takes up a larger portion of a system's total time budget. To improve system performance, each new generation of technology must consider and evaluate the impact of jitter. 

This is a 3-part fundamentals course on jitter in clock and data signals that provides a broad overview of the jitter topic. Participants will learn the definitions of the different types of jitter, understand what type of jitter is important for their application, and how to measure jitter with an oscilloscope. Emphasis is placed on developing knowledge of jitter such as developing a common language, understanding jitter beyond definitions, visualizing relationships between different types of jitter, and understanding jitter requirements specifically for fast clock signals and serial data standards such as USB, PCIe, etc.

Topics to be covered in this webinar (Part 2): 

  • Jitter measurements on clock signals 
  • Typical jitter parameters for clock signals 
  • Cycle-to-cycle jitter versus period jitter 
  • The influence of DSO noise on jitter measurements 
  • The spectral consideration of jitter components 
  • The influence of power noise on clock jitter 

Register for Part 3: Part 3: https://go.teledynelecroy.com/l/48392/2024-02-07/8p9g88

Presenter: Thomas Stüber, Product Manager In-Vehicle Network 

Can't attend live? Click here to register anyway and we will send you the recording afterward.

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Testing Noisy Power Supply Outputs - Oscilloscope Coffee Break Webinar Series

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Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

We didn’t expect to have DC outputs be so noisy! Is it really the circuit that is a problem or is our scope and/or probe causing signal integrity issues? We even tried changing output capacitors to improve the performance, but why are we seeing 2X greater output noise than we expected?

In this session we review which probes are best for your application and how best to connect to your oscilloscope to minimize RF pick up.

Topics to be included:

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Teledyne LeCroy: Mixed Signal Oscilloscope - Measurement

The oscilloscope has been a primary tool for electronic design engineers since the invention of that instrument, many years ago. The first decades of oscilloscopes were “analog” in nature.

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ACT: Product Demo - Enclosure Cooling Demonstration & Options

As electrical/automation and control systems components become more compact and complex the internal enclosure heat loads are increasing. PLC’s, starters and drives are some of the major generators of heat in an enclosure. There are many challenges in the way we choose to keep the enclosures cool. ACT has developed a series of heat exchangers and air conditioners that are environmentally sealed to cool and protect the internal cabinet components from water, airborne chemical, and particulate contaminants.

Watch now for an in-depth discussion on sealed enclosure cooling technology options. We will discuss both above and below ambient cooling technologies, how they are selected and how they are installed. We will conduct live demonstrations of each ACT sealed enclosure cooling family so you can compare sizes and options. We will encourage questions and discussion as if you were with us, in person, at a trade show!

DOWNLOAD WEBINAR SLIDES

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Teledyne LeCroy: How Do I Make 3-phase Power Measurements with an Oscilloscope?

Teledyne LeCroy: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?
Time: 11 AM Pacific | 2 PM Eastern
Duration: 30 minutes

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.  Click here to access the entire series.

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Don’t Let Ground Bounce Ruin Your Day Part 7: How to Become an Expert in Power Integrity Testing

Register Now

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Don’t Let Ground Bounce Ruin Your Day

In this session (Part 7), Dr. Eric Bogatin will focus on ground bounce. Ground bounce is a common problem in packages, connectors and circuit boards that gets worse with shorter rise times. This insidious problem can cause enough cross talk to break almost any product. We will look at the principles behind the root cause of ground bounce, how we can measure the ground bounce in your system, and based on the root cause, how we can design ground bounce out of your next product.

Topics to be covered in this webinar:

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Technical Webinar: The Importance of Signal Routing to Maximize ATE Performance & Reliability

This Webinar presents the various challenges that ATE system engineers face when architecting a cabling and interface system. It also discusses the impact that design decisions have on the overall performance of the test system.

Making the Connection in an ATE System

A few of the takeaways are:

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Fundamentals of Automotive Ethernet Compliance Test, Validation and Debug by Teledyne LeCroy

Presenter: Thomas Stüber

Looking for background knowledge for Automotive Ethernet, who uses it, why they are using it, and what to expect when testing it? This webinar is for you.

Register here

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Simplifying Receiver Calibration and Test of 16+ Gb/s Serial Data Links

Join Teledyne LeCroy for our new three-part webinar series to learn more about how to accelerate and improve testing of PCIe® v. 4.0 and 5.0, USB4™, Thunderbolt™ 4, and DisplayPort™ 2.0 serial data links.

Nov. 19 - Part One: Identifying and Debugging PCIe Link Equalization Problems
Dec. 3 - Part Two: Simplifying Receiver Calibration and Test of 16+ Gb/s Serial Data Links
Dec. 16 - Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

Join us for Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

High-speed serial link transmitter testing can be optimized with the right tools, and valuable circuit design operating margin information can be extracted.

This webinar will provide an overview of a typical high-speed serial data transmitter test using USB4 as an example. We will synthesize a high-speed serial data signal, use a real-time oscilloscope to analyze the signal at a virtual receiver, and compare the virtually-received signal to a live signal. We will review signal integrity margin analysis and jitter, eye diagram, IsoBER contour and crosstalk eye measurements.

Who should attend?

  • Signal Integrity Engineers
  • Design and Validation Test Engineers

Presenters:
Mike Engbretson, Product Marketing Manager and John Smith, HSS Business Development Manager

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USB Type-C® Technologies Webinar Series Part 4: USB Type-C Sideband Physical Layer Testing

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USB Type-C® Technologies Webinar Series

Join Teledyne LeCroy for our webinar series on USB Type-C technologies with a focus on the physical layer, from an introduction to the various technologies in the Type-C ecosystem to USB 3.2, USB4™, Thunderbolt™, DisplayPort™, USB4 Type-C sideband (USB Power Delivery, DisplayPort AUX, USB4 SB) testing.

USB Type-C Sideband Physical Layer Testing

In Part 4, we will focus on compliance and interoperability (C&I) of USB Type-C connected hosts, hubs, adapters, and peripherals. Designers are challenged to meet all USB-IF, VESA, and Thunderbolt Specifications. This webinar will explore practical approaches to debugging electrical system issues that may occur when connecting USB-C devices together.

Topics to be covered in this webinar:

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Teledyne LeCroy Jitter Basics - Part 1

The demand for more and more data requires faster and faster data transfer rates, where timing uncertainty (i.e., jitter) takes up a larger portion of a system's total time budget. To improve system performance, each new generation of technology must consider and evaluate the impact of jitter. 

This is a 3-part fundamentals course on jitter in clock and data signals that provides a broad overview of the jitter topic. Participants will learn the definitions of the different types of jitter, understand what type of jitter is important for their application, and how to measure jitter with an oscilloscope. Emphasis is placed on developing knowledge of jitter such as developing a common language, understanding jitter beyond definitions, visualizing relationships between different types of jitter, and understanding jitter requirements specifically for fast clock signals and serial data standards such as USB, PCIe, etc. 

Topics to be covered in this webinar (Part 1): 

  • Jitter definition 
  • Traditional Jitter Measurements 
  • Modern Jitter Measurement Methods 
  • Using the track function to visualize jitter 
  • Statistical consideration of jitter 
  • Examples of Jitter Measurements 

Register for Parts 2 and 3: 

Part 2: https://go.teledynelecroy.com/l/48392/2024-02-07/8p9g85

Part 3: https://go.teledynelecroy.com/l/48392/2024-02-07/8p9g88

Presenter: Thomas Stüber, Product Manager In-Vehicle Network

Can't attend live? Click here to register anyway and we will send you the recording afterward.

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EMC / ESD Pulse Measurements Using Oscilloscopes Webinar

The digital oscilloscope has become the most commonly used test tool on the EMC engineer’s bench, but most engineers use only a fraction of the power available in these instruments. In addition, there are several overlooked aspect s which can significantly impact signal integrity and EMC measurement results.

Join us for this webinar as we uncover oscilloscope tools that can assist with advanced and more accurate methods for performing EMC testing.

Measurements included in our discussion will be:

  • EMC Measurement Categories and Requirements
  • Conducted Immunity Testing Requirements and Pulse Measurement Definitions
  • ESD Threshold Selection
  • Level-After-Pulse, Time-To-Value, and Parameter Limiters
  • ESD Verification and Test Setup
  • ISO10605:2008 Consecutive Parameter Trending
  • Sample Rate and Dynamic Range Impact on ESD Pulse Measurements
  • Much more!

Presenter: Mike Hertz, Teledyne LeCroy Sr. Field Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Practical On-die Power Integrity Measurements Part 8: How to Become an Expert in Power Integrity Testing

Register Now

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Practical On-die Power Integrity Measurements

In this session (Part 8), Dr. Eric Bogatin will describe the direct measurement of power rail noise on the chip itself (i.e. on die). One goal of PDN design is to engineer the power delivery network to deliver low noise DC voltages to the power rails on the die. The final test of the power noise is measuring the on-die power rail noise directly. Using a simple technique, we can directly measure the on-die power rail noise for the VCC rails, and if we plan ahead of time, sometimes the Vdd rails. Eric will introduce the method and look at two examples of measuring the on-die power noise and how some of the important design features affect this noise.

Topics to be covered in this webinar:

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Accurate and Efficient PDN Measurements Learning Lab Part 2: How to Become an Expert in Power Integrity Testing

Register Now

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Accurate and Efficient PDN Measurements Learning Lab

In this session (Part 2), we’ll demonstrate and teach how to make accurate, high bandwidth measurements of power rail voltages and avoid introducing probing artifacts or interference into the measurements.

Topics to be covered in this webinar:

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Environmental Test Chambers - Options - Why they are used

Weiss Technik

Weiss Technik will educate the audience on Options & Accessories within environmental test chambers. The webinar will explore and discuss what to look for and best practices for options and why they are used.

This FREE Webinar will help you learn more about:

  • Overview
  • Chamber Cabinet Options
  • Humidity Options
  • Refrigeration Options
  • Safety Options
  • Specialty Options
  • and MORE!

Click here to Register!

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When and How to use Heat Pipes in Space Applications for Thermal Control

Register here. After registering, you will receive a confirmation email containing information about joining the webinar. Heat pipes have been used for spacecraft thermal control for decades; however, the technology is continuously evolving.

Heat Pipes are often selected due to their combination of thermal performance, low mass, and high reliability. This webinar will explore several variants including ammonia Constant Conductance Heat Pipes (CCHPs), Variable Conductance Heat Pipes (VCHPs), Loop Heat Pipes (LHPs) and Space Copper-Water Heat Pipes (SCWHPs). Each technology option provides a unique benefit for the spacecraft architecture.

This webinar will dive into details to help aerospace engineers select and apply the appropriate technology- exploring considerations such as including heat flux, transport distances, geometry and mass. Our subject experts will also be available after the webinar for specific questions on your application. Join us!

ACT: When and How to use Heat Pipes in Space Applications for Thermal Control
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How to Become an Expert in Automotive Ethernet Testing - Part 2: Mastering MDI Return Loss and Mode Conversion Loss Test

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Mastering MDI Return Loss and Mode Conversion Loss Test

In this session (Part 2), we will focus on the reflection measurements MDI return loss and MDI mode conversion loss. We will review the basic concepts of the S-parameters and their meaning in single ended and mixed-mode form with particular reference to the single balanced twisted pair. We’ll follow with a measurement demonstration.

Topics to be covered in this webinar:

  • Automotive Ethernet and single-balanced unshielded twisted pair
  • Mixed-mode S-parameter overview
  • Why to measure common-to-differential mode conversion?
  • Testing the fixture for mode conversion loss margin compared to the MDI requirement
  • Introduction to MDI S-parameter testing

Who should attend? All HW engineers developing and testing Automotive Ethernet accordingly to the 100Base-T1 and 1000Base-T1 standards with particular reference to MDI S-parameters.

What attendees will learn? Background knowledge for MDI S-parameter Automotive Ethernet measurement and what to expect when testing it.

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Technical Webinar: Choosing the Right Platform for Switching: PXI, USB or LXI

When designing a functional electronic test system, how signal switching is implemented in your test strategy can affect accuracy and repeatability. In this webinar we give an overview of the three most popular platforms used for switching today, explain the advantages of each of the various switching applications, and provide some basic questions to ask as you integrate any electronic test system.

Deciding on Platform Architecture

A few of the takeaways are:

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How to verify the performance of DPUs and SmartNICs

Big data centers use Smart Network Interface Cards (SmartNICs) to boost network performance by offloading the networking, storage, and security functions from server CPUs to the SmartNIC’s Data Processing Unit (DPU). 

This strategy can seriously reduce costs but a clear, concise test program is needed to verify all the components function as intended. 

This White Paper explains how to test the performance of DPUs and SmartNICs using Ethernet Traffic Generators and Network Emulators.

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Serial Data Jitter Separation, Extrapolation, and Jitter Views

Teledyne LeCroy

Time: 11 AM Pacific | 2 PM Eastern

Duration: 60 minutes including Q&A

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How to Perform PCI Express 5.0 PHY Compliance Testing

Teledyne LeCroy

Time: 11 AM Pacific | 2 PM Eastern

Duration: 60 minutes including Q&A

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SI/PI on a Budget Webinar: Five Tricks to Get More out of your Oscilloscope

You’ve got a scope, now how do you get the most out of it without spending a lot of money?

In this free webinar from Teledyne LeCroy, Eric Bogatin will show you the right way you can do five common SI and PI measurements with a budget scope and some simple probes you probably already have around. We’ll look at some of the common artifacts to avoid so you can get meaningful measurements.

Topics covered include:

  • Probing a fast rise time signal to get its rise time
  • Measuring a power rail with a 10x probe
  • Measuring a low impedance power rail with a build it yourself power rail probe
  • Measuring the source of near field pick up
  • Using the FFT function to analyze the root cause of noise pick up

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelis, Teledyne LeCroy

 

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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Teledyne LeCroy: In-Depth CXL 2.0 Virtual Training

Compute Express Link™ (CXL™) is revolutionizing how we look at high speed communications and brings new specifications and design considerations for cache coherent memory utilization between the processor and peripheral devices. Teledyne LeCroy’s Austin Labs will provide you with an in-depth look at the different versions of CXL and what you need to know to be an expert in this new technology.

In this 4-day live instructor-led class you will learn about:

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Probing in Power Electronics Webinar What to Use and Why: Part One

Power electronics designs have inherent measurement challenges. This has led to development of many specialized high and low voltage single-ended and differential probes to meet the specific needs of this market. However, proper probe selection and use is critical for operator, equipment and DUT safety and also has a large influence on the accuracy of the measurement.

Join Teledyne LeCroy for this two-part webinar series as we provide tips to overcome these questions.

In Part 1 we will review the different HV rated probe specifications and topologies and explain what measurement each probe topology is ideally suited for.

In Part 2 we provide real-word examples and comparisons between a variety of different probes and amplifiers. Register here

Presenter: Ken Johnson, Director of Marketing, Product Architect Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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PCI Express® 5.0 Compliance Test Overview Part 2: Physical Layer Testing

PCI Express® 5.0 Compliance Test Overview

Join Teledyne LeCroy for this two-part master class in PCI Express 5.0 – from electrical through Link layer and Transaction layer. PCIe 5.0 is approaching the time when initial compliance and interoperability testing can commence. Teledyne LeCroy PCIe Gen5 physical-layer and protocol test experts will focus on each test, explain the background theory, how the test procedure works, how passes and failures are determined, and how to track down and debug problems.

PCI Express 5.0 Electrical Compliance Test Overview

In this session (Part 2), we describe the new PCIe 5.0 electrical compliance test procedures – what’s new, what’s the same as past generations, and how to avoid the most common test pitfalls.

Topics to be covered in this webinar:

  • Fixture characterization
  • Transmitter electrical testing
  • Transmitter Link Equalization testing
  • Receiver Link Equalization testing
  • PLL bandwidth testing
  • What’s new in PCIe 5.0 compared to PCIe 4.0.

Who should attend? Design, validation and test engineers working on PCIe 5.0 devices.

What attendees will learn? How to be prepared for upcoming PCIe 5.0 electrical compliance test events.

Presenter: Dr. Patrick Connally, Product Marketing Manager

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Real-time Spectral Analysis of Power Rails Part 6: How to Become an Expert in Power Integrity Testing

Register Now

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Real-time Spectral Analysis of Power Rails

In this session (Part 6), Dr. Eric Bogatin will explain and demonstrate how transforming acquired time-domain signals into the frequency domain will get you to the right answer faster, extract the important figures of merit of the signal, and help you find the root cause of a problem. Eric will introduce important principles to help you get the most out of your time and frequency domain measurements and analysis of signals. We’ll apply these techniques to look at high bandwidth signals, noise sources and power rails.

Topics to be covered in this webinar:

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Teledyne LeCroy: Configurable Protocol Decoding of Manchester And NRZ-Encoded Signals

The industry's first NRZ and Manchester configurable protocol decoders accept a broad range of physical characteristics for NRZ- or Manchester-encoded signals.

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Teledyne LeCroy: Most efficient validation of power sequences

For the most efficient validation, get the most analog channels and longest memory to capture your entire power sequence.

  1. Start with WaveRunner 8000HD’s 8 analog channels, 16 with our OscilloSYNC™ option.
  2. Add MSO capability for 16 digital lines, no sacrifice of analog channels.
  3. Use 5 Gpts memory to capture the entire power on/off sequence.
  4. Use automated measurements with Pass/Fail testing to validate timing over multiple acquisitions.

Watch the video to see how.

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ACT: Heat Pipe Design and Modeling

Are Heat Pipes the Answer to Your Thermal Issues?

Heat Pipes are one of the most efficient ways to move heat, or thermal energy, from one point to another. These two-phase systems are typically used to cool high power electronics, even in outer space. Watch the on-demand webinar to learn more about designing and modeling heat pipes into your project.

What you get:

  • Answers to common questions about how to integrate heat pipes and best practices
  • An in-depth heat pipe calculator tutorial
  • Heat pipe modeling How-To's
  • Types of heat pipes and working fluids you may not have known were available

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Teledyne LeCroy: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.  Click here to access the entire series.

Part 8: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?

Current sense (shunt) resistors are commonly included on printed circuit assemblies to provide a convenient means to measure current flow somewhere in your circuit. How do you use that resistor to measure the actual current with your oscilloscope?

In this coffee break webinar we provide practical guidance on how to probe the voltage drop across the shunt resistor to minimize noise and accurately measure the current on your oscilloscope.

Topics to be covered in this webinar:

  • Selecting the right probe for the measurement
  • Rescaling the voltage output of the probe to a current value
  • Considerations for accurate measurements

Presented by: Jonathan Shechter, Product Marketing Engineer

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

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Setting up Your Timebase and Using Memory Correctly Oscilloscope - Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

We are all pretty good at setting a time window for our capture. But, what about the waveform memory that is used for the capture? How does this interact with the sample rate as we vary the time window? Can we segment the timebase to capture only the important circuit behaviors?

Topics to be included:

  • Timebase, memory length and sampling rate – how do these impact our results?
  • Timebase delay – pre- and post-trigger location
  • Sequential timebase – capturing “just the facts”
  • Scope preferences we forget are available

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Optimizing Your Vertical Gain Oscilloscope - Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

Why do we care about vertical dynamic range? How do we take the most advantage of this to achieve the highest accuracy and precision? In this session we review your oscilloscope’s vertical gain and why we should care about it.

Topics to be included:

  • Vertical dynamic range – why do we care?
  • Effects on measurement accuracy
  • DC versus AC coupling – pros and cons
  • Should we overdrive the scope?
  • Vertical offset versus scope sensitivity

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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ACT: Webinar - When and How to Use Heat Pipes in Space Applications for Thermal Management

Heat pipes have been used for spacecraft thermal control for decades; however, the technology is continuously evolving. Heat Pipes are often selected due to their combination of thermal performance, low mass, and high reliability. This webinar will explore several variants including ammonia Constant Conductance Heat Pipes (CCHPs), Variable Conductance Heat Pipes (VCHPs), Loop Heat Pipes (LHPs) and Space Copper-Water Heat Pipes (SCWHPs). Each technology option provides a unique benefit for the spacecraft architecture.

This webinar will dive into details to help aerospace engineers select and apply the appropriate technology- exploring considerations such as including heat flux, transport distances, geometry and mass. Our subject experts will also be available after the webinar for specific questions on your application.

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ACT: Medical Device Cooling Considerations for Your Next Design Project

The term “Medical Device” covers an expansive range of applications ranging from large MRI machines to hand-held surgical devices and diagnostic tools. These pieces of hardware can be orders of magnitude different in size and power output, so it stands to reason that there is no ‘one size fits all’ cooling solution that is suitable for all medical devices. Learn more about thermal considerations for your next design build or your design iteration of an existing program.

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Don’t Let Ground Bounce Ruin your Day Webinar

Ground bounce is a common problem in packages, connectors and circuit boards. And it gets worse with shorter rise times. This insidious problem can cause enough cross talk to break almost any product.

In this webinar, we will look at the principles behind the root cause of ground bounce, how we can measure the ground bounce in your system, and based on the root cause, how we can design ground bounce out of your next product.

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelis, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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Power Rail Integrity Measurements Hands on Webinar – Accurate and Efficient PDN Measurements

Join Teledyne LeCroy for this hands-on webinar to learn how to make accurate, high bandwidth measurements of power rail voltages and avoid introducing probing artifacts or interference into the measurements.

Topics to be covered in this webinar:

  • Best practices for power rail probing
  • Probing tradeoffs: Noise, reflections, offset, bandwidth, loading
  • Power rail static and transient analysis
  • Correlating power rail noise to clock jitter
  • Using spectral analysis to finding root causes of PDN noise

Pre-work Recommended Before Hands-on Webinar

It is recommended that prior to the start of the webinar you should download and register (at no cost) MAUI Studio and download LabNotebook (waveform plus setup files) .lnb files (they will be combined into one .zip file that will need extracting).

MAUI Studio
>> https://teledynelecroy.com/mauistudio/

Zip file with Lab Notebook files
>> Click here to download zip file

These files will allow you to load the various waveform examples shown during the webinar and participate in hands-on instruction on how to make critical power integrity measurements.

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Oscilloscope Coffee Break Series - Part 3: Getting Your Trigger to Do What You Want

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

It’s circuit debug time! Let’s use the oscilloscope’s triggering features to define where we start our investigation to find the troublesome circuit issue.

Topics to be included:

  • Trigger Modes – why is my scope display blank?
  • Trigger selections – lots of choices to define when we capture data
  • Trigger coupling, filters and pre-triggering
  • Update rates – maximizing the amount of data captured

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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What's next in spacecraft thermal control?

This webinar will dive into details to help aerospace engineers select and apply the appropriate technology- exploring considerations such as including heat flux, transport distances, geometry and mass. Our subject experts will also be available after the webinar for specific questions on your application. Join us!

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Latest VSD webcast - Embedded Vision: Is it right for your application?

Matrox® Imaging is pleased to sponsor the following event:

If you are working withHave likely heard about embedded vision and wondered whether you should use it. There are various definitions of embedded vision, such as deep learning, smart cameras, democratization. Where to start, and how to know if embedded vision is right for you?

Join Perry West, founder and president, Automated Vision Systems, Inc., as he demystifies embedded vision and provides guidance on how to choose between embedded vision or some other vision implementation. 

Click here to Register Now!

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How to Perform Customized Analysis With an Oscilloscope Part Two: Advanced Customization Examples

Register Now

How to Perform Customized Analysis With an Oscilloscope

Data is commonly exported from an oscilloscope to another program (e.g., MATLAB®) for calculation and analysis. Are there better ways to get these results? Can the oscilloscope still be the main platform for post-export analysis? Are there additional external calculation and analysis tools that could be used? Is it possible to control the oscilloscope or other instruments using the same custom scripts or algorithms that perform calculations or analysis on the acquired data? Join us for an overview and advanced examples of best practices and capabilities for oscilloscope customization.

Advanced Customization Examples

In Part 2 of this 2 part series, we provide specific real-world examples of customization being used to solve specific measurement and control challenges.

Topics to be covered in this webinar:

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Matrox: Case Study Spotlight - Flexible Vision System a Perfect Fit for Machines in Flexographic Industry

Delivering consistently accurate results is integral for the flexographic industry. When a customer in this industry sought to update their analog inspection system, they sought the expertise of ClearView Imaging and Matrox® Imaging to provide an automated vision-system-driven mounting machine. Comprising a Matrox Imaging vision controller and software, this customized system is able to locate precise targets on flexographic plates, using advanced illumination techniques and software tools to address noise, locate shapes, and matching patterns.

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Secrets to Efficiently Sustaining Your Automated Test System

When designing a test system, it is important to plan for problems. The reason is simple, if a test system goes down, your product line loses revenue. This webinar discusses how a well-designed test system – and strategy – can get a system up and running quickly when a problem occurs and reviews tactics to consider for minimal downtime and a sustainable, expandable test system.

In this webinar, we reveal the secrets to efficiently sustaining your automated test systems. 

A few of the takeaways are:

  • Selecting vendors that pledge to minimize obsolescence worries
  • Implementing accurate diagnostics to find test system faults quickly
  • Developing a plan to minimize long repair cycles when something goes wrong
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Junkosha: Phase Stability against Temperature Changes

Cable reliability, especially phase stability against Temperature change, is of critical importance in microwave and mmWave measuring. Junkosha has developed cables with excellent phase stability against temperature change through innovative materials and processing technology.

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How to Characterize Lossy Interconnects in High-speed Designs

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Characterize Lossy Interconnects in High-speed Designs

Join Eric Bogatin and Teledyne LeCroy for this webinar exploring the properties of lossy transmission lines and how to extract their important figures of merit. All losses are frequency dependent. We introduce a simple way of estimating the losses expected based on the interconnect design and how to measure the losses using S-parameters.

Topics to be included:

  • The root cause of losses
  • Estimating the conductor and dielectric losses
  • Extracting an important figure of merit from insertion loss
  • How much insertion loss is too much?
  • Estimating the maximum data rate of a channel from the insertion loss

Who should attend? Any Engineer designing, validating or using high-speed serial data links.

What attendees will learn? How to analyze insertion loss and interpret measurements in terms of highest acceptable data rate.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Teledyne LeCroy: Test your HDMI 8K Devices with the new quantumdata M21

This webinar will introduce the M21 Video Analyzer/Generator for HDMI 8K and DisplayPort UHBR testing.

The presentation will provide an overview of the HDMI video generation features and the HDMI video analysis features through connection to external devices. We will also discuss the auxiliary channel analyzer (ACA) utility for monitoring the HDMI transactions over the DDC channel.

A high level roadmap will be provided to discuss the rollout of other important features such as DisplayPort analysis. Future M21 webinars will cover the DisplayPort analyzer features.

When: Thursday, August 3, 2023, 12:00PM Central Daylight Time

Register free by completing the form.

Presenter: Neal Kendall, Product Marketing Manager – quantumdata Product Family, Teledyne LeCroy

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Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

Join Teledyne LeCroy for our new three-part webinar series to learn more about how to accelerate and improve testing of PCIe® v. 4.0 and 5.0, USB4™, Thunderbolt™ 4, and DisplayPort™ 2.0 serial data links.

Nov. 19 - Part One: Identifying and Debugging PCIe Link Equalization Problems
Dec. 3 - Part Two: Simplifying Receiver Calibration and Test of 16+ Gb/s Serial Data Links
Dec. 16 - Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

Join us for Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

High-speed serial link transmitter testing can be optimized with the right tools, and valuable circuit design operating margin information can be extracted.

This webinar will provide an overview of a typical high-speed serial data transmitter test using USB4 as an example. We will synthesize a high-speed serial data signal, use a real-time oscilloscope to analyze the signal at a virtual receiver, and compare the virtually-received signal to a live signal. We will review signal integrity margin analysis and jitter, eye diagram, IsoBER contour and crosstalk eye measurements.

Who should attend?

  • Signal Integrity Engineers
  • Design and Validation Test Engineers

Presenters:
Mike Engbretson, Product Marketing Manager and John Smith, HSS Business Development Manager

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Potential RF Interference on IoT Devices

Amplifier Research

The proliferation of IoT “smart” devices used in the homes, commercial buildings, and city infrastructure, emphasizes the need to test for Electromatic Compatibility (EMC). IoT devices such as appliances, sensors, and cameras to name just a few are strictly mandated to comply with EMC standards. However, the real-world application may give rise to untested opportunities for RF interference. This presentation will discuss these real-world scenarios and provide guidance on testing techniques to mitigate potential for interference.

Click here to regsiter.

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Pre-Compliance EMC Testing with Real-time Spectral Analysis

Even though the real world is the time domain, we can sometime get to an answer faster by going through the frequency domain. The signature of a noise source often reveals itself more clearly in the frequency domain as the spectrum of the signal than in the time domain.

In Part 2 of our two-part webinar series, we introduce how to transform a signal in the time domain to the real time spectrum in the frequency domain. Then we will demonstrate how to use spectral signatures to sniff out near field sources which can contribute to potential EMI failures.

Missed Part 1 on Time Domain Analysis? Click here to register

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelist, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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How to Perform Customized Analysis With an Oscilloscope Part One: Fundamentals of Customized Analysis

Register Now

How to Perform Customized Analysis With an Oscilloscope

Data is commonly exported from an oscilloscope to another program (e.g., MATLAB®) for calculation and analysis. Are there better ways to get these results? Can the oscilloscope still be the main platform for post-export analysis? Are there additional external calculation and analysis tools that could be used? Is it possible to control the oscilloscope or other instruments using the same custom scripts or algorithms that perform calculations or analysis on the acquired data? Join us for an overview and advanced examples of best practices and capabilities for oscilloscope customization.

Fundamentals of Customized Analysis

In Part 1 of this 2 part series, we describe the range of capabilities available to customize measurements, math, and user interface using a Teledyne LeCroy oscilloscope as an example.

Topics to be covered in this webinar:

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What are Oscilloscope ADC Effective Bits and ENOB?

Take a quick break, grab your favorite beverage, and join us for Part 2: What are Oscilloscope ADC Effective Bits and ENOB? Whether you're a seasoned engineer or just getting started with oscilloscopes, this webinar is for you! 

In this webinar we'll explain how analog-to-digital converters (ADCs) impact oscilloscope performance, focusing on the importance of Effective Number of Bits (ENOB) for understanding signal accuracy. Click Here to Register 

We hope to see you on-line! 

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

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Teledyne LeCroy: MAUI Studio – Installation

In this video, we walk you through the installation process of the Teledyne LeCroy MAUI Studio oscilloscope software. For additional information visit, teledynelecroy.com/mauistudio.

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What Every Oscilloscope User Should Know About Transmission Lines

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Join Eric Bogatin and Teledyne LeCroy as we introduce you to five simple, yet essential, principles of signal integrity which we will apply to understanding how to interpret oscilloscope measurements from DC to 1 GHz bandwidth.

Many questions have obvious answers if we understand just a little bit about transmission lines and what the oscilloscope actually measures:

Topics to be covered in this webinar:

  • Is it really true that the longer the cable, the longer the RC charging and the longer the rise time?
  • Does this mean only short cables can offer high bandwidth?
  • When should you use a 50 Ω input and when a 1 MΩ input to the scope?
  • Why do I measure a rise time of 150 ns for the compensation signal on the front of the scope and others report it as 5 ns rise time?

Who should attend? Any engineer who wants a practical understanding of transmission lines and why this is so important in any oscilloscope measurement.

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PSI Boeing Spotlight view" >Learn More ❯
How to Perform Double Pulse Testing (DPT) on GaN and SiC Devices Webinar

Time: 10:00 CET

Join Teledyne LeCroy to see Double Pulse Testing performed on gallium nitride (GaN) and silicon carbide (SiC) power semiconductor devices. Learn more about various safety measures that need to be addressed before making measurements and what to infer from the captured waveforms. 

Topics to be covered in this webinar: 

  • Double Pulse Test (DPT) basics 
  • Test instrumentation needs 
  • Safety issues and how to overcome them 
  • The importance of probe deskew 
  • How to calculate turn on/off delays, switching losses, etc. 

Who should attend? Hardware engineers, systems engineers, production engineers, and technicians testing wide bandgap semiconductor devices 

What attendees will learn? How to perform the double pulse test safely, and capture and characterize a GaN or SiC power semiconductor device’s dynamic response 

Presented by: Gregor Hofferbert, Field Application Engineer, Teledyne LeCroy

Click here to register

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Teledyne LeCroy: DesignCon 2012 - The Relationship Between Discrete-Frequency S-parameters and Continuous-Frequency Responses

We explore in detail the relationship between discrete-frequency responses connected with sparameters and the implied continuous time response. This is done in both the frequency- and time-domain to develop the proper insight and explore issues with real time-domain responses, time-aliasing, causality, interpolation and re-sampling of discrete-frequency data. Using the insight gained, we identify the conditions for sufficiency of sampling and the side-effects of the invariable practical conditions when these side-effects cannot be completely dispelled. This paper is especially useful for understanding issues involved in direct application of sparameters in linear simulations, like those used in virtual probing applications in scopes.

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Teledyne LeCroy: Coherent 1200km 6x6 MIMO Experiment using LabMaster

We experimentally demonstrate transmission of 6 mode-multiplexed 20-Gbd-QPSK signals over 1200 km of three-core microstructured fiber (3C-MSF). An aggregate single-wavelength capacity of 240 Gbit/s is recovered by off-line 66 coherent multiple-input multiple-output (MIMO) digital signal processing.

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How to Test for Perfect USB-C® and HDMI® Cables
Part 2: Assessing Vendor Quality and Detailed Failure Analysis

Do you use USB-C or HDMI cables in critical applications and struggle with vendor quality? Are you trying to use a VNA to test cables or perform cable resistance tests or test cable impedance with other instruments? If so, join Giuseppe Leccia from Teledyne LeCroy for this 2-part webinar series to understand USB-C cable quality test and HDMI test requirements, and how to meet your needs with minimal test time and at minimal cost. Each webinar will run approximately 60 minutes and include a live Q&A.

In this webinar, we provide details on how to assess failed cables to understand what the root-cause failure mode is and what that failure mode or test data means in terms of cable operation. Not all failures are equal, and we will describe those types of failures that will critically impact cable performance.

Topics to be covered in this webinar: 

  • Eye diagrams 
  • Mask testing and failures 
  • Insertion loss measurements 
  • Crosstalk 
  • Impedance profiles 
  • Inter-pair and Intra-pair skew 

Who should attend? Quality Assurance Engineers, Vendor Quality Engineers, Incoming Inspection Teams, or System Reliability Engineers at companies that are using USB-C or HDMI cables in critical applications. 

What will attendees learn? Details of tests and failure causes

Click here to register

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Teledyne LeCroy: Low-Loss Mode Coupler for Mode-Multiplexed transmission in Few-Mode Fiber

We present a novel low-loss 3-spot mode coupler to selectively address 6 spatial and polarization modes of a few-mode fiber. The coupler is used in a 66 MIMO-transmission experiment over a 154-km hybrid span consisting of 129-km depressed-cladding and 25-km graded-index few-mode fiber.

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Teledyne LeCroy: Technologies for Very High Bandwidth Real-time Oscilloscopes

Technologies and design considerations are presented for the design of very high bandwidth oscilloscopes. These include chip, DSP and microwave technologies employed in some of the fastest waveform digitizers in the world.

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Xena Networks: Plotting the performance landscape for 5G RAN Packet Networks

5G deployments are now underway across the globe but are merely the first steps in a multi-year journey for the mobile industry. Many practical challenges still remain, not least of which is the challenge of cost-effectively deploying 5G Radio Access Networks (RANs) at scale and assuring the performance of supported 5G services.

The 5G RAN architecture provides an open, virtual, packet-based network that extendsfrom the core to the radio antenna. The virtual architecture of 5G RAN with network slicing and new functional elements, such as the Central Unit (CU) and Distributed Unit (DU), enables multiple demanding services to share the same infrastructure without compromising on their specific performance requirements. Virtual, packet-based RANs also enable network sharing over open interfaces as well as multi-vendor implementations, both of which are important to the 5G business case.

Hardware appliances, such as the Remote Radio Head and Baseband Unit of 4G LTE are now replaced with virtual software running on whitebox or Commercial Off-The-Shelf (COTS) hardware. In 5G, the Baseband Unit is split into two new functions, namely the CU and DU. Both these functions can be located either close to the 5G core or close to the Radio Unit (RU) to meet latency and backhaul requirements. This leads to a much more dynamic fronthaul, midhaul and backhaul network, which is now collectively referred to as the 5G cross-haul or “X-haul” network.

It also means that the traditional aggregation architecture where higher capacity is required closer to the core is no longer the norm. As cloud computing and other real-time services move closer to the edge of the network, more traffic is likely to remain close to the subscriber requiring higher capacity X-haul networks with 10G, 25G and even 100G Ethernet connectivity.

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Tolly Tests Safire

Next-Generation Firewalls (NGFWs) are full of advanced security features - but the more you enable, the slower they run. Imagine if the number of airbags in your car determined how fast it could be driven! Safire, a new product from Xena Networks, promises to change that by bringing unprecedented visibility to firewall performance - quickly and cost-effectively.

The Tolly Group recently tested Safire to see if it lived up to its promise. Join us for a webinar where we review the results of Tolly's Safire evaluation tests and then hear how Safire might add value for security consultants (MSSPs & SIs) and internal enterprise IT departments.

Register Now!

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Verifying SmartNIC ASIC performance at the hardware level using E100 Chimera Network Emulator

Smart Network Interface Cards (SmartNICs) are increasingly being deployed in large datacenters to off-load networking services from the Server CPUs. This enables better scalability and security for organizations running large datacenters. In contrast to traditional NICs, SmartNICs offer programmable packet processing, storage, and networking functionality. Furthermore, SmartNICs are designed to monitor key network performance parameters like latency, speed, throughput, and packet loss. SmartNIC interface speeds are typically 100Gbps and above. 

A Chinese high-tech startup focused on cloud datacenter ASIC product development is developing network interconnect ASICs for SmartNICs used in large scale datacenters and cloud computing. The company uses Teledyne LeCroy Xena’s E100q Chimera network emulator to verify the performance of their new ASIC.

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Better Sifting of Wireless Data

Time: 4:00-4:30pm EDT

Wireless Protocol Suite’s (WPS) query-based filtering provides quick answers to diverse questions customers have in a sea of wireless data. This filtering extends WPS’s protocol organization and decoding. Learn how to answer common (and not so common) wireless questions with query-based operators and filters with the added treasure of saved time.

Key topics include: 

  • High level query-based filtering in the Summary pane 
  • Query auto complete 
  • Hints to create advance filters 
  • Highlighting syntax errors 
  • Highlighting syntax errors 

Who Should Attend: Developers implementing wireless technology in their products or designing solutions for end-product manufacturers. 

Presenters: Paul Otto - Sr. Software Engineer, Teledyne LeCroy Varun Gopalan - Software Engineer, Teledyne LeCroy 

Unable to attend? Click here to register anyway to access the Webinar-on-Demand after the event.

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Automotive Ethernet Physical Layer Compliance Testing Hands-On Webinar

Join Teledyne LeCroy for this hands-on webinar where we will examine and analyze Physical Layer compliance testing of BroadR-Reach, 100Base-T1, and 1000Base-T1 Automotive Ethernet designs. Starting with Automotive Ethernet background, we then focus on the individual Physical Media Attachment (PMA) electrical tests as defined by the OPEN Alliance and IEEE standards.

Topics to be covered in this webinar:

  • Defining Automotive Ethernet PHY layer
  • Intro to Physical Media Attachment (PMA) compliance tests
  • Device Test Mode generation, test setup and fixturing
  • Details of each compliance test with live, hands-on analysis
    • Maximum Output Droop
    • Transmitter Distortion
    • Transmitter Timing Jitter, Master and Slave
    • Transmitter Power Spectral Density (PSD)
    • Transmitter Peak Differential Output
    • Transmitter Clock Frequency

Pre-work Recommended Before Hands-on Webinar

It is recommended that prior to the start of the webinar you should download and register (at no cost) MAUI Studio and download LabNotebook (waveform plus setup files) .lnb files (they will be combined into one .zip file that will need extracting).

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A Simple Demonstration of Where Return Current Flows

For ten years, I’ve had the honor of presenting a tutorial session at the IEEE EMC Symposium. I’m usually positioned right after Bruce Archambeault. This means I get to listen to Bruce talk about inductance. While I think of myself as a bit of an expert on inductance, I always learn something new when I listen to Bruce.

One example he shows, using a simulation of where current flows, will completely recalibrate your intuition if you have never thought about this question. This example stuck with me for more than a dozen years since I originally saw it. Recently, I had a chance to play with the Teledyne LeCroy CP031A current probe used with our scopes and I realized this classic simulation example could be demonstrated with a simple measurement.

Simulating Where Return Current Flows

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Fundamentals of In-vehicle Network (IVN) Bus Systems Webinar

How to Test In-vehicle Networks (IVN) Webinar Series 

Part 1: Fundamentals of In-vehicle Network (IVN) Bus Systems

Master the complex world of evolving in-vehicle networks and unlock peak performance for ADAS, infotainment, and autonomous driving with our new 4-part webinar series with presenter Thomas Stueber, Product Manager In-Vehicle Networks. 

In Part 1 we focus on the fundamentals of the IVN ecosystem, including a brief history and evolution of the different standards, an overview of benefits of the new technology, and the associated design challenges. We conclude with an introduction into the test requirements and the analysis tools available to help troubleshoot and qualify designs. 

Don't miss this opportunity to gain insights, address challenges, and navigate the complexities of automotive networks with an expert in the field. Click here to register. 

We look forward to seeing you on-line!

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Testing the Future of Open RAN

As the complexity of balancing costs, performance and interoperability of Open RAN components increases, developers and test engineers need solutions to make that process faster, easier and more cost-effective. 

Join us on January 25 when Roberto Kompany, Principal Analyst at Omdia, discusses the challenges of disaggregation in Open RAN environments with Martin Qvist Olsen, Technical Marketing Director at Teledyne LeCroy Xena, a leading vendor of network emulation solutions

Click here to watch the webinar.

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thermalLIVE 2020

Advanced Cooling Technologies, Inc.

In this webinar, we will share real-world examples where creative approaches in thermal engineering have allowed design engineers to push their design concepts forward. Join us as we explore some advanced thermal management technologies, including Heat Pipes and Phase Change Material heat sinks. We will provide practical applications for each that apply to a range of markets from Spacecraft thermal control to defense and industrial applications.

Speakers

Kimberly Fikse

Kimberly Fikse, Lead Sales Engineer at Advanced Cooling Technologies, Inc.

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Beyond the TDR - Differential and Common Impedance, Crosstalk and Mode Conversion

A Time Domain Reflectometer (TDR) displays the instantaneous single-ended or differential impedance profiles of an interconnect and the location of discontinuities. While this is valuable information, there is additional information we can extract by expanding to multiple ports and looking at not just the differential impedance, but also the common impedance and even the location of crosstalk and mode conversion.

Join Eric Bogatin and Teledyne LeCroy as we introduce the value of looking at multi-port and mixed-mode TDR and impedance measurements, the best measurement practices and how to analyze the results.

Topics to be covered in this webinar:

  • Converting frequency domain into the time domain
  • Impedance profiles and interconnect structures
  • Measuring near- and far-end crosstalk
  • Identifying the location of crosstalk
  • Features that can cause mode conversion
  • Three important consistency tests to always consider

Who should attend? Engineers who need to characterize the electrical properties of interconnects, or currently use TDR measurements.

What attendees will learn? How to use TDR measurements to interpret interconnect electrical features.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

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Xena Networks: How Terabit Ethernet works

Networking devices supporting 800Gbps Ethernet are now being developed, with some industry analysts predicting the next tech cycle of 1.6Tbps (Terabits per second) could arrive as early as 2024.

But the devil's in the details - and there are a lot of details.

Xena's new White Paper examines the technical options and challenges of bringing terabit Ethernet to life. Learn how faster electrical lane speeds, new modulation schemes and the need for better Forward Error Correction (FEC) mechanisms are playing a key role, as well as why you'll need to test changes to the Ethernet physical layer and transceiver form factors.

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Advanced Illumination: CSI, Inc. Cement Board Inspection Application

Machine Vision Challenge: Cement Board Inspection

A customer inspecting 4 ft. by 10 ft. white fiber-cement boards required a lighting solution to highlight small 5cm long and 1mm thick surface scratches and defects. They also identified significant surface concavity created during the manufacturing process on some of the 2cm thick boards. As a result, they required the flexible lighting solution to also assist their efforts to develop an identification and grading system to pass/fail board concavity.

The cement boards were inspected in motion, running 1 foot/second through an enclosed tunnel. The inspection setup required a low-angle, narrow beam throw for uniform illumination across the full surface of the board to identify the scratches. The tunnel setup also required the use of longer lights for full board coverage and to facilitate installation.

An additional inspection using the same area-scan camera, but with bright field oriented lighting, necessitated the two lighting orientations be independently controlled with an on/off trigger. The customer contacted Control System Integrators (CSI), Inc. to configure a lighting solution for this inspection challenge.

Ai Solution: High Intensity Bar Lights

Via Ai’s Distribution Partner, Kendall Electric, CSI, Inc. reached out to Advanced illumination to provide a dark field lighting solution for their customer. To match the size and uniformity needs, Ai suggested the LL174 High Intensity Bar Lights with a diffuse light conditioning.

These lights are highly customizable, each available in the 24” length demanded of the application. The configurable control options also allowed for the use of the iCS 3 Inline Cable Controller to enable constant or strobed power to the light. The longer length and controller options met the customer’s initial requirements to fit within the existing machine vision setup constraints.

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Probing in Power Electronics Webinar What to Use and Why: Part Two

Power electronics designs have inherent measurement challenges. This has led to development of many specialized high and low voltage single-ended and differential probes to meet the specific needs of this market. However, proper probe selection and use is critical for operator, equipment and DUT safety and also has a large influence on the accuracy of the measurement.

Join Teledyne LeCroy for this two-part webinar series as we provide tips to overcome these questions.

In Part 1 we review the different HV rated probe specifications and topologies and explain what measurement each probe topology is ideally suited for. Register here

In Part 2 we provide real-word examples and comparisons between a variety of different probes and amplifiers.

Presenter: Ken Johnson, Director of Marketing, Product Architect Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Technical Webinar: Maximizing Reliability in Signal Switching

Gain insights into the importance of switching in test systems and what items need careful consideration. These include which type of relay is most suitable, how to choose the right relay, avoiding relay failures and design issues.

Join Pickering's technical experts for this live webinar as we discuss key trends, challenges and considerations for your test system switching.

Why you should join us:

  • Learn important guidelines that will make your switching more reliable
  • Understand the difference between Electro-Mechanical Relays (EMRs), Solid-State Relays and Reed Relays
  • How to choose the right relay based on your application and specifications
  • How to avoid common relay failures and issues

Date: August 26, 2020

Time:

  • 8:00 AM PDT
  • 11:00 AM EDT
  • 4:00 PM BST
  • 5:00 PM CEST

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How to Measure Power During Volt-second and Other Short Power Periods

3-Phase Power and Motors Masters Webinar Series

Join Teledyne LeCroy for this Learning Lab series on measuring high-power, three-phase and motor inverter and drive systems with an 8-channel high-resolution oscilloscope or motor drive analyzer. Learn about static and dynamic measurements, from AC line to inverter switching, and line outputs to motor mechanical performance.

How to Measure Power During Volt-second and Other Short Power Periods

In this session (Part Four), we will review examples of power calculated during power periods equivalent to a device switching time. This is especially helpful for understanding instantaneous control response time, as required for deadbeat-direct torque and flux control (DB-DTFC) and other rapid response control systems.

Topics to be included:

  • Principles of defining the short power period Variable-flux electric machine analysis example DB-DTFC machine analysis example
  • Dynamic loss calculation during rapid acceleration of servo motor

Who should attend? Inverter subsection engineers, motor/drive control system engineers, and inverter/drive systems engineers who design dynamic control and power systems that operate under highly controlled conditions.

What attendees will learn? Best in class techniques for measuring and understanding performance of and interrelationships between control and power sections.

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

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Technical Webinar: Simplifying Test Interconnect with Pickering's Cable Design Tool

The cable design for a automated test system is critical for repeatability and accuracy, it needs care and expertise. Depending on the application, a test engineer needs to consider test specifications, including voltage, current, temperature, insertion losses, and more. Unless the test engineer is an expert on cabling, researching wires and connectors can be a daunting task.

There are times when a standard cable assembly is not suitable, and there is a need for custom connectors and wire types or specific harness wiring. Our free online Cable Design Tool (CDT) is a simple and efficient way of creating these custom cabling solutions.

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Teledyne LeCroy: Using a Digital Oscilloscope for Signal Analysis Including A Practical Example of PLL Characterization

The oscilloscope has been a primary tool for electronic design engineers since the invention of that instrument, many years ago. The first decades of oscilloscopes were “analog” in nature.

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How is Rise Time Related to Bandwidth in an Oscilloscope? by Teledyne LeCroy

Teledyne LeCroy: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?

In Part 3 of our 2023 Oscilloscope Coffee Break Webinar Series we discuss the relationship between signal rise time and oscilloscope bandwidth and how to choose the right bandwidth of oscilloscope for your application.

Register Here

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

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Succeeding with 112G SerDes

This time we're teaming up with Synopsys to show you four demonstrations about implementing & optimizing 112G SerDes & Auto-Negotiation & Link Training (AN/LT). 

We will demonstrate both auto-negotiation and link training, slowing down the process so you can clearly see what information is being exchanged, how to interpret this data, and what parameters to change to improve the results. We will then manually single-step through the Link Training process to verify robustness and debug issues. 

Finally, we will look at the current difference between an Ethernet Technology Consortium-compliant 800G link and an IEEE-compliant 800G link.

Register for the webinar

The first two webinars in this Masterclass series proved very popular, and can still be viewed here on our website. 

P.S. Don't worry if you can't make it on the day - everyone who registers will be sent a link to a recording of the webinar so they can review it at their leisure.

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Everything you Need to Know About Chambers for Automotive EMC Testing

Amplifier Research

EMC Live: Automotive 

Anechoic chambers are necessary for many of the tests involved in automotive EMC testing. We will be looking into what is needed in today’s automotive EMC chamber and discussing shielding effectiveness, how to properly size a chamber, 40 GHz performance, and other topics that could affect accreditation. Elements sometimes overlooked will also be identified, such as fire detection & suppression and door maintenance. 

REGISTER NOW

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Teledyne LeCroy: Understanding Signal Integrity Problems in USB Type-C® and HDMI® 2.1 Cables

Do you work for or with a company that does high-volume production of USB Type-C and HDMI 2.1 cables?



If so, how do you perform quality assurance assessments on sample cables, engineering first article inspections, or root-cause failure analysis?



Join Professor Eric Bogatin as he describes how to go beyond production cable tests and use advanced signal integrity tests, such as eye diagrams, insertion loss and crosstalk measurements, and impedance profiles, to understand why cables are failing production test or to understand how much margin there is in the cable design. Eric will demonstrate how to do all of this without using an expensive oscilloscope, vector network analyzer (VNA) or TDR.

Topics to be covered:

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Xena Networks: Terabit Ethernet - Why?

Xena is proud to launch "Freya", our newest and fastest Valkyrie test module. The first of a new product family based on 112Gbps PAM4 SerDes, Freya is aimed at first movers in the 800GE space and designed for 800G switch, transceiver and PHY design validation & Quality Assurance.

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Amplifier Research: Chamber Solutions from AR

Test chambers that never compromise on performance, safety, or environmental responsibility

Not all chambers offer the same performance or quality. All reverberation, fully and semi-anechoic chambers provided by AR RF/Microwave Instrumentation, offer customers the highest level of performance, quality, and support. One unique advantage is the pan shield design, which allows for premium performance and seamless construction over older designs techniques, such as wood core shielded chambers. The pan-type shield's baseline performance is far more reliable and exceeds 100 dBA level of attenuation up to 40 GHz without any modifications or add-ons. This performance provides an excellent testing environment for your testing needs.

Click here to view video.

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Understanding Signal Integrity Problems in USB Type-C® and HDMI® 2.1 Cables

In this webinar, Eric Bogatin describe how to go beyond production cable tests and use advanced signal integrity tests, such as eye diagrams, insertion loss and crosstalk measurements, and impedance profiles, to understand why cables are failing production test or to understand how much margin there is in the cable design

Click here for details & registration

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Zooming With an Oscilloscope – Zoom Waveforms and Timebase Adjustment

Teledyne LeCroy

Time: 11 AM Pacific | 2 PM Eastern

Duration: 30 minutes

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Power Integrity in Multi-rail Embedded Designs Learning Lab Part 3: How to Become an Expert in Power Integrity Testing

Register Now

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Power Integrity in Multi-rail Embedded Designs Learning Lab

In this session (Part 3), we’ll demonstrate and teach how to characterize and validate the integrity of multiple power rails in a PDN network, including the interactions and control of VRM’s, POL’s, LDO’s by Power Management ICs in embedded designs.

Topics to be covered in this webinar:

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Fundamentals of Power Integrity Tutorial: Measuring Power Sources

In this webinar, Eric Bogatin will show three important measurement techniques to characterize the VRM properties and noise, and the role that bulk capacitors and ferrite filters play in reducing noise on the power rails.

Click here for details & registration

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NEW Entry-Level Silicon Photonics Solution for Fundamental Research

FormFactor introduces a cost-effective silicon photonics measurement solution to support fundamental research work for emerging applications.

Designed into the system are FormFactor's years of experience developing automated photonics measurement systems – now tailored to the needs of universities and other entry-level users. Leveraging its intuitive design, the MPS150-SiPh is the perfect solution for less experienced users to discover photonics and achieve highest accuracy test results.

  • Supports both surface coupling and horizontal edge coupling
  • Aligns optical fibers to couple light in and out of a device without physical contact

Learn how this new solution can help entry-level photonics researchers achieve:

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Xena Networks: Plotting the performance landscape for SD-WAN

SD-WAN was first introduced to provide a reliable and cost-effective backup to MPLS-based enterprise WAN connectivity. As IP and Internet networks have become more reliable, along with the growth in adoption of cloud services, SD-WAN has evolved and is replacing branch office routers as the preferred WAN connectivity solution.

According to Gartner, 60% of enterprises will have implemented SD-WAN by 2024 compared to just 30% today. At least 30% of enterprise locations will only have Internet WAN connectivity, which is twice the current number. The impact of SD-WAN on the WAN infrastructure market is also clear with Gartner expecting a Compound Annual Growth Rate (CAGR) of -3.1% from 2017 to 2024 as cheaper SD-WAN solutions replace more expensive branch office routers

Nevertheless, one should not make the mistake of thinking that SD-WAN is less complex or intelligent. Quite the contrary in fact. The latest generation of SD-WAN solutions are expected to be application-aware and capable of determining the optimal path through the WAN in real-time on a per application basis. This includes cloud services with direct offload from the branch to co-located cloud edge services. In addition, sophisticated security capabilities are provided to support Zero Trust Network (ZTNA) and/or Secure Access Service Edge (SASE) concepts.

The sophistication of modern SD-WAN solutions allows a true de-coupling of WAN connectivity from the underlying transport mechanism, which is predominantly Ethernet based. It also means that there is little insight into the data transport layer, only to the tunneled SD-WAN connections that are supported. As data consumption continues to grow and more sophisticated and demanding Internet-based services contend for public Internet resources, the underlying data transport layer networks supporting SD-WAN are becoming more dynamic and unpredictable. Multiple choices can be available, such as fixed broadband access over copper or fiber, Fixed Wireless Access (FWA) or 5G mobile broadband, but when should one choose these options, and can one be sure that the current measured performance will be maintained?

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Technical Webinar: Accelerate Software Development of Your Automated Test System

Much like driving from one point to another in a big city, routing an electrical signal between a test instrument and a device under test can require navigating a complex network of interconnected relays, wiring and interfaces. Instead of right and left turns, the ATE software engineer must determine the correct position setting of multiple relays to establish the desired route. 

In this training, you'll learn how Switch Path Manager (SPM) signal routing software accelerates the software development effort of Automated Test Systems, considerably reducing the number of lines of code required to route test instrumentation to the device to be tested.

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Junkosha: How to Select the Appropriate Cable

Selecting the right cable is crucial for both Microwave and mmWave applications. Indeed, measurements are not accurate nor reliable unless appropriate cables are used. This video outlines how to select the most appropriate cable for any given purpose.

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Pre-Compliance EMC Testing with a Real Time Scope

Before an EMC compliance test, there are a few simple measurements that can be performed on the lab bench to indicate potential test failures. While only near-field emissions can be measured, they can sometimes indicate potential far-field problems that might cause an EMC test failure.

Join us for our new two-part webinar series for measurement tips to overcome these challenges.

In this webinar, we demonstrate how the combination of a real time oscilloscope and near field probes can give us insight into how physical interconnect structures cause pathological EMC problems.

Register now

In Part 2 we will explore detecting potential EMC failures measured with real time spectral analysis. Click here to register.

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelist, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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Solve your Tough Thermal Problems; Next Generation Solutions for Power Electronics Engineers

Advanced Cooling Technologies, Inc.

Register Today!

Join our subject matter experts for a roundtable discussion on cooling trends for power electronics!

Thermal Management is a critical design point for many companies looking to push the limits of Power Electronics’ performance. In this webinar our panel will explore a roadmap of thermal solutions from low to high power applications. We will take a deep dive into several technologies that are beginning to be adopted in many applications because of their ability to push the limits of performance vs traditional air or liquid cooled systems. Whether your objective is to maintain long term, reliable operation or keep adding power to your system, join us and learn about a solution that is right for you.

Key Takeaways:

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Technical Webinar: The Importance of Using Programmable Resistors for Sensor Simulation in Test

In this webinar, we will help you to understand programmable resistors, their construction, why they are needed, resistor selection and look at some applications where sensor simulation is an integral part of the adopted test strategies to improve repeatability, reduce test times, and ultimately lower the cost of test. View the webinar here

A few of the takeaways are:

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How to Measure Jitter Induced by PDN Noise by Teledyne LeCroy

Presenter: Prof. Eric Bogatin

Join Professor Eric Bogatin as he discusses and demonstrates how to measure in-circuit jitter caused by PDN power integrity noise and other abnormalities.

Register Here

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VIAVI: 10G/25G/50G PON

Time: 1:00 PM EDT / 12:00 PM CDT / 10:00 AM PDT / 5:00 PM GMT
Sponsor: Viavi Solutions
Duration: 1 Hour

This presentation will start with an overview of the various PON services and look at the trend for PON service deployment. Then a quick explanation of the key differences between broadband versus PON power meters will follow and looking at the situations where you can and cannot use a Broadband PM and why. We will look at the challenges faced around the final fiber connection to a subscriber’s premises, specifically how to establish if you have the correct drop fiber and terminal connection, and the technology embedded in the transmission equipment (PON-ID) that can help confirm and troubleshoot issues.

Click here to register.

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How to Become an Expert in Automotive Ethernet Testing - Part 1: Fundamentals of Compliance Test, Validation and Debug

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Fundamentals of Compliance Test, Validation and Debug

In this session (Part 1), we will focus on the fundamentals of the Automotive Ethernet ecosystem, including a brief history and evolution of the standard, an overview of benefits of the new technology and the associated design challenges. We will conclude with an introduction into the test requirements and the analysis tools available to help troubleshoot and qualify designs.

Topics to be covered in this webinar:

  • What is Automotive Ethernet
  • Different variants of Automotive Ethernet
  • Overview of OPEN Alliance
  • Introduction to testing requirements

Who should attend? Engineers and Technicians who have just begun or will be working on Automotive Ethernet. This session is an introductory course.

What attendees will learn? Background knowledge for Automotive Ethernet, who uses it, why they are using it, and what to expect when testing it.

Presenter: Robert Mart, Director of Marketing

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Teledyne LeCroy: Mode-Equalized Raman Gain Experiment using LabMaster

We experimentally demonstrate 8 dB of mode-equalized distributed Raman gain using a backward pumping scheme. The equivalent noise figure of the amplifier is -1.5 dB, and the amplifier was successfully employed to demonstrate 6-channel mode-multiplexed MIMO transmission over 137-km few-mode fiber.

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Fundamentals of Power Integrity Webinar Part 1: How to Become an Expert in Power Integrity Testing

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Fundamentals of Power Integrity

In this session (Part 1), we will define what power integrity is and why should we care. We will review the types of power distribution network (PDN) noise, including self-aggression noise, pollution of the board/package interconnects and mutual aggressors and conclude with best measurement practices.

Topics to be covered in this webinar:

  • Basic definitions
  • Tolerances and why they matter
  • PDN noise types
  • Best measurement practices
  • Real-world probing examples

Who should attend? Hardware design and validation engineers and technicians interested in learning more about PDN noise and power integrity problems and solutions.

What attendees will learn? Attendees will be given a thorough background in power integrity and how to assess it in a design.

Presenter: Dr. Patrick Connally, Product Marketing Manager

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Teledyne LeCroy: How Do I Make a Differential Measurement on an Oscilloscope Using Passive Probes?

Teledyne LeCroy: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?

Time: 11 AM Pacific | 2 PM Eastern

Duration: 30 minutes

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.  Click here to access the entire series.

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