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How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Mastering MDI Return Loss and Mode Conversion Loss Test

In this session (Part 2), we will focus on the reflection measurements MDI return loss and MDI mode conversion loss. We will review the basic concepts of the S-parameters and their meaning in single ended and mixed-mode form with particular reference to the single balanced twisted pair. We’ll follow with a measurement demonstration.

Topics to be covered in this webinar:

• Automotive Ethernet and single-balanced unshielded twisted pair
• Mixed-mode S-parameter overview
• Why to measure common-to-differential mode conversion?
• Testing the fixture for mode conversion loss margin compared to the MDI requirement
• Introduction to MDI S-parameter testing

Who should attend? All HW engineers developing and testing Automotive Ethernet accordingly to the 100Base-T1 and 1000Base-T1 standards with particular reference to MDI S-parameters.

What attendees will learn? Background knowledge for MDI S-parameter Automotive Ethernet measurement and what to expect when testing it.

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

We didn’t expect to have DC outputs be so noisy! Is it really the circuit that is a problem or is our scope and/or probe causing signal integrity issues? We even tried changing output capacitors to improve the performance, but why are we seeing 2X greater output noise than we expected?

In this session we review which probes are best for your application and how best to connect to your oscilloscope to minimize RF pick up.

Topics to be included:

• Scope setups, which is best?
  • 1 MΩ or 50Ω?
  • AC or DC Coupling?
  • Bandwidth limits?
• Probing output power
  • What is the appropriate probe to use?
  • Challenges with DC-DC low impedance sources
  • Accessories – how do we reduce probe effects on our measurements?

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

We are all pretty good at setting a time window for our capture. But, what about the waveform memory that is used for the capture? How does this interact with the sample rate as we vary the time window? Can we segment the timebase to capture only the important circuit behaviors?

Topics to be included:

• Timebase, memory length and sampling rate – how do these impact our results?
• Timebase delay – pre- and post-trigger location
• Sequential timebase – capturing “just the facts”
• Scope preferences we forget are available

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

For ten years, I’ve had the honor of presenting a tutorial session at the IEEE EMC Symposium. I’m usually positioned right after Bruce Archambeault. This means I get to listen to Bruce talk about inductance. While I think of myself as a bit of an expert on inductance, I always learn something new when I listen to Bruce.

One example he shows, using a simulation of where current flows, will completely recalibrate your intuition if you have never thought about this question. This example stuck with me for more than a dozen years since I originally saw it. Recently, I had a chance to play with the Teledyne LeCroy CP031A current probe used with our scopes and I realized this classic simulation example could be demonstrated with a simple measurement.

Simulating Where Return Current Flows

In this video, we show how to use LabNotebook with the Teledyne LeCroy MAUI Studio oscilloscope software. With LabNotebook, you can save your signals, setups and screenshots to share with a colleague or add to a report. For additional information visit, teledynelecroy.com/mauistudio.

Join Teledyne LeCroy as we describe and demonstrate best practices for de-embedding test fixtures, cables, and probes from serial data link and other signal integrity measurements. This is a critically important process to ensure that the signal integrity measurements for the DUT are not contaminated by the interconnection elements.

Topics to be covered in this webinar:

• Why de-embedding is almost always necessary
• Best practices for reference-plane calibration
• Traditional Frequency-domain de-embedding
• Time-domain gating and peeling (i.e. fixture removal, in-situ de-embedding (ISD))
• Causality conditions

Who should attend? Hardware engineers who use a Vector Network Analyzer (VNA) to obtain S-parameters for use in emulation software.

What attendees will learn? How to accurately measure S-parameters of high-speed interconnects.

Presenter: Giuseppe Leccia, Business Development Manager

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

It’s circuit debug time! Let’s use the oscilloscope’s triggering features to define where we start our investigation to find the troublesome circuit issue.

Topics to be included:

• Trigger Modes – why is my scope display blank?
• Trigger selections – lots of choices to define when we capture data
• Trigger coupling, filters and pre-triggering
• Update rates – maximizing the amount of data captured

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Debugging PHY Layer Link Communication Learning Lab

In this session (Part 4), we review Automotive Ethernet link communication and explore how to debug and troubleshoot these links using an oscilloscope during an interactive session with live signals. We will look at both the physical and protocol layers during this Learning Lab webinar.

Topics to be covered in this webinar:

Enhanced Sample Rate, combined with the low-noise system architecture and the tailored brick-wall frequency response in the HDO4000A, HDO6000A, HDO8000A and MDA800A series oscilloscopes dramatically improves the measurement precision when the input frequency signals are very high frequency, such as a high-frequency sine wave or fast edge.

This paper addresses a new methodology for 12 Gbps interoperability that combines a concerted family of pathological channels, internal eye monitoring, and external EQ simulation tools, providing insight into an EQ optimization strategy that addresses the specific channel’s mix of crosstalk noise, jitter, and channel loss. This also provides a backplane designer the ability to configure a high-loss, crosstalk aggressed system.

Selecting battery test equipment is not as obvious as it might seem. The wrong choice will lead to major integration challenges as well as setbacks including hidden development costs, delayed test start dates, increased complexity, project risks and reduced safety.

This presentation will cover the top 10 factors to consider when deciding to buy a battery cycler, or building your own battery test system with sources and loads, or bidirectional power supplies. In this webinar, we’ll explain key considerations for testing batteries to ensure safety, product performance, flexibility, and time to market. Key topics include:

• Fundamental differences between battery cyclers and build your own approaches
• The hidden technical challenges in building your own test system
• Future-proofing your test solutions
• How to reduce time to market and improve engineering productivity 

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If you cannot attend the live event, please register and we will send you the recording.

The oscilloscope has been a primary tool for electronic design engineers since the invention of that instrument, many years ago. The first decades of oscilloscopes were “analog” in nature.

This webinar will review the fundamentals of ac loading for testing applications across residential, commercial, electric vehicles, aerospace, and military markets. We’ll dive into key features and functions of both traditional and modern ac loading conditions and their many applications across these industries. The ability for ac loads to emulate complex load profiles to include harmonics and sub-cycle transients is important for testing the device and/or the grid to meet modern day requirements.

Learn about the most effective test approaches and test solutions to ensure accuracy, product performance, safety, and reduced time to market. Example applications include testing the grid, inverters, lock rotor current, EVSE, avionics, UPS, switch and fuses, and more.

Key Technical Concepts:

• Regenerative power
• AC load 4 quadrant operation
• True power factor shift
• Linear, non-linear, inductive and capacitive loading
• Testing in various emulation modes: CC, CR, CP, SC
• How to create complex load profiles
• Harmonics and sub-cycle transients

Click here to register!

In this video, we show how you can use scripts to exchange data in real time between Teledyne LeCroy MAUI Studio oscilloscope software and third-party applications like MATLAB, Excel and LabVIEW. For additional information visit, teledynelecroy.com/mauistudio.

ADVANCED COOLING TECHNOLOGIES, INC. (ACT) HAS WORKED EXTENSIVELY ON HEAT PIPE PRODUCT RELIABILITY. This guide provides information for designing, modeling, and practical reliability surrounding copper/water heat pipes.

A heat pipe is a two phase heat transfer device with very high “effective” thermal conductivity. It is a vacuum tight device consisting of an envelope, a working fluid, and a wick structure. As shown below, the heat input vaporizes the liquid working fluid inside the wick in the evaporator section. The saturated vapor, carrying the latent heat of vaporization, flows towards the colder condenser section. In the condenser, the vapor condenses and gives up its latent heat. The condensed liquid returns to the evaporator through the wick structure by capillary action. The phase change processes and two phase flow circulation continue as long as the temperature gradient between the evaporator and condenser are maintained.

We experimentally demonstrate transmission of 6 mode-multiplexed 20-Gbd-QPSK signals over 1200 km of three-core microstructured fiber (3C-MSF). An aggregate single-wavelength capacity of 240 Gbit/s is recovered by off-line 66 coherent multiple-input multiple-output (MIMO) digital signal processing.

Xena is proud to launch "Freya", our newest and fastest Valkyrie test module. The first of a new product family based on 112Gbps PAM4 SerDes, Freya is aimed at first movers in the 800GE space and designed for 800G switch, transceiver and PHY design validation & Quality Assurance.

We present a novel low-loss 3-spot mode coupler to selectively address 6 spatial and polarization modes of a few-mode fiber. The coupler is used in a 66 MIMO-transmission experiment over a 154-km hybrid span consisting of 129-km depressed-cladding and 25-km graded-index few-mode fiber.

Presenter: Thomas Stüber

Looking for background knowledge for Automotive Ethernet, who uses it, why they are using it, and what to expect when testing it? This webinar is for you.

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Have you ever had a device which passed compliance but did not establish a communication link between Master and Slave? Join Teledyne LeCroy for this webinar as we explore some of the different approaches for debugging Automotive Ethernet links by looking at both the physical and protocol layers.

Who should attend: Engineers and technicians who have worked on or will work on Automotive Ethernet. This session will start with the basics and build on them to cover debugging techniques.

What attendees learn: A working knowledge of how Automotive Ethernet frames compare to standard Ethernet frames, how the link startup sequence works, and how to debug Automotive Ethernet links.

Presenter: Bob Mart, Director of Product Management, Teledyne LeCroy

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Can't attend live? Register anyway, and we will send you the recording and slides afterward.

Networking devices supporting 800Gbps Ethernet are now being developed, with some industry analysts predicting the next tech cycle of 1.6Tbps (Terabits per second) could arrive as early as 2024.

But the devil's in the details - and there are a lot of details.

Xena's new White Paper examines the technical options and challenges of bringing terabit Ethernet to life. Learn how faster electrical lane speeds, new modulation schemes and the need for better Forward Error Correction (FEC) mechanisms are playing a key role, as well as why you'll need to test changes to the Ethernet physical layer and transceiver form factors.

This Webinar presents the various challenges that ATE system engineers face when architecting a cabling and interface system. It also discusses the impact that design decisions have on the overall performance of the test system.

A few of the takeaways are:

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Mastering Transmitter Droop, Distortion, Jitter and Spectral Density Test

In this session (Part 3), we will describe the requirements for the Physical Media Attachment (PMA) compliance tests with practical demonstrations using complex signals while indicating the procedures for obtaining the best measurement results and signal integrity.

Topics to be covered in this webinar:

• Maximum Output Droop
• Transmitter Distortion
• Transmitter Timing Jitter, Master and Slave
• Transmitter Power Spectral Density (PSD)
• Transmitter Peak Differential Output
• Transmitter Clock Frequency

Who should attend? Engineers and technicians looking to learn more about the physical layer compliance test process for Automotive Ethernet.

What attendees will learn? What to expect when setting-up and performing Automotive Ethernet physical layer tests. Each of the different tests will be covered in detail with hands-on experience.

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

4 Practical Real-world Examples of Embedded System Validation and Debug

In this session (Part 3), we apply the display, measurement and waveform math tools covered in Part 1 and 2 to specific embedded design application examples.

Topics to be included:

• Power rail integrity measurements and probing power rails
• Power rail sequence measurements
• Low-speed event correlation to high-speed event
• Correlating sensor signals with embedded serial data

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

Time: 11 AM Pacific | 2 PM Eastern
Duration: 30 minutes

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month. Click here to access the entire series.

Part 10: Zooming With an Oscilloscope – Zoom Waveforms and Timebase Adjustment

Oscilloscope zooms are utilized to view and measure details of acquired signals. Many times we want to acquire signals over a wide window of time so we do not miss any changes or unexpected events. There are generally two ways to do this using horizontal zooms.

In this webinar we describe how to view timing details of your acquired signals through the use of both horizontal zoom controls and changes to timebase and delay settings. We will compare and contrast the two methods.

Topics to be covered in this webinar:

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Characterize Lossy Interconnects in High-speed Designs

Join Eric Bogatin and Teledyne LeCroy for this webinar exploring the properties of lossy transmission lines and how to extract their important figures of merit. All losses are frequency dependent. We introduce a simple way of estimating the losses expected based on the interconnect design and how to measure the losses using S-parameters.

Topics to be included:

• The root cause of losses
• Estimating the conductor and dielectric losses
• Extracting an important figure of merit from insertion loss
• How much insertion loss is too much?
• Estimating the maximum data rate of a channel from the insertion loss

Who should attend? Any Engineer designing, validating or using high-speed serial data links.

What attendees will learn? How to analyze insertion loss and interpret measurements in terms of highest acceptable data rate.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Fundamentals of Power Integrity

In this session (Part 1), we will define what power integrity is and why should we care. We will review the types of power distribution network (PDN) noise, including self-aggression noise, pollution of the board/package interconnects and mutual aggressors and conclude with best measurement practices.

Topics to be covered in this webinar:

• Basic definitions
• Tolerances and why they matter
• PDN noise types
• Best measurement practices
• Real-world probing examples

Who should attend? Hardware design and validation engineers and technicians interested in learning more about PDN noise and power integrity problems and solutions.

What attendees will learn? Attendees will be given a thorough background in power integrity and how to assess it in a design.

Presenter: Dr. Patrick Connally, Product Marketing Manager

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Become an Expert in DDR Memory Physical Layer Testing Series

Join Teledyne LeCroy for this 4-part DDR Memory Master Class to learn about the basics of DDR testing with oscilloscopes, including common test preparation and challenges, the difference between compliance and debug test tools, and practical tips and techniques to increase your DDR validation efficiency and apply the correct debug tools.

Beyond DDR Compliance Testing — Using Advanced Debug Tools

In this session (Part 2), we review the latest DDR test requirements and provide practical advice on solving test challenges. We will provide guidance on how to test to the latest JEDEC standards and proper use of debug tools to overcome test and validation challenges.

Topics to be included:

• DDR/LPDDR4, LPDDR4X, and DDR/LPDDR5 specification review
• Test system ‘bring-up’ and debug
• When are you ready to move from ‘debug’ to ‘compliance’?
• Implications of fully encoded command bus and DFE in LPDDR5 and DDR5
• How to send the proper test signals
• Read/Write eye separation
• Eye and jitter measurements

Who should attend? Design and validation engineers working to validate and debug DDR in embedded systems.

Cable reliability, especially phase stability against Temperature change, is of critical importance in microwave and mmWave measuring. Junkosha has developed cables with excellent phase stability against temperature change through innovative materials and processing technology.

Join Teledyne LeCroy for our new three-part webinar series to learn more about how to accelerate and improve testing of PCIe® v. 4.0 and 5.0, USB4™, Thunderbolt™ 4, and DisplayPort™ 2.0 serial data links.

Nov. 19 - Part One: Identifying and Debugging PCIe Link Equalization Problems
Dec. 3 - Part Two: Simplifying Receiver Calibration and Test of 16+ Gb/s Serial Data Links
Dec. 16 - Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

Join us for Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

High-speed serial link transmitter testing can be optimized with the right tools, and valuable circuit design operating margin information can be extracted.

This webinar will provide an overview of a typical high-speed serial data transmitter test using USB4 as an example. We will synthesize a high-speed serial data signal, use a real-time oscilloscope to analyze the signal at a virtual receiver, and compare the virtually-received signal to a live signal. We will review signal integrity margin analysis and jitter, eye diagram, IsoBER contour and crosstalk eye measurements.

Who should attend?

• Signal Integrity Engineers
• Design and Validation Test Engineers

Presenters:
Mike Engbretson, Product Marketing Manager and John Smith, HSS Business Development Manager

Test chambers that never compromise on performance, safety, or environmental responsibility

Not all chambers offer the same performance or quality. All reverberation, fully and semi-anechoic chambers provided by AR RF/Microwave Instrumentation, offer customers the highest level of performance, quality, and support. One unique advantage is the pan shield design, which allows for premium performance and seamless construction over older designs techniques, such as wood core shielded chambers. The pan-type shield's baseline performance is far more reliable and exceeds 100 dBA level of attenuation up to 40 GHz without any modifications or add-ons. This performance provides an excellent testing environment for your testing needs.

Click here to view video.

Power Electronics are the most critical components in a large number of applications; including power generation and operational equipment. Power Electronics module manufacturers invest millions of dollars to make these devices as effcient as possible, aiming primarily to reduce waste heat. However, even with effciency gains at the module level, overall waste heat is rising across the industry due to more system and user driven functional requirements. Increased system capability leads to higher power densities and more waste heat! Selecting off the shelf thermal solutions is no longer a viable option for applications that are pushing the envelope on power and operating effciency.

Investing in an optimal thermal solution can be the design change with the largest payback potential in a high power system. If properly designed, the thermal management system should not only meet performance requirements, but do so while minimizing energy usage. This eBook provides a guide for designers looking to expand the operating limits of traditional air and liquid cooled thermal solutions.

When measuring the performance of the DUT, if the shift of the data transmission timing – also known as skew – occurs between multiple cable connections, the performance of the DUT cannot be accurately determined. Junkosha has developed a stable transmission rate cable against bending.

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

Real-time Spectral Analysis of Power Rails

In this session (Part 6), Dr. Eric Bogatin will explain and demonstrate how transforming acquired time-domain signals into the frequency domain will get you to the right answer faster, extract the important figures of merit of the signal, and help you find the root cause of a problem. Eric will introduce important principles to help you get the most out of your time and frequency domain measurements and analysis of signals. We’ll apply these techniques to look at high bandwidth signals, noise sources and power rails.

Topics to be covered in this webinar:

As electrical/automation and control systems components become more compact and complex the internal enclosure heat loads are increasing. PLC’s, starters and drives are some of the major generators of heat in an enclosure. There are many challenges in the way we choose to keep the enclosures cool. ACT has developed a series of heat exchangers and air conditioners that are environmentally sealed to cool and protect the internal cabinet components from water, airborne chemical, and particulate contaminants.

Watch now for an in-depth discussion on sealed enclosure cooling technology options. We will discuss both above and below ambient cooling technologies, how they are selected and how they are installed. We will conduct live demonstrations of each ACT sealed enclosure cooling family so you can compare sizes and options. We will encourage questions and discussion as if you were with us, in person, at a trade show!

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Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

In this webinar, we will help you to understand programmable resistors, their construction, why they are needed, resistor selection and look at some applications where sensor simulation is an integral part of the adopted test strategies to improve repeatability, reduce test times, and ultimately lower the cost of test. View the webinar here

A few of the takeaways are:

Noise on the power rail may not only create bit errors due to voltage spikes, but it may also increase clock jitter. Clock jitter is an insidious source of noise difficult to debug.

In this webinar, we demonstrate how to measure the jitter in both clocks and data and identify the contribution from noise on the power rail. These techniques can be applied to any system in which minimizing clock and data jitter is important.

Topics to be covered in this webinar:

• Using time interval error (TIE) to measure jitter
• The statistics and spectrum of TIE as a way of characterizing jitter
• Typical jitter in various types of oscillator circuits
• Best practices to measure power rail noise
• The impact power noise can have on clock jitter
• Examples of clocked systems with high and low jitter sensitivity to power rail noise

Who should attend? Hardware and circuit engineers who design interconnects and clocked circuits.

What attendees will learn? This webinar will introduce you to how to measure jitter and power rail noise, and how to reduce the sensitivity of your clocks to power rail noise.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.  Click here to access the entire series.

Part 8: How Do I Measure Current on an Oscilloscope Using a Shunt Resistor?

Current sense (shunt) resistors are commonly included on printed circuit assemblies to provide a convenient means to measure current flow somewhere in your circuit. How do you use that resistor to measure the actual current with your oscilloscope?

In this coffee break webinar we provide practical guidance on how to probe the voltage drop across the shunt resistor to minimize noise and accurately measure the current on your oscilloscope.

Topics to be covered in this webinar:

• Selecting the right probe for the measurement
• Rescaling the voltage output of the probe to a current value
• Considerations for accurate measurements

Presented by: Jonathan Shechter, Product Marketing Engineer

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

5G deployments are now underway across the globe but are merely the first steps in a multi-year journey for the mobile industry. Many practical challenges still remain, not least of which is the challenge of cost-effectively deploying 5G Radio Access Networks (RANs) at scale and assuring the performance of supported 5G services.

The 5G RAN architecture provides an open, virtual, packet-based network that extendsfrom the core to the radio antenna. The virtual architecture of 5G RAN with network slicing and new functional elements, such as the Central Unit (CU) and Distributed Unit (DU), enables multiple demanding services to share the same infrastructure without compromising on their specific performance requirements. Virtual, packet-based RANs also enable network sharing over open interfaces as well as multi-vendor implementations, both of which are important to the 5G business case.

Hardware appliances, such as the Remote Radio Head and Baseband Unit of 4G LTE are now replaced with virtual software running on whitebox or Commercial Off-The-Shelf (COTS) hardware. In 5G, the Baseband Unit is split into two new functions, namely the CU and DU. Both these functions can be located either close to the 5G core or close to the Radio Unit (RU) to meet latency and backhaul requirements. This leads to a much more dynamic fronthaul, midhaul and backhaul network, which is now collectively referred to as the 5G cross-haul or “X-haul” network.

It also means that the traditional aggregation architecture where higher capacity is required closer to the core is no longer the norm. As cloud computing and other real-time services move closer to the edge of the network, more traffic is likely to remain close to the subscriber requiring higher capacity X-haul networks with 10G, 25G and even 100G Ethernet connectivity.

In this webinar we describe common causes of oscilloscope noise and how additive noise from the oscilloscope can be reduced to improve the quality of your measurement result, regardless of the starting resolution/noise of your oscilloscope.

Register Here

Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

EMC Live: Automotive 

Anechoic chambers are necessary for many of the tests involved in automotive EMC testing. We will be looking into what is needed in today’s automotive EMC chamber and discussing shielding effectiveness, how to properly size a chamber, 40 GHz performance, and other topics that could affect accreditation. Elements sometimes overlooked will also be identified, such as fire detection & suppression and door maintenance. 

REGISTER NOW

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Signal Display and Measurements

In this session (Part 1), we will discuss the various signal display and measurement tools available in oscilloscopes and how to avoid the traps and pitfalls that lead to inaccurate or inefficient measurements. We will also review how to extract circuit details from both short and long record acquisitions to aid in debugging of embedded designs.

Topics to be included:

• Improving measurements with multi-grids
• Analytical waveform views
• Using measurement parameters effectively
• Best uses of statistical data and views
• Pass/Fail parameter testing

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

The industry's first NRZ and Manchester configurable protocol decoders accept a broad range of physical characteristics for NRZ- or Manchester-encoded signals.

Best Practices for 48V Power Conversion Testing

48 Vdc battery-powered system volumes will grow quickly in automotive and consumer applications. While the voltages are not inherently challenging, oscilloscope, probe and power analyzer innovation have lagged the trend towards >12V battery voltages.

Join Teledyne LeCroy as we describe new products and best practices and measurement techniques for validation and debug of 48 V power conversion systems.

Topics to be covered in this webinar:

• GaN trends and trajectories
• Choosing the right probe
• Inverter subsection debug
• Gate-drive measurement probe comparisons
• System output measurements

Who should attend? Inverter subsection, Systems, or Control System engineers involved in the design, validation and debug of 48 V power conversion systems.

What attendees will learn? Best practices, techniques and equipment for measuring, validating and debugging each portion of the 48V power conversion system.

Presenter: William Kaunds

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Advanced Measurements and Math

In this session (Part 2), we will develop skills for acquiring and performing measurements, waveform math, and analysis that isolate and help us locate amplitude and timing errors within an embedded design.

Topics to be included:

• Plotting measurement values over time
• Waveform math tools
• Measurement parameter Tracks and Trends
• Serial data triggering and decode
• Mixed signal digital capture and integration

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

You’ve got a scope, now how do you get the most out of it without spending a lot of money?

In this free webinar from Teledyne LeCroy, Eric Bogatin will show you the right way you can do five common SI and PI measurements with a budget scope and some simple probes you probably already have around. We’ll look at some of the common artifacts to avoid so you can get meaningful measurements.

Topics covered include:

• Probing a fast rise time signal to get its rise time
• Measuring a power rail with a 10x probe
• Measuring a low impedance power rail with a build it yourself power rail probe
• Measuring the source of near field pick up
• Using the FFT function to analyze the root cause of noise pick up

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelis, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

Click here to register

Companies manufacturing all sorts of products use Quality assurance (QA) to prevent errors and mistakes in their products and ensure flawless product deliveries to their customers. This willimprovecustomer satisfaction and reducethe need for after-salestroubleshooting and support.

QA give companies get a systematic process to find outif their products meet what is required. QA defines requirements for developing and manufacturing reliable products.A driving force behind QA is the ISO(International Organization for Standardization). ISOhas developed the ISO 9000international standard, on which many companies base their QA system.

QA testing is done during and after development andprovidesinformationtodevelopers if changes or improvements are required.During product development the development team will do thorough testing of the product, covering e.g. functional and stress testing of the basic functionality of the product. QA testing of physical products normally includes stress testing of a number of environmental conditions.QA tests that may be conducted include:

• EMC Tests •Mechanical Tests
• Thermal/Humidity Tests
• Hi-Pot Tests
• Sand and Dust Tests
• Salt Spray Tests

We experimentally demonstrate 8 dB of mode-equalized distributed Raman gain using a backward pumping scheme. The equivalent noise figure of the amplifier is -1.5 dB, and the amplifier was successfully employed to demonstrate 6-channel mode-multiplexed MIMO transmission over 137-km few-mode fiber.

Time: 11 AM Pacific | 2 PM Eastern
Duration: 60 minutes including Q&A

How to Perform PCI Express 5.0 PHY Compliance Testing

Join Teledyne LeCroy for this live demonstration of PCI Express 5.0 Electrical Compliance Testing. In this webinar we will demonstrate everything a Test or Validation Engineer will need to do to perform PCIe® 5.0 CEM physical layer/electrical compliance testing.

Topics to be covered in this webinar:

• Test Equipment Requirements
• Physical Connections between DUT and Test Equipment
• ISI Board Characterization
• Stressed EYE Calibration
• Link EQ, TX, PLL Testing

Who should attend? Design, validation and test engineers working on PCIe 5.0 devices

What attendees will learn? How to perform PCIe 5.0 CEM physical layer/electrical compliance testing.

PCI Express® 5.0 Compliance Test Overview

Join Teledyne LeCroy for this two-part master class in PCI Express 5.0 – from electrical through Link layer and Transaction layer. PCIe 5.0 is approaching the time when initial compliance and interoperability testing can commence. Teledyne LeCroy PCIe Gen5 physical-layer and protocol test experts will focus on each test, explain the background theory, how the test procedure works, how passes and failures are determined, and how to track down and debug problems.

PCI Express 5.0 Electrical Compliance Test Overview

In this session (Part 2), we describe the new PCIe 5.0 electrical compliance test procedures – what’s new, what’s the same as past generations, and how to avoid the most common test pitfalls.

Topics to be covered in this webinar:

• Fixture characterization
• Transmitter electrical testing
• Transmitter Link Equalization testing
• Receiver Link Equalization testing
• PLL bandwidth testing
• What’s new in PCIe 5.0 compared to PCIe 4.0.

Who should attend? Design, validation and test engineers working on PCIe 5.0 devices.

What attendees will learn? How to be prepared for upcoming PCIe 5.0 electrical compliance test events.

Presenter: Dr. Patrick Connally, Product Marketing Manager

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USB Type-C® Technologies Webinar Series

Join Teledyne LeCroy for our webinar series on USB Type-C technologies with a focus on the physical layer, from an introduction to the various technologies in the Type-C ecosystem to USB 3.2, USB4™, Thunderbolt™, DisplayPort™, USB4 Type-C sideband (USB Power Delivery, DisplayPort AUX, USB4 SB) testing.

USB3.2 Physical Layer Compliance Testing and Debug

In Part 3, we will focus on the USB3.2 specification given its ubiquitous use for USB peripherals. We will cover new test requirements for the USB3.2 CTS and the tools for testing it.

Topics to be covered in this webinar:

• USB3.2 Specification Test Requirements
• Compliance Test Methodology
• Required Equipment
• Test fixtures, DUT control, etc.

Who should attend? Electrical validation and test engineers responsible for making sure their company’s or client’s designs are compliant the USB 3.2 Compliance Test Specification (CTS).

What attendees will learn? The latest status of USB 3.2 electrical compliance tools and the USB-IF test program.

Presenter: Mike Engbretson, Product Marketing Manager

EMC Live: Automotive 

Automotive electronics developments have impacted automotive EMC testing by exposing higher frequency RF technologies to the lab. AR is making this easier for the lab and Test Engineering by bringing state-of-the-art shielding capabilities to their product line-up by joining forces with Comtest, a leader in shielding technologies and RF absorber techniques. In addition to being a technology leader, AR is now a full-service EMC solution provider. We will discuss how AR chambers use the latest in RF technologies to make testing repeatable, reproducible, and safe from 10 kHz to above 40 GHz to support these new technologies in ways that legacy shielding could not. 

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Can't attend live? Register anyway and you will receive an email with the recording and slides after the live event.

Time: 11 AM Pacific | 2 PM Eastern
Duration: 30 minutes

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.  Click here to access the entire series.

Part 9: How Do I Make a Differential Measurement on an Oscilloscope Using Passive Probes?

Is a differential probe the only way or the best way to make a differential voltage measurement on an oscilloscope? Could two passive probes be used to make a differential voltage measurement?

In this coffee break webinar, we explain how a differential voltage probe works and how two passive probes can be used to make the same type of measurement on an oscilloscope. We’ll also describe the advantages and disadvantages of both approaches to measuring a differential signal on an oscilloscope.

Topics to be covered in this webinar:

How to Become an Expert in Power Integrity Testing Webinar Series

Power Distribution Networks (PDNs) require careful design to ensure excellent power integrity, especially in high-speed designs. This 8-part series walks you through the fundamentals to advanced topics with a large number of live demonstrations.

SI/PI Measurements on a Budget

In this session (Part 4), we will show you how you get the most out of your oscilloscope for power integrity measurements without spending a lot of money, including the right way you can do five common SI and PI measurements with a budget scope and some simple probes you probably already have around your lab. We’ll also show some of the common artifacts to avoid so you can get meaningful measurements.

Topics to be covered in this webinar:

• Calculating the approximate bandwidth needs for your oscilloscope
• Measuring a power rail with a 10x probe
• Measuring a low impedance power rail with a build-it-yourself power rail probe
• Measuring the source of near field pick up
• Using spectral analysis to analyze the root cause of noise pick up.

Who should attend? Hardware design and validation engineers and technicians interested in how to best leverage low-cost probes and techniques to measure power integrity well.

When designing a functional electronic test system, how signal switching is implemented in your test strategy can affect accuracy and repeatability. In this webinar we give an overview of the three most popular platforms used for switching today, explain the advantages of each of the various switching applications, and provide some basic questions to ask as you integrate any electronic test system.

A few of the takeaways are:

Time: 11 AM Pacific | 2 PM Eastern
Duration: 30 minutes

Oscilloscope Coffee Break Webinar Series

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.  Click here to access the entire series.

Part 10: How Do I Rescale a Sensor to Use With an Oscilloscope?

Sensors are commonly used in automotive, motor, and other applications to measure rotational speed, shaft angle or position, torque, pressure, wheel speed, crankshaft speed, oxygen levels, anti-lock braking system (abs) parameters, temperature, magnetic or electrical fields (Teslas, Webers, Siemen, Volt/meter, etc.) and many others.

In this coffee break webinar, we will describe various techniques used to take sensor outputs and rescale them into appropriate and useful non-voltage scientific units, such as Pascals, Volt/meter, Webers, Newton-meter, revolution/minute (RPM), etc. for display as an easily understandable waveform on an oscilloscope.

Topics to be covered in this webinar: