Characterizing a MEMS switch for High-speed SerDes Interfaces 

In many test applications, high bandwidth signals must be switched between Tx and Rx devices while maintaining high isolation and without introducing stub effects or degrading the signal quality. A microelectromechanical system (MEMS) switch that is electrically transparent would be the ideal solution. 

Join Eric in this webinar as he electrically characterizes a Menlo Micro MEMS switch for use in PCIe, Ethernet, Fiber Optic Transceivers, USB, MIPI and other high-speed serial links up to 64 Gb/s, using a network analyzer. 

Topics to be covered in this webinar: 

• Topology of a MEMS switch 
• Fundamentals of network analyzer operation 
• Challenges of measuring S-parameters on small devices 
• S-parameter results 
• Interpreting S-parameter results for stated applications 

Who should attend? Test and measurement engineers implementing high-speed SerDes test on PCIe Gen5/6, Fiber Optic Transceivers, Ethernet, USB, MIPI etc. who have current or future needs for RF switching of these signals during testing. 

What attendees will learn: MEMS switch fundamentals and best measurement and analysis practices for VNA characterization of an RF switch and other components in high-speed SerDes interfaces. 

Presenters: Professor Eric Bogatin, University of Colorado, Boulder 

Click here to register.

Don't worry if you can't make it live! We'll record the webinar and send all registrants a link to watch it later at their convenience.