Webinar
GaN,
SiC
How to Perform Double Pulse Testing (DPT) on GaN and SiC Devices Webinar
Time: 10:00 CET
Join Teledyne LeCroy to see Double Pulse Testing performed on gallium nitride (GaN) and silicon carbide (SiC) power semiconductor devices. Learn more about various safety measures that need to be addressed before making measurements and what to infer from the captured waveforms.
Topics to be covered in this webinar:
- Double Pulse Test (DPT) basics
- Test instrumentation needs
- Safety issues and how to overcome them
- The importance of probe deskew
- How to calculate turn on/off delays, switching losses, etc.
Who should attend? Hardware engineers, systems engineers, production engineers, and technicians testing wide bandgap semiconductor devices
What attendees will learn? How to perform the double pulse test safely, and capture and characterize a GaN or SiC power semiconductor device’s dynamic response
Presented by: Gregor Hofferbert, Field Application Engineer, Teledyne LeCroy