In part 3, we’ll improve on our understanding of high voltage probing by using higher-speed signaling (consistent with GaN and SiC devices) and highlighting what can be expected from HV optical probes or other application-optimized probes. We’ll apply everything already learned in Parts 1 and 2, but add significant measurement challenges to the probes to further differentiate their performance capabilities and characteristics.

Topics to be covered in this webinar: 

• HV optical probe topologies – how are they constructed? 
• Performance tradeoffs of optical vs. electrical probes 
• Optimized probes for 60 V common-mode applications

Who should attend? Any engineer who is probing in any type of power conversion system with floating voltages above 12 V.

What will attendees learn? Attendees will gain a better understanding of how to identify a measurement problem caused by a poorly performing probe or a misapplied probe.

Presented by: Ken Johnson, Director of Marketing; Jon Shechter, Product Marketing Engineer; William Kaunds, Product Marketing Manager

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