Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided Temperatures range from -60°C to +300°C

DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug Full thermal range of -60°C to +300°C Reliable and repeatable contact Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology

Revolutionary technology advancement for wafer and die-level photonics probing Real-time in-situ calibrations Highest accuracy in test results Lowest coupling loss

Provides an effectively noise free environment around the device under test (DUT) World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)

The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.

Customized Solutions for a Variety of Challenging Applications We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.

Power bypass inductance: 8 nH Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil. Supports collinear and non-standard needle configurations

High-quality construction with low-noise electrical performance Kelvin version for convenient 4-point measurements Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip SSMC 50 connectors

Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C Guarantees fully-guarded measurements to fA and fF levels Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements

Multi-purpose SIGMA instrument integration kit Shorter cabling and universal chuck connection Triax probe with protected guard Triax design for low-leakage measurements up to 3 kV

Combined eye-pieces and CCD camera mount 3x zoom and quick lens exchange Engraved guides on mmW platen Supports broadband, load pull, coax RF and banded waveguide configuration

Infinity Probe: best for Al (Si) ACP Probe: best for AU (III-Vs) |Z| Probe: robust solution (long lifetime) RF chuck ±3 μm surface planarity