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FormFactor - Cascade ACP Probe – Coaxial Long-lasting, rugged RF and microwave on-wafer probes

FormFactor - Cascade ACP Probe – Coaxial Long-lasting, rugged RF and microwave on-wafer probes

Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material DC to 110 GHz models available in single and dual line versions...
FormFactor - Cascade ACP Probe – Cryo/Vacuum - Superior mechanical properties at cryogenic temperatures

FormFactor - Cascade ACP Probe – Cryo/Vacuum - Superior mechanical properties at cryogenic temperatures

Functional temperature range of -263 to +150°C Stainless steel tip material for thermal decoupling Coaxial cable with TCE matched inner and...
FormFactor - Cascade ACP-Q Probe - Multiple configurations for functional circuit testing

FormFactor - Cascade ACP-Q Probe - Multiple configurations for functional circuit testing

Combination of DC and RF in a single probe module: One dual probe or a maximum of three RF; a maximum of 9 DC standard (other quantities upon request). Utilizes...
FormFactor - Cascade Autonomous DC wafer probing featuring Contact Intelligence

FormFactor - Cascade Autonomous DC wafer probing featuring Contact Intelligence

Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system...
FormFactor - Cascade Autonomous RF wafer probing featuring Contact Intelligence

FormFactor - Cascade Autonomous RF wafer probing featuring Contact Intelligence

Ease of use –  Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full...
FormFactor - Cascade Autonomous Silicon Photonics wafer probing featuring Contact Intelligence

FormFactor - Cascade Autonomous Silicon Photonics wafer probing featuring Contact Intelligence

Revolutionary technology advancement for wafer and die-level photonics probing Highest accuracy in test results New innovative combination of...
FormFactor - Cascade Chucks - Non-thermal and thermal chucks

FormFactor - Cascade Chucks - Non-thermal and thermal chucks

Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided Temperatures range from -60°C to +300°C Up to 25% lower air...
FormFactor - Cascade CM300xi - 300 mm semi-/ fully-automated probe system

FormFactor - Cascade CM300xi - 300 mm semi-/ fully-automated probe system

DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug Full thermal range of -60°C to +300°C Reliable and...
FormFactor - Cascade CM300xi-SiPh - 300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant

FormFactor - Cascade CM300xi-SiPh - 300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant

Revolutionary technology advancement for wafer and die-level photonics probing Real-time in-situ calibrations Highest accuracy in test results...
FormFactor - Cascade CM300xi-ULN - 300 mm semi-/ fully-automated probe system for Ultra Low Noise measurements

FormFactor - Cascade CM300xi-ULN - 300 mm semi-/ fully-automated probe system for Ultra Low Noise measurements

Provides an effectively noise free environment around the device under test (DUT) World’s first probe station with integrated TestCell Power Management (a...
FormFactor - Cascade CSR Cal Substrates - Perfectly matched to the |Z| Probe®

FormFactor - Cascade CSR Cal Substrates - Perfectly matched to the |Z| Probe®

The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold,...
FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications

FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications

Customized Solutions for a Variety of Challenging Applications We are your partner for challenging applications. Our comprehensive technical and application know-how over all...
FormFactor - Cascade DC-Q Probe - Multi-contact DC probe with flat tip needles

FormFactor - Cascade DC-Q Probe - Multi-contact DC probe with flat tip needles

Power bypass inductance: 8 nH Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil...
FormFactor - Cascade DCP 100 Series Probe - Delivers superior guarding and shielding

FormFactor - Cascade DCP 100 Series Probe - Delivers superior guarding and shielding

High-quality construction with low-noise electrical performance Kelvin version for convenient 4-point measurements Replaceable coaxial probe tips...
FormFactor - Cascade DCP-HTR Series Probe - High-performance DC parametric probe

FormFactor - Cascade DCP-HTR Series Probe - High-performance DC parametric probe

Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C Guarantees fully-guarded measurements to fA and fF...
FormFactor - Cascade EPS150TESLA - 150 mm manual on-wafer power device characterization system

FormFactor - Cascade EPS150TESLA - 150 mm manual on-wafer power device characterization system

Multi-purpose SIGMA instrument integration kit Shorter cabling and universal chuck connection Triax probe with protected guard...
FormFactor - Cascade EPS200MMW - mmW probing up to THz and load-pull

FormFactor - Cascade EPS200MMW - mmW probing up to THz and load-pull

Combined eye-pieces and CCD camera mount 3x zoom and quick lens exchange Engraved guides on mmW platen Supports broadband, load...
FormFactor - Cascade EPS200RF - 200 mm manual probe system for RF test up to 67 GHz

FormFactor - Cascade EPS200RF - 200 mm manual probe system for RF test up to 67 GHz

Infinity Probe: best for Al (Si) ACP Probe: best for AU (III-Vs) |Z| Probe: robust solution (long lifetime) RF chuck ±3...
FormFactor - Cascade eVue Microscope - Digital imaging system

FormFactor - Cascade eVue Microscope - Digital imaging system

Quick and easy probe tip navigation Z drive can work in the same range as the chuck Enables higher separation gap while the DUT stays in focus...
FormFactor - Cascade Eye-Pass Probe - Durable multi-contact wafer probe with controlled impedance power bypass technology

FormFactor - Cascade Eye-Pass Probe - Durable multi-contact wafer probe with controlled impedance power bypass technology

High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz RF bandwidth to 500 MHz Long probe life: > 250...
FormFactor - Cascade FPC Probe - Rugged, deep reach RF probing for modules and circuit boards

FormFactor - Cascade FPC Probe - Rugged, deep reach RF probing for modules and circuit boards

DC-40 GHz bandwidth 10 ps rise time Low insertion and return loss 2 mils of tip-to-tip compliance...
FormFactor - Cascade Genius Education Kits - Turn-key S-parameter probe station for RF and microwave test

FormFactor - Cascade Genius Education Kits - Turn-key S-parameter probe station for RF and microwave test

Probe station Keysight Streamline Vector Network Analyzer (option up to 53 GHz) Choice of probes Known measurement accuracy...
FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads

FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads

Enables wafer probing up to 100 A pulsed and 10A DC Innovative multi-fingertip design provides even distribution of current Supports up to 500 V...
FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V

FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V

Coaxial and triaxial measurements up to 10,000 V High-quality construction with low-noise electrical performance Replaceable probe tips in a...
FormFactor - Cascade Impedance Standard Substrates for ACP, Infinity, and FPC Probes

FormFactor - Cascade Impedance Standard Substrates for ACP, Infinity, and FPC Probes

Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector...
FormFactor - Cascade IMS-K-DC - Integrated system with Keysight SPA for DC parametric measurements

FormFactor - Cascade IMS-K-DC - Integrated system with Keysight SPA for DC parametric measurements

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements  
FormFactor - Cascade IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements

FormFactor - Cascade IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements  
FormFactor - Cascade IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz

FormFactor - Cascade IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz  
FormFactor - Cascade IMS-K-Power - Integrated system with Keysight PDA for power semiconductor device characterization

FormFactor - Cascade IMS-K-Power - Integrated system with Keysight PDA for power semiconductor device characterization

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements  
FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software

FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight Photonics Application    

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