Product Finder
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 FormFactor - Cascade ACP Probe – Coaxial Long-lasting, rugged RF and microwave on-wafer probes
Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material
DC to 110 GHz models available in single and dual line versions... |
 FormFactor - Cascade ACP Probe – Cryo/Vacuum - Superior mechanical properties at cryogenic temperatures
Functional temperature range of -263 to +150°C
Stainless steel tip material for thermal decoupling
Coaxial cable with TCE matched inner and... |
 FormFactor - Cascade ACP-Q Probe - Multiple configurations for functional circuit testing
Combination of DC and RF in a single probe module: One dual probe or a maximum of three RF; a maximum of 9 DC standard (other quantities upon request).
Utilizes... |
 FormFactor - Cascade Autonomous DC wafer probing featuring Contact Intelligence
Ease of use – Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system... |
 FormFactor - Cascade Autonomous RF wafer probing featuring Contact Intelligence
Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full... |
 FormFactor - Cascade Autonomous Silicon Photonics wafer probing featuring Contact Intelligence
Revolutionary technology advancement for wafer and die-level photonics probing
Highest accuracy in test results
New innovative combination of... |
 FormFactor - Cascade Chucks - Non-thermal and thermal chucks
Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided
Temperatures range from -60°C to +300°C
Up to 25% lower air... |
 FormFactor - Cascade CM300xi - 300 mm semi-/ fully-automated probe system
DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
Full thermal range of -60°C to +300°C
Reliable and... |
 FormFactor - Cascade CM300xi-SiPh - 300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant
Revolutionary technology advancement for wafer and die-level photonics probing
Real-time in-situ calibrations
Highest accuracy in test results... |
 FormFactor - Cascade CM300xi-ULN - 300 mm semi-/ fully-automated probe system for Ultra Low Noise measurements
Provides an effectively noise free environment around the device under test (DUT)
World’s first probe station with integrated TestCell Power Management (a... |
 FormFactor - Cascade CSR Cal Substrates - Perfectly matched to the |Z| Probe®
The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold,... |
 FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all... |
 FormFactor - Cascade DC-Q Probe - Multi-contact DC probe with flat tip needles
Power bypass inductance: 8 nH
Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil... |
 FormFactor - Cascade DCP 100 Series Probe - Delivers superior guarding and shielding
High-quality construction with low-noise electrical performance
Kelvin version for convenient 4-point measurements
Replaceable coaxial probe tips... |
 FormFactor - Cascade DCP-HTR Series Probe - High-performance DC parametric probe
Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
Guarantees fully-guarded measurements to fA and fF... |
 FormFactor - Cascade EPS150TESLA - 150 mm manual on-wafer power device characterization system
Multi-purpose SIGMA instrument integration kit
Shorter cabling and universal chuck connection
Triax probe with protected guard... |
 FormFactor - Cascade EPS200MMW - mmW probing up to THz and load-pull
Combined eye-pieces and CCD camera mount
3x zoom and quick lens exchange
Engraved guides on mmW platen
Supports broadband, load... |
 FormFactor - Cascade EPS200RF - 200 mm manual probe system for RF test up to 67 GHz
Infinity Probe: best for Al (Si)
ACP Probe: best for AU (III-Vs)
|Z| Probe: robust solution (long lifetime)
RF chuck ±3... |
 FormFactor - Cascade eVue Microscope - Digital imaging system
Quick and easy probe tip navigation
Z drive can work in the same range as the chuck
Enables higher separation gap while the DUT stays in focus... |
 FormFactor - Cascade Eye-Pass Probe - Durable multi-contact wafer probe with controlled impedance power bypass technology
High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
RF bandwidth to 500 MHz
Long probe life: > 250... |
 FormFactor - Cascade FPC Probe - Rugged, deep reach RF probing for modules and circuit boards
DC-40 GHz bandwidth
10 ps rise time
Low insertion and return loss
2 mils of tip-to-tip compliance... |
 FormFactor - Cascade Genius Education Kits - Turn-key S-parameter probe station for RF and microwave test
Probe station
Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
Choice of probes
Known measurement accuracy... |
 FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
Enables wafer probing up to 100 A pulsed and 10A DC
Innovative multi-fingertip design provides even distribution of current
Supports up to 500 V... |
 FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V
Coaxial and triaxial measurements up to 10,000 V
High-quality construction with low-noise electrical performance
Replaceable probe tips in a... |
 FormFactor - Cascade Impedance Standard Substrates for ACP, Infinity, and FPC Probes
Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector... |
 FormFactor - Cascade IMS-K-DC - Integrated system with Keysight SPA for DC parametric measurements
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
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 FormFactor - Cascade IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements
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 FormFactor - Cascade IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz
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 FormFactor - Cascade IMS-K-Power - Integrated system with Keysight PDA for power semiconductor device characterization
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements
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 FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight Photonics Application
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