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150 MHz, 2 analog channels
8 synchronized digital channels (T3AWG2152-D only)
16-bit vertical resolution
128 MPts @Ch waveform memory
Max sampling rate of 600 MS/s
Available in 250 MHz and 350 MHz models
2, 4 and 8 channel modes
16-bit vertical resolution
Max Sampling rate of 1.2 GS/s
Max sinewave frequency of 250 MHz and 350 MHz respectively
Four operating modes: – CC, CV, CR, CP
Static, Dynamic and Sequence mode support
Built in Application Functions - Short Circuit Test, Battery Test Mode, CR-LED Mode, OCP and OPP Test
Provides a load of up to 300 Watts
Programmable and analog external control
All Digital IF technology
10.1” WVGA (1024 x 600) Display
Frequency range from 9 KHz up to 3.2 GHz
-161 dBm/Hz Displayed Average Noise Level (Typ)
-98 dBc/Hz @ 10 khz Offset Phase Noise (Typ)
Total Amplitude Accuracy < 0.7 dB
1 Hz Minimum Resolution Bandwidth (RBW)
Comes with Preamplifier
True Differential TDR with <3mm Spatial Resolution
Small Form Factor and Battery Powered
S Parameters up to 15 GHz
35 ps Rise Time
Up to 50,000 points long memory
Emerging Serial Data Standards Testing
Vector Network Analyzer Frequency Range from 10 MHz up to 3.2 GHz
Spectrum Analyzer Frequency Range from 9 kHz up to 3.2 GHz
-156 dBm/Hz Displayed Average Noise Level (Typ.)
-98 dBc/Hz @10 kHz Offset Phase Noise (1 GHz, Typ.)
Total Amplitude Accuracy < 1.2 dB
1 Hz Minimum Resolution Bandwidth (RBW)
All-Digital IF Technology
Standard Preamplifier
Distance to fault capability using VNA time domain analysis
Up to 1.5 GHz Tracking Generator Kit
Built-in Advanced Measurement capability (CHP, ACPR, OBW, CNR, TOI, etc)
10.1 lnch WVGA (1024 x 600) Display
Allows TekProbe interface level II probes to work with any ProBus-equipped Teledyne LeCroy oscilloscope
Automatic probe detection
Provides all necessary power and offset control to the attached probe
Supports probes up to 4 GHz
Easy firmware updates
Wide variety of probes supported including: Preamplifiers, Current Probes, Single-Ended Active Probes and Differential Active Probes
Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 1kOhm), the input impedance of these probes remains nearly constant over their entire frequency range.
Choice of 4 GHz or 6 GHz bandwidth models
Up to 5 Vpk-pk dynamic range with low noise
±3 V offset range
Low loading and high impedance for minimal signal disturbance
Ideal for DDR2, DDR3, LPDDR2
Deluxe soft carrying case
Innovative QuickLink architecture
Wide variety of tips and leads
Solder-In Lead
Optional Positioner (Browser) Tip
Quick Connect Lead
Square Pin Lead
HiTemp Solder-In Lead
Up to 20 GHz bandwidth and 80 GS/s sample rate
The most advanced oscilloscope user interface
The industry’s only true hardware 14.1 Gb/s serial trigger
Low Jitter Measurement Floor and exceptional timebase stability
Comprehensive set of serial data analysis, debug, validation and compliance tools
Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility
Integrated standard and custom measurements and math functions for unrivaled analysis capability
Multi-lane serial data eye, jitter and crosstalk analysis
Real-time de-embedding, emulation, and equalization
HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s
Up to 5 Gpts of acquisition memory enables detailed viewing of long events
15.6" 1900 x 1080 Full HD capacitive touchscreen
S-parameters DC to 40 GHz, single-ended and mixed-mode
Impedance Profile with <1 mm resolution, differential and common-mode
Internal, automatic OSLT calibration
USB-connected, small, lightweight
Flexible display of the measurements
Remove effects from fixtures, connectors and cables
Emulate eye diagrams with CTLE, DFE and FFE equalization
Advanced jitter analysis