Teledyne LeCroy - T3VNA Vector Network Analyzers
- Vector Network Analyzer Frequency Range from 10 MHz up to 3.2 GHz
- Spectrum Analyzer Frequency Range from 9 kHz up to 3.2 GHz
- -156 dBm/Hz Displayed Average Noise Level (Typ.)
- -98 dBc/Hz @10 kHz Offset Phase Noise (1 GHz, Typ.)
- Total Amplitude Accuracy < 1.2 dB
- 1 Hz Minimum Resolution Bandwidth (RBW)
- All-Digital IF Technology
- Standard Preamplifier
- Distance to fault capability using VNA time domain analysis
- Up to 1.5 GHz Tracking Generator Kit
- Built-in Advanced Measurement capability (CHP, ACPR, OBW, CNR, TOI, etc)
- 10.1 lnch WVGA (1024 x 600) Display
The Teledyne Test Tools range of T3VNA Vector Network Analyzer has a Vector Network Analysis frequency range of 100 kHz up to 3.2 GHz and a Spectrum Analysis frequency range from 9 kHz up to a maximum of 3.2 GHz. The small footprint and easy user interface is augmented by a high performance specification with many advanced measurement functions and capabilities.
Teledyne Test Tools T3VNA family of Vector Network Analyzers consists of models with various Vector Network Analysis frequency ranges from as low as 100 kHz up to 3.2 GHz and Spectrum Analysis frequency range from 9 kHz up to 3.2 GHz depending on model.
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Vector Network Analyzer 9KHz-3.2GHz. Includes Adv Meas Kit, Distance To Fault Opt, Cal and Utl Kits Limited Availability |
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More Product Information
- Supports PCI Express Rev 2.0 x4 or higher, backwards compatible with PCIe Rev 1.10 slots
- Up to 512MB of high-speed image memory
- Single slot solution with reconfigurable camera control and general purpose input/outputs
- True Differential and Calibrated TDR for Maximum Impedance Measurement Accuracy
- Compact, Battery-Powered Design for true portability
- 30 ps Typical Rise Time, S-Parameter support up to 15 GHz
- 50,000-point memory for DUTs up to 50 meters (XR models)
- Automatic Ohmic Loss Compensation for enhanced accuracy
- Built-in Skew Analysis (Inter-Pair and Intra-Pair) for differential signal integrity
- XR Series: Engineered for Speed, Optimized for Continuous Cable Production
The ZS Series probes provide high impedance and an extensive set of probe tips and ground accessories to handle a wide range of probing scenarios. The high 1 MΩ input resistance and low 0.9 pF input capacitance means this probe is ideal for all frequencies. The ZS Series probes provide full system bandwidth with all Teledyne LeCroy oscilloscopes with bandwidths of 4 GHz and lower.
AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.
Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.
From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.
Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.
- Industry’s latest CMOS image sensors
- Simplified set-up with field proven Sapera LT software featuring CamExpert
- Engineered to accommodate industrial environment with a ruggedized screw mount SDR connectors
- GenICan GenCP compliant
- 1 MHz max line rate
- 65dB dynamic range
- Onchip 2x binning
- Mono/HDR/HFW
- Multi-arrays TDI
- Dual CLHS CX4 AOC output
- Reduced dark noise levels and improved dark offset
- Improved sensitivity, including NIR response
- In-camera image pre-processing (lens shading correction, pixel correction)
- Large full well when using in-sensor binning >142Ke
- Thousands of frames per second in Partial Scan Mode (ROI)
- Multi-ROI support (up to 32 ROI) and Cycling Mode
- Advanced Sequencer functions of different features
- Up to 65 GHz
- Up to 80 Channels @ 36 GHz
- Up to 160 GS/s
- Up to 512 Mpts/Ch
- 50 fs rms Sample Clock (Intrinsic) Jitter
- Jitter Between All Channels of <130 fs rms
- S-parameters DC to 40 GHz, single-ended and mixed-mode
- Impedance Profile with <1 mm resolution, differential and common-mode
- Internal, automatic OSLT calibration
- USB-connected, small, lightweight
- Flexible display of the measurements
- Remove effects from fixtures, connectors and cables
- Emulate eye diagrams with CTLE, DFE and FFE equalization
- Advanced jitter analysis
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12bit MSO's 40 Mhz to 100 GHz, Probes, Series Network & Logic Analyzers
