Teledyne LeCroy - Differential Probes (<= 1.5 GHz)
Differential active probes are like two probes in one. Instead of measuring a test point in relation to a ground point (like single-ended active probes), differential probes measure the difference in voltage of a test point in relation to another test point
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Differential Probes (<= 1.5 GHz) |
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500 MHz Differential Probe |
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1 GHz, 1.0 pF Active Differential Probe, ±8 V |
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1.5 GHz, 1.0 pF Active Differential Probe, ±8 V |
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200 MHz, 3.5 pF, 1 MOhm Active Differential Probe, ±20 V Limited Availability |
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500 MHz, 1.0 pF Active Differential Probe, ±8 V |
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More Product Information
The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications
- 150 MHz, 2 analog channels
- 8 synchronized digital channels (T3AWG2152-D only)
- 16-bit vertical resolution
- 128 MPts @Ch waveform memory
- Max sampling rate of 600 MS/s
Linea line scan cameras deliver the performance and features usually found in high-end cameras at an attractive price point. Based on advanced CMOS line scan technology, Linea GigE cameras have a 2k or 4k single line 7.04 µm x 7.04 µm pixel array. With excellent sensitivity and speed, Linea surpasses the requirements of demanding applications —such as materials grading and inspection, transportation safety, and general purpose machine vision.
- Up to 96 differential channels per full rack mainframe
- Constantly monitor input signals for fault conditions
- Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
- Inputs can be masked, inverted, and combined to produce interrupts
- Can be used as a time stamp module and as a digital I/O
- Programmable debounce circuitry prevents erroneous readings
- 10 V and 100 V input ranges
- On-board memory stores events with IEEE 1588 timestamps
- Synchronize reading of input states with other scanned analog channels
- 1 MHz max line rate
- 65dB dynamic range
- Onchip 2x binning
- Mono/HDR/HFW
- Multi-arrays TDI
- Dual CLHS CX4 AOC output
- All Digital IF technology
- 10.1” WVGA (1024 x 600) Display
- Frequency range from 9 KHz up to 3.2 GHz
- -161 dBm/Hz Displayed Average Noise Level (Typ)
- -98 dBc/Hz @ 10 khz Offset Phase Noise (Typ)
- Total Amplitude Accuracy < 0.7 dB
- 1 Hz Minimum Resolution Bandwidth (RBW)
- Comes with Preamplifier
- S-parameters DC to 40 GHz, single-ended and mixed-mode
- Impedance Profile with <1 mm resolution, differential and common-mode
- Internal, automatic OSLT calibration
- USB-connected, small, lightweight
- Flexible display of the measurements
- Remove effects from fixtures, connectors and cables
- Emulate eye diagrams with CTLE, DFE and FFE equalization
- Advanced jitter analysis
- 8 frequency counter channels, 16 isolated digital I/O channels, 2 isolated DAC channels in a single card
- Single frequency measurement range that works from 0.05 Hz to 1 MHz
- Very stable TCXO base clock, 50 MHz ±1 ppm
- 195 kΩ Input impedance with selectable coupling (AC/DC)
- Wide differential input voltage range (±48 V) with up to 250 V working common mode voltage
- Programmable threshold and hysteresis levels with 1 mV resolution
- Support for quadrature encoder
- Isolated DIO channels with up to 60 V compliance
- Isolated and independent 16-bit DAC channels, configurable for voltage or current output
- 10 GigE Ethernet port & hardware
- Industry’s smallest 67M 10GigE Vision camera
- Simplified set-up with field proven Sapera LT software featuring CamExpert
- Engineered to accommodate industrial environment with a ruggedized screw mount RJ-45 connector
Teledyne LeCroy
Teledyne LeCroy is a leading provider of oscilloscopes, protocol analyzers and related test and measurement solutions that enable companies across a wide range of industries to design and test electronic devices of all types. Since our founding in 1964, we have focused on creating products that improve productivity by helping engineers resolve design issues faster and more effectively.
Oscilloscopes are tools used by designers and engineers to measure and analyze complex electronic signals in order to develop high-performance systems and to validate electronic designs in order to improve time to market. Protocol analyzers are tools used by designers and engineers to generate and monitor traffic over high speed serial data interfaces, including DDR, PCI Express, Fibre Channel, Serial ATA, SAS, USB and others. Both products are critical in the development of a wide variety of demanding design applications.
We utilize both of these important product areas in combination to tackle the most demanding serial data test applications, offering tailored solutions to help our customers perfect their chips, interfaces, subsystems and products which utilize these important communications standards. With the explosion in the use of serial data communications technologies in semiconductors, between devices on circuit boards and between computers and peripherals, we are aimed at a growing and important market.
Our oscilloscopes offer a powerful combination of large and informative displays combined with advanced waveshape analysis capabilities typically tailored to enhance the productivity of engineers in specific applications areas such as serial data test, disk drive test and automotive bus analysis.
Headquartered in Chestnut Ridge, New York, LeCroy has sales, service and development subsidiaries in the US and throughout Europe and Asia. LeCroy products are employed across a wide variety of industries, including semiconductor, computer, consumer electronics, military/aerospace, automotive/industrial, and telecommunications.
Contact Details
Headquarters Teledyne LeCroy
700 Chestnut Ridge Road, Chestnut Ridge, NY 10977-6499, USA
Phone: 800-553-2769 or 845-425-2000
Phone Support: 1-800-553-2769
Fax Sales: 845-578-5985
Email Sales: contact.corp@teledynelecroy.com
Email Support: support@teledynelecroy.com (Oscilloscopes, Waveform Generators, Signal Integrity)
Test & Measurement
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