Probes
Products
![FormFactor - Cascade InfinityXT Probe - Next-generation, high-frequency performance with advanced features FormFactor - Cascade InfinityXT Probe - Next-generation, high-frequency performance with advanced features](/sites/default/files/styles/max_650x650/public/infinityxt-wafer-probe-product-alt-view.png?itok=Bc4y2BdU)
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Continues the Infinity family’s Industry leading electrical performance
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High temperature capability (175° C +) for automotive device characterization and other applications
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Better tip visibility for enhanced placement accuracy and repeatability
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Improved tip life/durability with solid rhodium contacts
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New tip architecture enables support for narrower pitches (e.g. 25um)
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Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness
![FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization](/sites/default/files/styles/max_650x650/public/probe-lwp.png?itok=_Kc6NnKO)
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
![FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe](/sites/default/files/styles/max_650x650/public/probe-multi-z.jpg?itok=jlk9XMU7)
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Ideal for multiport RF/Microwave and high-speed digital signal testing
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Mix DC and RF/Microwave signals on one probe
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Long lifetime – typically over one million (1,000,000) touchdowns
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Excellent performance in temperatures ranging from 10 K to 200°C
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Probe on any pad material with no damage
![FormFactor - Cascade Multiline TRL Cal Substrates - Multiline TRL substrates for T-Wave probes FormFactor - Cascade Multiline TRL Cal Substrates - Multiline TRL substrates for T-Wave probes](/sites/default/files/styles/max_650x650/public/calibration-mtrl.jpg?itok=LeyiDEG_)
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Substrate material: High-resistivity silicon
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Substrate thickness: 275 µm
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Dielectric constant: 11.8
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Nominal Z0: 50 Ω
![FormFactor - Cascade QuadCard™ - Cost-effective, versatile probe card solution FormFactor - Cascade QuadCard™ - Cost-effective, versatile probe card solution](/sites/default/files/styles/max_650x650/public/quad-card.jpg?itok=hNE4CWzL)
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Accommodates a combination of up to four Cascade Microtech probes
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Configurable for mixed-signal RF/mmW testing
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Quick and easy repairs to be performed in the field, by simply replacing individual probes
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Adaptable to new device layouts by exchanging individual probes
![FormFactor - Cascade Resistive Matching and Termination - Custom configured for your application FormFactor - Cascade Resistive Matching and Termination - Custom configured for your application](/sites/default/files/styles/max_650x650/public/probes-inf-acp-fpc-collage.png?itok=BR_vwmiV)
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Can help to stabilize oscillations in high-gain devices
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Impedance match to low dynamic resistance laser diodes
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Custom configured for your application
![FormFactor - Cascade T-Wave Probe - Wafer-level electrical measurement of mmW devices and materials up to 1.1 THz FormFactor - Cascade T-Wave Probe - Wafer-level electrical measurement of mmW devices and materials up to 1.1 THz](/sites/default/files/styles/max_650x650/public/t-wave-probe-collage.jpg?itok=FHlEL3m2)
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Low insertion loss
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Low contact resistance
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Lithographically defined probe tip
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Nickel contacts
See more Key Features on Specifications & Details tab
![FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test](/sites/default/files/styles/max_650x650/public/probe-uhp.png?itok=BxLsz4yo)
FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test
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Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
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Even distribution of high current with innovative multi-fingertip design
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Compatible with TESLA 200/300 mm power device characterization system
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Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
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Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
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Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)
![FormFactor - Cascade Unity Probe - Multicontact probe for RFIC engineering test FormFactor - Cascade Unity Probe - Multicontact probe for RFIC engineering test](/sites/default/files/styles/max_650x650/public/probe-unity.jpg?itok=WSBmi96Q)
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Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
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Online design configuration tool helps you to specify your probe in minutes
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All designs are fully quadrant compatible
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Full solution includes probes, calibration substrates, stations, accessories and software
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Scalable architecture for future needs