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Bias tees with a perfect balance of RF performance and DC power handling Auriga’s Bias Tees balance impressive RF performance with heavy-duty power handling across multiple frequency bands ranging from 100 MHz to 67 GHz. They are designed for rigorous usage without sacrificing RF performance. Only the highest-quality materials are used to minimize signal loss and enable efficient heat removal.
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
Non-linear measurement data is often used to create a behavioral model for high frequency components. Formulations of these models have been defined in terms of traveling waves, with a desire to represent nonlinear behavior of high frequency transistors through a direct extension from linear s-parameters.
The Focus Compact Model (FCM) utility is a streamlined software package designed to be used with Focus’ AURIGA high-end Pulsed-IV system, that is used to generate Compact Models for transistors from their Pulsed-IV and wideband pulsed s-parameter data. 
The low frequency tuners are a unique product technology using MPT algorithms for low frequency wideband tuning. Three or more cascaded tuning sections use series transmission cables and parallel rotary capacitors. The length of the cables and number of tuning sections are optimized for maximum tuning range over a given bandwidth. HLFT tuners use 6 tuning sections allowing second harmonic frequency tuning.
Focus offers a complete range of manual tuners. The MMT series use the same RF technology and precision as a comparable automatic tuner. They are available in octave and multi-octave bands between 400 MHz and 18 GHz and provide high VSWR at DUT reference plane with a high reliability.
High power capability: +/- 200V, 17A. Minimum pulse width: 200ns. Modular design which enables multiple configurations.
Noise measurements allow the determination of the four Noise Parameters of a device (transistor). Focus’ Noise Modules integrate well with various third party noise receivers.
Noise measurements allow the determination of the four Noise Parameters of a device (transistor).  There are four Noise Parameters which fully describe the noise behaviour of an active or passive device at a given frequency.
Focus Microwaves’ DELTA series of electro-mechanical tuners is designed specifically for high frequency on wafer measurements. The tuner’s low profile allows it to be placed within the wafer perimeter and allows for a direct connection between the probe tip and the tuner, eliminating all possible insertion loss between the DUT and the tuner. This revolutionary new tuner design enables the engineer to achieve optimum tuning range, with a tuner whose footprint and weight has been dramatically reduced.
Supports the latest 5G FR1 and IEEE 802.11ax standards up to 1GHz active load pull bandwidth capability Test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax
Focus’ modular microstrip, high power and ultra low loss coaxial  RF Test Fixtures are designed mainly for load pull testing of packaged transistors. All Focus test fixtures come with TRL calibration standards and support most transistor packages sized from less than 0.1″ and up to 1″.