Teledyne LeCroy - Probe Adapters
Probe adapters provide simple and easy interface of third-party probes as well as change between the different Teledyne LeCroy Oscilloscope input and cable types (ProBus, ProLink, K/2.92 mm, BNC and SMA). Depending on the adapters, changing between the Teledyne LeCroy Oscilloscope's input type may have an effect on the overall performance of the channel.
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TekProbe to ProBus Probe Adapter |
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ProLink to 2.92mm Adapter with Probe Power and Communication Pass Through |
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ProLink to 2.92mm ProAxial Adapter with Probe Power and Communication Pass Through |
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2.92mm to ProBus Adapter with Probe Power and Communication Pass Through |
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2.92mm to ProLink Adapter with Probe Power and Communication Pass Through |
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More Product Information
- True Differential and Calibrated TDR for Maximum Impedance Measurement Accuracy
- Compact, Battery-Powered Design for true portability
- 30 ps Typical Rise Time, S-Parameter support up to 15 GHz
- 50,000-point memory for DUTs up to 50 meters (XR models)
- Automatic Ohmic Loss Compensation for enhanced accuracy
- Built-in Skew Analysis (Inter-Pair and Intra-Pair) for differential signal integrity
- XR Series: Engineered for Speed, Optimized for Continuous Cable Production
Floating Action Buttons
- Easy and fast setup of camera views
- Go to Light and Image Settings of the selected camera view with only one mouse click
Workflow Wizard
- Guided workflows for wafer setups, alignment tools and Autonomous Assistants
- Workflow wizard shows task-relevant settings and options only
- Wizard settings can be corrected anytime – no need to restart the wizard
- Wizard helps with intelligent solutions in case of error
See "Specifications & Details" tab for more key features
- 500 MHz - 4 GHz bandwidths
- Up to 40 GS/s sample rate
- 15.4” capacitive touch screen
- MAUI with OneTouch
- Powerful, Deep Toolbox
- Exceptional Serial Data Tools
- 16 digital channels with 1.25 GS/s
- Huge Applied Offset Range
- Optional Application Packages
Environmental Control
- Wafer temp verified <4.5 K (with 44 RF probes in contact)
- Magnetic field suppression to <200 nT
- Highly uniform wafer temperature
- Precise thermal stability and control
- Solid construction with granite base enables precision motion and vibration control
See "Specifications & Details" tab for more key features
- Probe loss is 3 dB typical between 140 and 200 GHz, S11/S22 15 dB typical
- Reduced unwanted couplings and transmission modes
- Able to shrink pad geometries to 25 x 35 µm (best case)
- Typical contact resistance < 0.05 Ω on Al, < 0.02 Ω on Au
- WR15, WR12, WR10, WR8, WR6, WR4, WR3, and WR2 bands available.
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Teledyne e2v Sapphire CMOS sensor
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Switchable shutter modes
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Power over Ethernet
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60 fps at full resolution
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Monochrome (G-192B) and color (G-192C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
The LSProbe 1.2 Variant E Field Probe is a high-speed, high-accuracy, and high-dynamic range electric-Field probe.
- Its standard frequency range of 10 kHz – 8.2 GHz. 1,000 V/m
- Best-in-class compensation of linearity, frequency, and temperature guarantees accurate measurements from less than 0.1 to at least 1,000 V/m.
- A dynamic range of 100 dB is achieved for many frequencies, enabling Field measurements at more than 10,000 V/m.
- Customized high Field-strength „X“-variants, supporting up to 30,000 V/m and a damage level of 100,000 V/m, are available upon request.
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
Superior Mechanics
- Highly stable granite base
- Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges
- 1 µm repeatable separation stroke
- Excellent measurement accuracy and repeatability
- Fast navigation and high-precision probe positioning
See "Specifications & Details" tab for more key features
Teledyne LeCroy
Teledyne LeCroy is a leading provider of oscilloscopes, protocol analyzers and related test and measurement solutions that enable companies across a wide range of industries to design and test electronic devices of all types. Since our founding in 1964, we have focused on creating products that improve productivity by helping engineers resolve design issues faster and more effectively.
Oscilloscopes are tools used by designers and engineers to measure and analyze complex electronic signals in order to develop high-performance systems and to validate electronic designs in order to improve time to market. Protocol analyzers are tools used by designers and engineers to generate and monitor traffic over high speed serial data interfaces, including DDR, PCI Express, Fibre Channel, Serial ATA, SAS, USB and others. Both products are critical in the development of a wide variety of demanding design applications.
We utilize both of these important product areas in combination to tackle the most demanding serial data test applications, offering tailored solutions to help our customers perfect their chips, interfaces, subsystems and products which utilize these important communications standards. With the explosion in the use of serial data communications technologies in semiconductors, between devices on circuit boards and between computers and peripherals, we are aimed at a growing and important market.
Our oscilloscopes offer a powerful combination of large and informative displays combined with advanced waveshape analysis capabilities typically tailored to enhance the productivity of engineers in specific applications areas such as serial data test, disk drive test and automotive bus analysis.
Headquartered in Chestnut Ridge, New York, LeCroy has sales, service and development subsidiaries in the US and throughout Europe and Asia. LeCroy products are employed across a wide variety of industries, including semiconductor, computer, consumer electronics, military/aerospace, automotive/industrial, and telecommunications.
Contact Details
Headquarters Teledyne LeCroy
700 Chestnut Ridge Road, Chestnut Ridge, NY 10977-6499, USA
Phone: 800-553-2769 or 845-425-2000
Phone Support: 1-800-553-2769
Fax Sales: 845-578-5985
Email Sales: contact.corp@teledynelecroy.com
Email Support: support@teledynelecroy.com (Oscilloscopes, Waveform Generators, Signal Integrity)
Test & Measurement
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