Teledyne LeCroy - Probe Adapters
Probe adapters provide simple and easy interface of third-party probes as well as change between the different Teledyne LeCroy Oscilloscope input and cable types (ProBus, ProLink, K/2.92 mm, BNC and SMA). Depending on the adapters, changing between the Teledyne LeCroy Oscilloscope's input type may have an effect on the overall performance of the channel.
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Probe Adapters |
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TekProbe to ProBus Probe Adapter |
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ProLink to 2.92mm Adapter with Probe Power and Communication Pass Through |
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ProLink to 2.92mm ProAxial Adapter with Probe Power and Communication Pass Through |
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2.92mm to ProBus Adapter with Probe Power and Communication Pass Through |
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2.92mm to ProLink Adapter with Probe Power and Communication Pass Through |
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More Product Information
- High signal fidelity to 4 GHz bandwidth
- Low circuit loading – High input impedance and low capacitance
- 4 GHz, 2.5 GHz, 1.5 GHz and 1 GHz models
- 1 MΩ input resistance
- 0.6 pF (4 GHz) and 0.9 pF input capacitance
- ± 8 V input dynamic range, ± 12 V offset range
- Wide variety of tips and grounds
- Easy to use, integrated with oscilloscope
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Advanced MicroVac chuck surface for minimum contact resistance between wafer and chuck
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Safety-rated interlock system for high-power testing (meets EN 60947-5-1, EN 60204-1)
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Supports fully automated testing up to 10kV by eliminating arcing point
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Full wafer access via locking roll-out stage
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On-wafer power device characterization up to 10,000 V DC / 600 A
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Coaxial, triaxial, and pin jack feed-troughs available
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Convenient instrument connection kits
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Load/unload wafer to hot/cold chuck (-60° C to +300° C)
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Up to 15% faster transition times than other systems in the market
See more Key Features on Specifications & Details tab
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Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies
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Enables up to 5x faster time to accurate data
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Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact
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RF/microwave device characterization, 1/f, WLR, FA and design debug
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Wide range of extremly performant, reliable thermal chuck systems from ATT
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Easy on-screen navigation, wafer mapping, and operation of accessories and thermal systems with Velox
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User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
- Latest Global and Rolling Shutters sensors from Sony® - from 2 to 12 MP
- USB3 Vision interface
- Compact fully-enclosed design with features needed by modern vision systems
- Provide advanced vision performance while using less power, less space, and fitting increasingly tight industry budgets
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Different substrate carriers for wafers up to 100 mm or single dies
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Up to six positioners
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Independently cooled cold shield
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Probe positioners placed inside vacuum chamber
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Ergonomic and straightforward design
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Simple microscope operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 1kOhm), the input impedance of these probes remains nearly constant over their entire frequency range. A traditional /10 passive probe will have a 10 MOhm) input impedance at DC, however this impedance drops rapidly with frequency, passing below the input impedance of a transmission line probe at less than 100 MHz.
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Joystick controller
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Manual probe positioners with rotary feed-throughs
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
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User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
- 5 GigE Ethernet port & hardware
- Supports cable lengths up to 100 m (CAT-5e, CAT-6) or (4T-6A)
- Simplified set-up with field proven Sapera LT software featuring CamExpert
- Engineered to accommodate industrial environment with a ruggedized screw mount RJ-45 connector
- Choice of 4 GHz or 6 GHz bandwidth models
- Up to 5 Vpk-pk dynamic range with low noise
- ±3 V offset range
- Low loading and high impedance for minimal signal disturbance
- Ideal for DDR2, DDR3, LPDDR2
- Deluxe soft carrying case
- Innovative QuickLink architecture
- Wide variety of tips and leads
- Solder-In Lead
- Optional Positioner (Browser) Tip
- Quick Connect Lead
- Square Pin Lead
- HiTemp Solder-In Lead
Teledyne LeCroy
Teledyne LeCroy is a leading provider of oscilloscopes, protocol analyzers and related test and measurement solutions that enable companies across a wide range of industries to design and test electronic devices of all types. Since our founding in 1964, we have focused on creating products that improve productivity by helping engineers resolve design issues faster and more effectively.
Oscilloscopes are tools used by designers and engineers to measure and analyze complex electronic signals in order to develop high-performance systems and to validate electronic designs in order to improve time to market. Protocol analyzers are tools used by designers and engineers to generate and monitor traffic over high speed serial data interfaces, including DDR, PCI Express, Fibre Channel, Serial ATA, SAS, USB and others. Both products are critical in the development of a wide variety of demanding design applications.
We utilize both of these important product areas in combination to tackle the most demanding serial data test applications, offering tailored solutions to help our customers perfect their chips, interfaces, subsystems and products which utilize these important communications standards. With the explosion in the use of serial data communications technologies in semiconductors, between devices on circuit boards and between computers and peripherals, we are aimed at a growing and important market.
Our oscilloscopes offer a powerful combination of large and informative displays combined with advanced waveshape analysis capabilities typically tailored to enhance the productivity of engineers in specific applications areas such as serial data test, disk drive test and automotive bus analysis.
Headquartered in Chestnut Ridge, New York, LeCroy has sales, service and development subsidiaries in the US and throughout Europe and Asia. LeCroy products are employed across a wide variety of industries, including semiconductor, computer, consumer electronics, military/aerospace, automotive/industrial, and telecommunications.
Contact Details
Headquarters Teledyne LeCroy
700 Chestnut Ridge Road, Chestnut Ridge, NY 10977-6499, USA
Phone: 800-553-2769 or 845-425-2000
Phone Support: 1-800-553-2769
Fax Sales: 845-578-5985
Email Sales: contact.corp@teledynelecroy.com
Email Support: support@teledynelecroy.com (Oscilloscopes, Waveform Generators, Signal Integrity)
Test & Measurement
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