The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.

• Monochrome (G-131B) and color (G-131C) models
• GigE Vision interface with Power over Ethernet
• Screw mount RJ45 Ethernet connector for secure operation in industrial environments
• Supports cable lengths up to 100 meters (CAT-6 recommended)
• Comprehensive I/O functionality for simplified system integration
• Popular C-Mount lens mount
• Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
• Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
• Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
• Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter

• Different substrate carriers for wafers up to 150 mm or single dies
• Up to six positioners
• Probe positioners placed inside vacuum chamber
• Short and stable probe arms
• Ergonomic and straightforward design
• Intuitive, manual operation
• Independent control of linear chuck stage and positioners
• Contact/separation stroke for probe platen

• Easy to Use
  • No need to break the circuit or insert a shunt
  • Small form factors for use on crowded boards
• Variety of Applications
  • Bandwidths up to 100 MHz
  • Peak currents up to 700 A
  • Sensitivities down to 1mA/div
• High Precision Measurements
  • Low frequency accuracy of 1%
  • Integrated autozero capability
• Fully Integrated with Teledyne LeCroy Oscilloscope
  • No additonal hardware is required
  • Power is supplied from oscilloscope ProBus connection
  • Automatic display of waveforms in Amps and calculated power traces scaled correctly in Watts
  • Degauss and Autozero directly from oscilloscope user interface
• DCS025 Deskew Calibration Source
  • Provides ability to precisely deskew most voltage probes along with 30, 150 and 500A current probes

• DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
• Full thermal range of -60°C to +300°C
• Reliable and repeatable contact
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Enables full access to the chuck and the auxiliary sites
• Intuitive, and precise movement of chuck in X, Y, and Z-direction
• High thermal stability components
• On-axis probe-to-pad alignment
• Flexibility from hot only to full thermal range of -60°C to +300°C
• Thermally induced drift can be automatically re-aligned for 30 μm pads in a temperature range from -40°C to 150°C (the effective temperature range depends on pad size, probe card holder and probe card)
• 3 performance level configurations (fully-shielded / shielded / open)
• Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
• User-centered design minimizes training costs and enhances efficiency

• Different substrate carriers for wafers up to 200 mm or single dies
• Probe cards and/or up to eight positioners
• Probe positioners placed inside vacuum chamber
• Short and stable probe arms
• Joystick controller
• Manual probe positioners with rotary feed-throughs
• Software control of chuck for fast step-and-repeat testing of the entire wafer
• Fast step-and-repeat testing of the whole wafer
• User-centered design minimizes training costs and enhances efficiency