Teledyne LeCroy - Probe Adapters
Probe adapters provide simple and easy interface of third-party probes as well as change between the different Teledyne LeCroy Oscilloscope input and cable types (ProBus, ProLink, K/2.92 mm, BNC and SMA). Depending on the adapters, changing between the Teledyne LeCroy Oscilloscope's input type may have an effect on the overall performance of the channel.
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Products |
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TekProbe to ProBus Probe Adapter |
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ProLink to 2.92mm Adapter with Probe Power and Communication Pass Through |
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ProLink to 2.92mm ProAxial Adapter with Probe Power and Communication Pass Through |
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2.92mm to ProBus Adapter with Probe Power and Communication Pass Through |
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2.92mm to ProLink Adapter with Probe Power and Communication Pass Through |
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More Product Information
- Probe loss is 3 dB typical between 140 and 200 GHz, S11/S22 15 dB typical
- Reduced unwanted couplings and transmission modes
- Able to shrink pad geometries to 25 x 35 µm (best case)
- Typical contact resistance < 0.05 Ω on Al, < 0.02 Ω on Au
- WR15, WR12, WR10, WR8, WR6, WR4, WR3, and WR2 bands available.
Flexibility
- DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
- Full thermal range of -60°C to +300°C
- Compatible with TopHat or IceShield
- Usage of manual and motorized positioners, probe cards within EMI-shielded environment
- Upgrade path to meet your future needs
- Stable and repeatable measurements over a wide thermal range
High accuracy and repeatability
- Reliable and repeatable contact
- Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
- Advanced EMI-shielding with PureLine and AttoGuard technologies available
- Superior low-leakage and low-noise measurements
- Safe and accurate hands-off testing
- Minimizes settling times for efficient measurements over full thermal range
See "Specifications & Details" tab for more key features
- S-parameters DC to 40 GHz, single-ended and mixed-mode
- Impedance Profile with <1 mm resolution, differential and common mode
- Built-in automatic calibration, no manual setup required
- TDR-powered impedance profiling enables precise de-embedding
- Advanced de-embedding including Time Gating and 2Xthru
- Emulate eye diagrams with equalization and advanced jitter analysis
- Complete NRZ and PAM analysis suite for high-speed serial data
- All-in-one solution for testing, compliance, and diagnostics.
- High-quality construction with low-noise electrical performance
- Kelvin version for convenient 4-point measurements
- Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
- SSMC 50 connectors
- Ultra-low, fA and fF measurements from -65 º C to 150 º C
Flexibility
- Different substrate carriers for wafers up to 150 mm or single dies
- Up to six positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Probing with an open chamber lid possible under atmospheric condition
- Specially designed for laboratory environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
See "Specifications & Details" tab for more key features
- Highest resolution - 12 bits all the time
- Bigger Display, smaller footprint, most bench space
- More capability, increased productivity
- Zone Trigger – Simple Triggering for Complex Signals
- 2, 4 and 8 channel configurations
- 16-bit vertical resolution
- Sample Rate up to 12.32 GS/s with RF mode
- 16-bit vertical resolution.
- 4 Gpts waveform memory per channel
- Up to 5 Vpp Output Voltage and ±2.5 V Baseline Offset 50 Ohm
- Ideal for GaN and SiC devices
- Highest system accuracy
- Fastest rise time
- High CMRR - 160 dB
- 2000 Vrms input
- 6000 Vpeak transients
- Up to 500 MHz bandwidth
- Ideal for Surge/EFT testing
High voltage single-ended passive probes are suitable for a wide range of applications where ground-referenced high-voltage measurements must be made safely and accurately. There is also a sense pin to automatically configure the oscilloscope for use with the probe.