FormFactor - Cascade Eye-Pass Probe - Durable multi-contact wafer probe with controlled impedance power bypass technology
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High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
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RF bandwidth to 500 MHz
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Long probe life: > 250,000 contacts
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Beryllium-copper tips for gold pads or tungsten for aluminum pads
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Oscillation-free testing of wide-bandwidth analog circuits
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Use with ACP series probes to provide functional at-speed testing for known-good-die
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Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
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Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)
The multi-contact Eye-Pass probe provides controlled impedance power connections enabling functional testing of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment. This custom probe allows the user to select the footprint pattern best suited for the application, with up to 12 contacts per probe head. Available contact types are ground, logic, standard and Eye-Pass power supply, power supply sense, and ac signal.
Use our online tool to capture your design requirements and receive a quote.
Use our online tool to capture your design requirements and receive a quote.
More Product Information
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Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
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Even distribution of high current with innovative multi-fingertip design
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Compatible with TESLA 200/300 mm power device characterization system
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Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
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Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
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Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)
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Camera Link InGaAs SWIR camera
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VGA resolution
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Large pixel with high dynamic
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Compact industrial design, no fan
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Simple camera configuration via GenCP
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Compact industrial design
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Very high intra-scene dynamic range of 73 dB
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Camera Link interface with GenCP support
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Comprehensive I/O control options
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Automated on-board image correction
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Stabilized sensor cooling, no fan
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Extended operating temperature range
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Fully isolated experiment space for true 4K temperatures during probing
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Cryogenic positioners to provide large travel ranges without warming up the device
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Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
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A soft vacuum bellows provides a compliant mounting interface for the cryocooler
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Quick release vacuum feedthroughs for easy configurability
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A large rectangular port for high signal capacity
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Fast GigE Vision InGaAs SWIR camera
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VGA resolution
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Power over Ethernet
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Compact industrial design, no fan
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Up to 301 fps at full resolution
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GigE Vision interface with Power over Ethernet
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Comprehensive I/O control options
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Automated on-board image correction
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Stabilized sensor cooling, no fan
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Extended operating temperature range
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Fast Camera Link InGaAs SWIR camera
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VGA resolution
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Compact industrial design, no fan
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Simple camera configuration via GenCP
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Compact industrial design Up to 303 fps at full resolution Camera Link interface with GenCP support Comprehensive I/O control options Automated on-boa
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Low running costs, less vibration, less noise, reduced maintenance
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Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
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CMN calibrated thermometry on MC plate
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Operation via touch panel controller: Remote operation via ethernet interface
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High performance GigE Vision InGaAs SWIR camera
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QVGA resolution
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Power over Ethernet
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no condensation
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efficient cooling with fan
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Nitrogen-filled cooling chamber to avoid condensation
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Up to 344 fps at full resolution
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GigE Vision interface with PoE
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Comprehensive I/O control options
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Automated on-board image correction
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TEC1 sensor-cooling
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Extended operating temperature range
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Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
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Online design configuration tool helps you to specify your probe in minutes
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All designs are fully quadrant compatible
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Full solution includes probes, calibration substrates, stations, accessories and software
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Scalable architecture for future needs
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Fast GigE Vision InGaAs SWIR camera
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VGA resolution
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TECless
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Power over Ethernet
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Compact industrial design, no fan
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Up to 301 fps at full resolution
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GigE Vision interface with Power over Ethernet
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Comprehensive I/O control options
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Automated image correction
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000