FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
Document
Products
-
Substrate material: High-resistivity silicon
-
Substrate thickness: 275 µm
-
Dielectric constant: 11.8
-
Nominal Z0: 50 Ω
-
Die-to-die stepping time of under 100 ms
-
Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
-
Even extreme variations in height, such as the case with warped wafers, can be compensated
-
Interfaces to all major analysis instrumentation, optics software and testers
-
Access to top side and bottom side of device under test (DUT)
-
Highly accurate light measurement
-
Test automation out-of-cassette for 24/7 operation
See more Key Features on Specifications & Details tab
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Ice- and condensation-free probing down to 77 K (liquid nitrogen) or below 20 K (liquid helium)
-
Probe positioners placed inside vacuum chamber
-
Joystick controller
-
Manual probe positioners with rotary feed-throughs
-
User-centered design minimizes training costs and enhances efficiency
-
Comprehensive alignment functions – from simple wafer alignment and mapping to automated alignment and test of multiple singulated chips, like IR – Focal Plane Arrays
See more Key Features on Specifications & Details tab
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Probe positioners placed inside vacuum chamber
-
Short and stable probe arms
-
Joystick controller
-
Manual probe positioners with rotary feed-throughs
-
Software control of chuck for fast step-and-repeat testing of the entire wafer
-
Fast step-and-repeat testing of the whole wafer
-
User-centered design minimizes training costs and enhances efficiency
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Probe positioners placed inside vacuum chamber
-
Short and stable probe arms
-
Joystick controller
-
Manual probe positioners with rotary feed-throughs
-
Software control of chuck for fast step-and-repeat testing of the entire wafer
-
Fast step-and-repeat testing of the whole wafer
-
User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
-
Different substrate carriers for wafers up to 100 mm or single dies
-
Up to six positioners
-
Independently cooled cold shield
-
Probe positioners placed inside vacuum chamber
-
Ergonomic and straightforward design
-
Simple microscope operation
-
Independent control of linear chuck stage and positioners
-
Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
-
Different substrate carriers for wafers up to 150 mm or single dies
-
Up to six positioners
-
Probe positioners placed inside vacuum chamber
-
Short and stable probe arms
-
Ergonomic and straightforward design
-
Intuitive, manual operation
-
Independent control of linear chuck stage and positioners
-
Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
-
Highly stable granite base
-
Independent, coarse movement of X and Y axes, combined with easy fine adjustments
-
Re-configurable for DC, RF, mmW, FA, WLR and more
-
Full thermal range of -60°C to +300°C
-
Low-profile, straightforward design
-
Spacious top chambers for up to 12 positioners
-
Reduces electrical noise by providing a fully electromagnetically shielded, ultra-low-noise, light-tight environment
-
Enables accurate low-noise measurements of atto amperes, femtofarads and microvolts at temperatures down to -60°C
See more Key Features on Specifications & Details tab