Meatest - M194 High Resistance Decade
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10 kΩ - 100.0 GΩ, short function
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Hot-switching up to 6 kVdc limit
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Test voltage and current indication
High resistance decade with built-in test signal meter for calibration of high resistance meters up to 6 kV. Based on M6xx Real-Resistance decade series with short function for short current testing.
M194 High Resistance Decade is designed for calibration of insulation testers, megaohmmeters and resistance ranges of safety testers, HIPOT testers or any other DC high resistance meter with test voltage up to 6 kV. Apart from resistance source in continuous range from 10 kΩ to 100 GΩ, the M194 has built-in multimeter indicating either test voltage in resistance function or mA current in short function for testing of UUT's short current.
Time-proven design
Based on M6xx series, this programmable decade comes with similar benefits - large LCD showing relevant parameters including total accuracy, automatically compensated parasitic resistances, easy recalibration procedure and extensive remote control connectivity via RS232, IEEE488, USB and Ethernet.
| DC resistance |
10 kΩ - 100 GΩ, 6.3 kV max. ± 0.1% / year |
Test Signal Meter
| DC voltage |
50 V - 6.3 kV ± 0.5% / year |
| DC current |
0 - 10 mA ± 0.2% / year |
More Product Information
The EMX-4xxx product family contains high-performance breakout boxes (EMX-4008 and EMX-4016), smart high density dynamic signal analyzers (EMX-4250 and EMX-4251), smart PXIe 625 KSA/s 4-channel digizers (EMX-4350), and charge and IEPE PXIe 625 KSA/s 4-channel digitizers (EMX-4380).
The Focus Compact Model (FCM) utility is a streamlined software package designed to be used with Focus’ AURIGA high-end Pulsed-IV system, that is used to generate Compact Models for transistors from their Pulsed-IV and wideband pulsed s-parameter data.
This is achieved by generating a network of lumped circuit elements that represent accurately the fundamental linear & non-linear behavior of the device over a broad range of bias and power range.
The result of the modeling is a netlist and compatible with- the most common CAD tools used in RF Design; such as AWR Microwave office (MWO) and Keysight PathWave Advanced Design System (ADS).
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On-wafer power device characterization up to 10,000 V DC / 600 A
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Safe and convenient integration kits to support T.I.P.S. “LuPo” High Voltage / High Power Probe Cards
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Prevent thin wafers from curling and breaking
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Safety interlock system with clear enclosure for operator safety during device measurements
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Convenient connection kits for easy and safe system integration with power device analyzers from Keysight Technologies and major suppliers
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Up to 25% lower air consumption (CDA) than other systems in the market (300l/min) with no compromise in transition times
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Windows 10 compatibility enables highest performance and safe operation with state-of-the-art hardware
See more Key Features on Specifications & Details tab
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Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided
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Temperatures range from -60°C to +300°C
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Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
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Low Thermal Resistance Technology
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MultiSense with multiple temperature sensors
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Isolated from ground
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Includes a jack for grounding and biasing
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Advanced wafer vacuum system for warped/partial thin wafers
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Provides uniform vacuum across the entire wafer surface
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Advanced shielding technology
See more Key Featueres on Specfications & Details tab
- PowerFlex design provides higher currents at lower voltages enabling one model to meet many different voltage/current requirements.
- Compact design for bench use or rack mounting (1/2 or 1/4 rack width)
- True analog controls with digital settings locking (S-Lock)
- Mixed-mode regulation with linear final regulation for low noise
- Dual models have isolated voltage tracking and synchronous on/off.
- P models have RS-232, USB, and LXI-compliant LAN interfaces plus duplicate rear terminals. GPIB Optional.
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Affordable GigE Vision InGaAs SWIR camera
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QVGA resolution
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Power over Ethernet
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Compact industrial design, no fan
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Up to 344 fps at full resolution
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GigE Vision interface with PoE+
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Comprehensive I/O control options
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Automated on-board image correction
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Stabilized sensor-cooling, no fan
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Extended operating temperature range
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Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies
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Enables up to 5x faster time to accurate data
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Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact
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RF/microwave device characterization, 1/f, WLR, FA and design debug
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Wide range of extremly performant, reliable thermal chuck systems from ATT
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Easy on-screen navigation, wafer mapping, and operation of accessories and thermal systems with Velox
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User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
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Can help to stabilize oscillations in high-gain devices
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Impedance match to low dynamic resistance laser diodes
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Custom configured for your application
Provides 15,000A DC at 5V DC in current mode
- Single complete package
- Integrated bus bars
- Current mode Analog programming
- Input 400VAC, 220A/ph, Delta
Meatest
We develop and manufacture electrical calibration instruments for calibration laboratories and testing facilities in electronics, engineering, utility, aeronautics and telecommunications sectors. Designed for automated calibrations our instruments bring effective solutions to customers like NPL, Samsung, Siemens and Volkswagen.
Contact Details
Meatest, spol. s r.o. Headquarters
Železná 509/3, Czech Republic - 619 00 BRNO
GPS: 49°10'13.93"N,16°36'53.2"E
Phone: 420-543-250-886
Fax: 420-543-250-890
Email: meatest@meatest.cz
Test & Measurement
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