Xena2544 offers full support for the 4 test-types specified in RFC2544, and also lets you partially enable one or more test types. Xena2544 supports different network topologies and traffic flow directions on both Layer 2 and Layer 3, as well as both IPv4 and IPv6.

• Single-slot low profile 32 bit PCI Express module 
• IRIG A, B, NASA 36, 1 PPS sync inputs 
• GPS sync option (maintains single-slot) 
• HaveQuick sync input option 
• Propagation delay correction 
• Zero latency time reads 
• Match Time output 
• IRIG-B time code output (option) 
• External Event time tags 
• Three user programmable rates 
• Supports Windows 8 & 10 
• Digitally Signed WHQL Driver 
• Designed for Low Profile PCI Express slots.

• Robust, vibration-resistant connection of components
• Can be endless combined and expanded
• Cost and time savings thanks to prefabricated components

The ZS Series probes provide high impedance and an extensive set of probe tips and ground accessories to handle a wide range of probing scenarios. The high 1 MΩ input resistance and low 0.9 pF input capacitance means this probe is ideal for all frequencies. The ZS Series probes provide full system bandwidth with all Teledyne LeCroy oscilloscopes with bandwidths of 4 GHz and lower.

General purpose reed relays offer reliable and flexible switching solutions for a wide range of applications across industries such as automated test equipment (ATE), medical devices, industrial systems, and telecommunications. Built around high-quality reed switches capable of billions of operations (load dependent), these relays deliver consistent performance in both low and moderate power environments.

Available in multiple sizes and configurations, including single and multi-switch designs, these relays support SPST, SPDT, and latching contact forms. Popular models feature dual-in-line (DIL/DIP) pin-outs, low-profile options, and high insulation resistance versions up to 10¹³ ohms, making them suitable for compact PCB layouts and high-isolation requirements. Whether you need a single relay or a multi-channel solution, these relays provide dependable switching in versatile formats.

Scalable, zero trust architected, and edge-ready, the Integrated Edge Solution 5G is a rugged, compact, end-to-end private 5G standalone radio, core, and edge compute and connectivity solution providing ultra-reliable, low-latency bidirectional communication.

• O-RAN/3GPP-Compliant Vendor-Agnostic - Deploy cores and radios from multiple vendors with different capabilities and price points to maximize flexibility and scalability.
• Ubiquitous and Continuous Comms - Seamlessly connect edge nodes via terrestrial and non-terrestrial neworks including private 5G, WiFi, SATCOM, and much more.
• Comprehensive Network Solution - Integrated RAN and 5G Core across single-server network-in-a-box (NiB) or multi-server architectures per your application or program need.

• Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
• Application flexibility, ideal for use in high frequency applications
• Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
• Suitable for integration with vibration isolating tables

• Specified performance to 43.5 GHz with Extended K™ ports
• Simple signal integrity testing of passive multiport and differential devices
• Advanced time domain option provides tools for signal integrity analysis
• Wide dynamic range enables measurement of very low reflection artifacts
• Excellent corrected directivity minimizes measurement uncertainty
• SmartCal™ auto calibration unit reduces calibration and setup time
• Time domain with time gating option enables TDR-like measurements
• Modern LAN interface for remote control is faster than GPIB
• A common GUI and SCPI interface within the ShockLine family
• The compact 3U high chassis allows for the efficient use of rack space
• Bias tee option simplifies test setups where the DUT needs DC biasing
• Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction