Our reverberation chamber is particularly suited for immunity testing for EMC measurement and special applications for very high-field strength applications (200V/m - 7000V/m). The paddle system ensures that the widest range of frequencies and particularly low frequency performance is maximized. This system meets testing requirements of the IEC61000-4-21 EMC testing specification.

• Complete bias circuits
• Requires no external components
• Optimizations available for frequency range and output levels

The NC520 low voltage (surface mount) noise module is an economic solution for built-in test requirements. It contains complete bias circuits and require no external components.

The surface mount package is suitable for mounting on microstrip. The modules produce extremely flat output power versus frequency characteristic that is insensitive to temperature and voltage variations.

Typical applications for the NC520 module includes built-in test equipment (bite), signal strength meters for cellular, pcs, catv, calibrators, spectrum analyzers, radar warning receivers (rwr), and dither A/D quantization error. Maury can optimize frequency range and output levels for specific applications.

• Output White Gaussian noise
• Output power up to +30 dBm
• 127 dB of attenuation; 0.1 dB step size
• Units > 2 GHz have total attenuation of 79.9 dB
• Low distortion signal path
• Power 115 VAC, 60 Hz
• Noise attenuator accuracy: ±0.2 dB or 0.5% at 1 – 500 MHz ±0.2 dB or 1% at 0.5 – 1.0 GHz ±0.3 dB or 2% at 1 – 2 GHz
• Standard connectors SMA female
• 7” touch screen display
• Dimensions: 17.25 in. wide x 6.50 in. including feet, high x 19.50 in. deep
• Removable hard drive for added security
• Operating Temperature: -10° to +65°C

• 1-slot 1U allows high-port density in a robust form factor
• Price/performance
• Ease of use
• Advanced architecture
• User-friendly software (XenaManager, Xena OpenAutomation)
• Test automation with XOA
• Three years’ software updates
• Three years’ hardware warranty
• Free tech support & training for the product lifetime

The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices. 

In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35).NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test. 

• A TEM horn antenna compliant with IEC 61000-4-39 Ed.1. 
• Test without changing the antenna in the frequency range of 380MHz to 6GHz. 
• Low VSWR and high GAIN enable efficient electromagnetic wave radiation. 
• Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT. 
• Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.

• 1.3" (24 mm) max. sensor size
• Resolution down to 2.4µm pixel size
• Low chief ray angle suits all SONY Pregius™ generations
• 8 focal lengths: 16 mm - 50 mm
• Initial aperture: F2 - F2.8

• The RL121 is characterized as a Small High Dispersion Bright Field ring light. 
• Non-lensed LEDs disperse light at broad angles, providing “soft” lighting for applications that require short working distances. 
• The low-profile design is only .56” (14.2mm) thick, allowing it to be used in space constrained applications. 
• Optional adapter rings are available for camera lens mounting. 
• A wide variety of wavelengths are available from UV to IR. An optional polarizer and/or diffuser may be used to further condition the light output. 
• The RL121 delivers 27kLux at a working distance of 50mm.

• Spin mode is a dynamic mode intended to provide a simulation of a spinning satellite. 
• Enhanced Eclipse mode is a dynamic mode that allows the user to easily program and initiate an eclipse event with total control over all of the V-I curve parameters and dwell times. 
• Operates with Sequential Shunt Regulators and Maximum Power Point Trackers 
• Multiple redundant OVP/OIP layers

The Xena B720/2400 is a 4U modular chassis that can be equipped with up to 12 Ethernet test modules to provide high port density and low power consumption.

There are 2 versions of the Xena chassis: the standard B720 and the high-performance B2400.