VTI Instruments - SMX-3xxx product family of Multiplexers
More Product Information
- Up to 96 differential channels per full rack mainframe
- Constantly monitor input signals for fault conditions
- Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
- Inputs can be masked, inverted, and combined to produce interrupts
- Can be used as a time stamp module and as a digital I/O
- Programmable debounce circuitry prevents erroneous readings
- 10 V and 100 V input ranges
- On-board memory stores events with IEEE 1588 timestamps
- Synchronize reading of input states with other scanned analog channels
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Provides an effectively noise free environment around the device under test (DUT)
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World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
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Up to 4x faster flicker noise thermal testing on 30 μm pads
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Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
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Provides fully managed and filtered AC power to the entire system – prober and instruments
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Filters harmful noise generated by external thermal control systems
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Reduced “antenna effect” injection of unwanted RF noise into the measurement path
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Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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User-centered design minimizes training costs and enhances efficiency
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
See more Key Features on Specifications & Details tab
- Typical accuracies of ±0.20°C
- 16-channel isolated universal thermocouple/voltage inputs
- Power over Ethernet+ (PoE+)
- 20K samples/second/channel sample rate
- 24-bit ADC per channel
- 500 V channel-ground isolation
- 1000 V channel-channel isolation
- Data logger acquisition mode
- Built-in parallel data streaming
- Full-featured embedded web interface
- LXI Ethernet interface
- 8-bit bank isolated digital I/O
- Compact 1U half-rack form factor
- 4-Channel, 204.8 Ksa/s per channel, 24-Bit DACs
- -115 dB spurious free dynamic range
- Integrated 2-Channel 64-bit tachometer
- Integrated 4-Channel DIO
- Tight synchronization with DSA analyzers
- Ideal for rotational measurement, and stimulus-response applications such as vibration test
- Output modes including Sine, Burst Sine, Chirp, Burst-random and continuous random
- Combine up to 6 SPDT and 6 multiport high-performance building blocks in a 2U footprint
- Extended life and self-terminating options provide maximum design flexibility
- Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world
- Flexible API supports IVI and Linux development environments minimizing software investment
- LXI Trigger Event implementation provides seamless test synchronization with external devices
The EMX-4xxx product family contains high-performance breakout boxes (EMX-4008 and EMX-4016), smart high density dynamic signal analyzers (EMX-4250 and EMX-4251), smart PXIe 625 KSA/s 4-channel digizers (EMX-4350), and charge and IEPE PXIe 625 KSA/s 4-channel digitizers (EMX-4380).
The SMP4xxx product family is made up of the SMP4001, SMP4001-S, SMP4002, SMP4003, SMP4004, SMP4005, SMP4006, SMP4007, SMP4028, and SMP4044.
The SMP5xxx product family is made up of the SMP5001 through SMP5005 general purpose relays.
VXI Chassis include 6-slot VXIbus mainframes (CT-100C), 5-slot VXIbus mainframes (CT-310A), and modular 13-slot VXIbus mainframes (CT-400, pictured).
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