NoiseKen - Fast Transient Burst Simulator - FNS-AX3
Electrical fast transients (EFT), such as switching transients originating from inductive load interruption, relay contact bounce, etc., are one of the main causes of equipment malfunctions. Because they can occur anywhere interfering with circuits primarily via mains and interconnection cables.
EFT is characterized by fast rise times and a short duration of pulses. Also significant is the fact that EFT comes in bursts with repetition rates exceeding 100kHz. In the real world, an EFT event is a series of pulses with changing amplitudes and repetition rates. For test purposes, the IEC 61000-4-4 standard defines an idealized EFT/B. For anyone who wants to build quality products with an extensive test program from design, qualification, production to diagnostic purpose, the FNS-AX3 simulators will serve as a critical tool with a new level of performance and efficiency meeting and far exceeding the IEC standard requirements.
Output Waveform
Pulse waveform at rise-up
Entire waveform
Burst waveform
FEATURES
- A new level of ease of use with a touch-panel color LCD and screen design for intuitive settings, color graphical representation and good visibility.
- Three operation modes: IEC61000-4-4 STANDARD mode for an instant use. MANUAL mode for free setting including ramping. SEQUENCE mode for a seamless run of combined settings in Manual mode.
- 4.8kV output at 2MHz pulse repetition rate assures the worst case testings.
- Valuable additional output modes: Polarity Reversal and Pulse Repetition Frequency Modulation modes are available.
- A wide variety of options
- A single package solution offering a generator and CDN
- Selection of single phase CDN rated 16A or three-phase CDN rated 50A
- Compliance to IEC/EN61000-4-4 Edition 2.0
| Output voltage | 200~4800V |
| Polarity | Positive and negative |
| Output impedance | 50Ω |
| Coupling mode | Common mode |
| Coupling capacitor / DC blocking capacitor | 33nF/ 10nF |
| Pulse frequency* | 0.1kHz~2MHz |
| Pulse waveform (at 50Ωload) * | Rise-up time 5ns±30% Pulse width 50ns±30% |
| Pulse waveform (at 1kΩ load) * | Rise-up time 5ns±30% Pulse width 35ns~150ns |
| Burst duration |
1~1000 pulses (lmited depending on conditons) Possible to set by time |
| Burst period | 10ms~1000ms 10ms step |
| Continuous output function | Max. 10kHz (0.2~1kV) |
| Timer |
1s~99h59m59s Max. 10 min. when the pulse is continuous and the polarity is switched |
| Operation mode | MANUAL / IEC LEVEL / SEQUENCE |
| Frequency modulation | Modulate pulse frequency between 0~-10% of setting |
| External trigger TTL | Down edge, minimum trigger interval acceptable 10ms~ |
| Line synchronization | Asynchronized or synchronized with EUT(0~359° 1°step) |
| EUT power capacity |
A16B : Single phase 3 lines AC85~240V 16A 50/60Hz DC 125V 16A |
| Indicator / Operation panel | Color 5.7 inch touch panel LCD |
| Operating temperture / humidity range | 15~35℃ / 25~75% RH (without dew) |
| Power supply | AC100~240V 50/60Hz 120VA |
| Dimension | (W) 320x(D)352x (H) 400mm |
| Mass |
Approx.14kg (A16 Single phase) Approx. 19kg (B50 3-phase) |
*Guaranteed accuracy range of waveform is 5~100kHz
1. Polarity reverse function
Enables to sweich for putting the positive pulse and negative one out per the one burst so as to enrich the test.
2. Pulse continuous output / Frequency modulation function
Enables to sweich for putting the positive pulse and negative one out per the one burst so as to enrich the test.
TEST SETUP
Test Method using Fast Transient / Burst Simulator
- Place the simulator onto the ground place which is connected to the protective earth and connect SG terminal on the front panel to the ground plane.
- Connect power cable (Standard accessory) to AC IN on the back of the simulator.
- Place coupling adaptor CA-805B (Option) onto the ground place and connect G terminal on side connector part of the clamp to the ground plane.
- Connect PULSE OUT connector on the front of the simulator to connector of the adaptor.(Fully pay attention to that any high voltage must not be put out during the connection)
- Thread cable to be tested through the adaptor.
- Set the test conditions like the coupling voltage, etc on the touch-panel on the front of the simulator and start the test.
OPTION
Test Method using Fast Transient / Burst Simulator
for INS-4020 / 4040, INS-AX2 Series and FNS-AX3 Series
Enable for testing characteristics against the noise only with clamping communication cables of electronics equipments in combination with INS Series.
- Enable to inject the noise without cutting signal, DC, AC, GND, etc.
- Enable to test the noise resistibility of electronics equipments separated individually.
- Realize to test the noise resistibility effectively since the injection can be directly to signal lines.
- Enable to clamp bundle of signal lines whose maximum diameter is 26mm
| Input voltage : | 4000V Max |
| Input pulse width : | 50~1000ns |
| Dimension / Mass : | (W) 350 X (H) 120 X (D) 130mm / approx. 3kg |
| Storage temp. range : | -5~55℃ |
| Inside clamp diameter : | 26mm |
Coupling Adaptor MODEL: 15-00007A (CA-806 / Magnetic field coupling)
for INS-4020 / 4040, INS-AX2 Series and FNS-AX3 Series
Enable for testing characteristics against the noise only with clamping communication cables of electronics equipments in combination with INS Series.
- Enable to inject the noise without cutting signal, DC, AC, GND, etc.
- Enable to test the noise resistibility of electronics equipments separated individually.
- Termination resistance built-in
| Structure : | Magnetic field coupling noise injection clamp |
| Input voltage : | 2000V Max. |
| Input pulse width : | 50~1000ns |
| Dimension / Mass : | (W) 89 X (H) 64 X (D) 120mm / Approx. 1kg |
| Coupling ratio | 1/10±10% of input voltage |
| Termination resistance : | 50Ω system built-in |
| Max. ground cable diameter : | 27mm |
Coupling Probe MODEL: CA-803A
for INS-4020 / 4040, INS-AX2 Series and FNS-AX3 Series
Enable for testing characteristics against the noise only with clamping communication cables of electronics equipments in combination with INS Series.
- Enable to inject the noise without cutting signal, DC, AC, GND, etc.
- Enable to test the noise resistibility of electronics equipments separated individually.
- Enable to clamp bundle of signal lines whose maximum diameter is 15mm
| Input voltage : | 2000V Max. |
| Input pulse width : | 50~1000ns |
| Coupling ratio | 1/20±10% of input voltage |
| Dimension / | (W)160 × (H)60 × (D)35mm / Approx. 400g |
Coupling Probe MODEL: 95242-1
for INS-4020 / 4040, INS-AX2 Series and FNS-AX3 Series
Produced by ETS LINDGREN
Enable for testing characteristics against the noise only with clamping communication cables of electronics equipments in combination with INS Series.
- Enable to inject the noise without cutting signal, DC, AC, GND, etc.
- Enable to test the noise resistibility of electronics equipments separated individually.
- Enable to clamp bundle of signal lines whose maximum diameter is 15mm
| Frequency range : | 10MHz - 400MHz |
| Maximumu input power : | 100W |
| Maximum input current : | 25A |
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USB flash drive software update via web site download
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Up to 60V and up to 20A per output (420W maximum)
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Constant voltage or constant current operation
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Low output noise and good transient response
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PowerFlex or fixed-range operation plus custom limits
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True analogue controls with digital settings locking
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Variable OVP trips; safety binding-post terminals
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Short and stable probe arms
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Intuitive, manual drives
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Front loading capability through load door
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
See more Key Features on Specifications & Details tab
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Thermal range: -60˚C to 300˚C available
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Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
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Advanced EMI-shielding with PureLine with AttoGuard technologies
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Locking roll-out stage
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Innovative microscope remote control
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Electrical fast transients (EFT), such as switching transients originating from inductive load interruption, relay contact bounce, etc., are one of the main causes of equipment malfunctions. Because they can occur anywhere interfering with circuits primarily via mains and interconnection cables.
EFT is characterized by fast rise times and a short duration of pulses. Also significant is the fact that EFT comes in bursts with repetition rates exceeding 100kHz. In the real world, an EFT event is a series of pulses with changing amplitudes and repetition rates. For test purposes, the IEC 61000-4-4 standard defines an idealized EFT/B. For anyone who wants to build quality products with an extensive test program from design, qualification, production to diagnostic purpose, the FNS-AX3 simulators will serve as a critical tool with a new level of performance and efficiency meeting and far exceeding the IEC standard requirements.
Noiseken simulators to reproduce fast rise-up noises which are generated when switching ON / OFF electric current on the inductive load.
Since the pulse includes broadband frequency and its rise-up time is fast at 3ns or less, it can make the noise coupling dense and effective to reproduce the malfunctions of electronics equipment under the test.
It can realize performance evaluation of electronics equipments upon reproduction of line noises which are intruded to the power supply lines or induced noises onto the telecommunication lines.
NoiseKen
For over 40 years from its foundation in 1975, Noise Laboratory has been focusing on immunity test equipment and related solutions.
Now their product lines include various types of immunity test equipment ranging from those conforming to IEC 61000-4 series standards, other international or national immunity standards and even to customer's in-house test standards.
Contact Details
Shinyei Corporation of America Head Office - Sole Authorized distributor of NoiseKen products
1120 Avenue of the Americas, 4th Floor, New York, NY 10036, USA
Phone: 917-484-7884
Fax: 212-704-4206
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