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Back-lit Flat Diffuse Lights provide a space saving design for the illumination of highly reflective objects.
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Two aperture diameters are available, .88” (22.3mm) and 1.75” (44.5mm).
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For similar performance in a thinner housing, refer to our Edge-lit Flat Diffuse Lights (FX Series).
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Available in visible and infrared wavelengths with an optional polarizer.
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Provides light intensities of up to 11.7kLux at 4” (102mm) standoff.
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Pre-engineered, expandable sizes are available from 3”x 3” (76mm) to 22”x 34” (559 x 864mm) in 1” (25mm) increments.
NoiseKen - High Voltage Noise / Car Manufacturer's Standard by FNS-AX4-A20-N2447
This model is for carrying out a high pressure noise test of individual automotive manufacturers' demands. It simulates representative high voltage noise of HV and EV.
- Single-phase 3 wire
- AC85 - 240V16A
- 50/60Hz
- DC125V16A
- Pulse: ~ 500V 50kHz (option)
CALIBRATION CIRCUIT (18-N1686)
TESTING CONDITION 1 ( CONTINUAL TESTING)
Noise Waveform (reference)
Testing Level (Continual Testing)
|
Test Level |
Vp-p(V) |
|---|---|
|
1 (battery ECU) |
220 |
|
2 (PCU) |
105 |
|
3 (NAVI) |
15 |
Noise Waveform (continual testing)
Testing Frequency fp condition (Continual Testing)
|
Test Level |
Vp-p(V) |
|---|---|
|
1 (battery ECU) |
220 |
|
2 (PCU) |
105 |
|
3 (NAVI) |
15 |
CONDITION 2 (BURST TESTING)
Noise Waveform (burst testing)
Testing Level (Burst Testing)
|
Test Level |
Vp-p(V) |
|---|---|
|
1 (battery ECU) |
120 |
|
2 (PCU) |
30 |
|
3 (NAVI) |
7.5 |
Test Frequency fp condition (Burst Testing)
|
Test Frequency fp range (kHz) |
100 ~ 1000 (kHz) |
|---|---|
|
Test fp step (kHz) |
10 (kHz) |
|
Test Frequency fp point |
90 frequency point |
REQUIRED ADAPTOR
Coupling Adaptor MODEL: CA-805B (Capacitive coupling)
Enable for testing characteristics against the noise only with clamping communication cables of electronics equipment's in combination with INS Series.
- Enable to inject the noise without cutting signal, DC, AC, GND, etc.
- Enable to test the noise resistibility of electronics equipments separated individually.
- Realize to test the noise resistibility effectively since the injection can be directly to signal lines.
- Enable to clamp bundle of signal lines whose maximum diameter is 26mm
|
Input Voltage |
4000V Max |
|---|---|
|
Input Pulse Width |
50~1000ns |
|
Dimension / Mass |
(W) 350 X (H) 120 X (D) 130mm / approx. 3kg |
|
Storage Temperature Range |
-5~55℃ |
|
Inside Clamp Diameter |
26mm |
More Product Information
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15’ Flexible Power Cord
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IEC C13 / C14 Connectors
Test Tap:
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3ft.
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(2) fork terminals (current)
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(1) fork terminals (ground)
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(2) Shielded Banana (voltage)
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Load-lock chamber: Cycle devices 10X faster in a cryogenic environment
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High-density electrical interface at cryogenic temperatures: More pins on the device enables more test structures to be probed with a single cooldown
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Base temperature of < 2K or < 4K with high cooling power: Test devices at the temperatures that matter most for pre- screening and evaluating device performance
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Low vibration: Stable contact with the device under test and enables low noise measurements
-
Power quality and energy functions
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0.01° phase shift accuracy
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15 - 1000 Hz output
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Built-in multimeter for transducer calibration
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Floating current output for 3-wire power meters
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Voltage from Current function
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High performance GigE Vision InGaAs SWIR camera
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QVGA resolution
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Power over Ethernet
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no condensation
-
efficient cooling with fan
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Nitrogen-filled cooling chamber to avoid condensation
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Up to 344 fps at full resolution
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GigE Vision interface with PoE
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Comprehensive I/O control options
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Automated on-board image correction
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TEC1 sensor-cooling
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Extended operating temperature range
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LED display for device status
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Passive cooling
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Removable carrying handle
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Short circuit proof
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Protection against overheating, overvoltage and polarity reversal
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Parameterizable for other cell sizes
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High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
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RF bandwidth to 500 MHz
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Long probe life: > 250,000 contacts
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Beryllium-copper tips for gold pads or tungsten for aluminum pads
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Oscillation-free testing of wide-bandwidth analog circuits
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Use with ACP series probes to provide functional at-speed testing for known-good-die
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Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
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Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)
- High power density in 1U / 2U / 4U / 14U chassis up to 18kVA
- Intuitive touch panel control
- Innovative iX2™ current doubling technology
- Multi-language display for global operation
- Auto paralleling for higher power
- Single phase 1U models and 1 or 3 phase selectable 2U / 4U / 14U models
- Complete avionic test suites (optional)
- ATE version available in 1U, 2U and 4U models
- Standard LXI LAN, USB and RS232, optional GPIB
- Legacy CSW5550 Emulation on the AST6003A1 Model
- Analog Programming
- Constant Voltage or Constant Current Operation
- LabView® and LabWindows® Drivers
- Standby Mode
- Front Panel Button Preview of Voltage, Current, OVP
- CSA, UL Approvals
NoiseKen
For over 40 years from its foundation in 1975, Noise Laboratory has been focusing on immunity test equipment and related solutions.
Now their product lines include various types of immunity test equipment ranging from those conforming to IEC 61000-4 series standards, other international or national immunity standards and even to customer's in-house test standards.
Contact Details
Shinyei Corporation of America Head Office - Sole Authorized distributor of NoiseKen products
1120 Avenue of the Americas, 4th Floor, New York, NY 10036, USA
Phone: 917-484-7884
Fax: 212-704-4206
Test & Measurement
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