VTI Instruments - X-Modal III - Modal Analysis Software with Embedded Data Acquisition
- Autonomous Modal Parameter Estimation Procedure
- Multiple Live Parameter Estimation Windows
- Task Oriented, Easy-To-Use Interface
- Logical Operation Always "One-Click" away
- Simplified "Copy & Paste" Data Management
- Simplified Units Unification Tool
- Based on MATLAB® Computational Engine Environment
- Universal File Format (UFF) Data Access
- Individual Data Channel Calibration
X-Modal III is a comprehensive modal analysis package featuring intuitive, task oriented user interfaces, extensive modal parameter estimation algorithms, parallel display capabilities, flexible data management, and embedded data acquisition capabilities.
Developed by one of the leading research universities in modal analysis and structural dynamics, and supported by leading structural testing groups in aerospace, defense and automotive industries,X-Modal III is used for the most complicated modal test applications in the world.
X-Modal III is based on MATLAB®, an open-source programming environment, and offers the user the ability to take advantage of leading edge technology for modal testing. X-Modal III fully supports the SentinelEX Series of Smart Dynamic Signal Analyzers (DSA’s), as well as VTI’s VT143x family.
- Modal Analysis
- Ground Vibration Testing
- MIMO Shaker Testing
- Multi-Reference Impact Testing
- Problem Analysis and Troubleshooting
More Product Information
- Typical accuracies of ±0.20°C
- 16-channel isolated universal thermocouple/voltage inputs
- Power over Ethernet+ (PoE+)
- 20K samples/second/channel sample rate
- 24-bit ADC per channel
- 500 V channel-ground isolation
- 1000 V channel-channel isolation
- Data logger acquisition mode
- Built-in parallel data streaming
- Full-featured embedded web interface
- LXI Ethernet interface
- 8-bit bank isolated digital I/O
- Compact 1U half-rack form factor
The SMP4xxx product family is made up of the SMP4001, SMP4001-S, SMP4002, SMP4003, SMP4004, SMP4005, SMP4006, SMP4007, SMP4028, and SMP4044.
- Combine up to 16 SPDT or 8 multiport, high-performance relays in a 2U footprint
- Latching/Terminated options (EX7204L)
- LXI/LAN and USB command and control options
- Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world
- Flexible API supports IVI and Linux development environments minimizing software investment
- LXI trigger event implementation provides seamless test synchronization with external devices
- Store up to 128 relay configurations for quick recall, including automatic power-up state
- 8 frequency counter channels, 16 isolated digital I/O channels, 2 isolated DAC channels in a single card
- Single frequency measurement range that works from 0.05 Hz to 1 MHz
- Very stable TCXO base clock, 50 MHz ±1 ppm
- 195 kΩ Input impedance with selectable coupling (AC/DC)
- Wide differential input voltage range (±48 V) with up to 250 V working common mode voltage
- Programmable threshold and hysteresis levels with 1 mV resolution
- Support for quadrature encoder
- Isolated DIO channels with up to 60 V compliance
- Isolated and independent 16-bit DAC channels, configurable for voltage or current output
Flexibility
- Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL
- Re-configurable and upgradable as requirements grow
- Minimizes setup times with no loss in performance or accuracy
- Seamless integration of various measurement instruments
Stability
- Solid station frame
- Built-in vibration-isolation solution for superior vibration attenuation
- Rigid microscope bridge
- Compact and rigid mechanical design
- Highly accurate measurement results
- Incorporates best-known methods
Ease of Use
- Ergonomic and straightforward design for comfortable and easy operation
- Low-profile design
- Simple microscope operation
- Quick and ergonomic change of DUT through pull-out stage
- Minimize training efforts
- Fast time to data
- Convenient operation
- 8 frequency counter channels, 16 isolated digital I/O channels, 2 isolated DAC channels in a single card
- Single frequency measurement range that works from 0.05 Hz to 1 MHz
- Very stable TCXO base clock, 50 MHz ±1 ppm
- 195 kΩ Input impedance with selectable coupling (AC/DC)
- Wide differential input voltage range (±48 V) with up to 250 V working common mode voltage
- Programmable threshold and hysteresis levels with 1 mV resolution
- Support for quadrature encoder
- Isolated DIO channels with up to 60 V compliance
- Isolated and independent 16-bit DAC channels, configurable for voltage or current output
- Modular 6.5 digit DMMs for the EX1200 mainframes
- Tightly integrated into mainframes, allowing high-speed, synchronized scanning measurements without the need for external cabling.
- Input can be routed directly to the DMM or through an internal analog bus on the backplane.
- Super fast scanning with no processor intervention required
- Scanning configuration can be saved in the DMM’s non-volatile memory allowing quick recall of saved states
- Integrating ADC for with adjustable integration time depending on the level of accuracy required.
- “True RMS” AC readings
- Frequency and temperature measurements
The SMX-7xxx product family is made up of a series of microwave switch cards.
PureLine 3 Technology
- Provides an effectively noise free environment around the device under test (DUT)
- First automated probe station to achieve -190dB spectral noise*
- Up to 32x lower noise (1kHz), for improved device characterization and modelling at the 7/5/2 nm technology nodes targeted for 5G and beyond applications
- Eliminates over 97% of the environmental noise experienced in previous probe systems
- Extensive collection of FormFactor patents, electrical design knowledge, and measurement system IP
Plug In and Go
- World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
- Eliminates all ground-loop induced TestCell noise
- Low field emissions
- Provides fully managed and filtered AC power to the entire system, prober and instruments
See "Specifications & Details" tab for more key features
VTI Instruments
Data Acquisition, Signal Conditioning, Switching, Modular Instruments & VXI Mainframes