VTI Instruments - X-Modal III - Modal Analysis Software with Embedded Data Acquisition
- Autonomous Modal Parameter Estimation Procedure
- Multiple Live Parameter Estimation Windows
- Task Oriented, Easy-To-Use Interface
- Logical Operation Always "One-Click" away
- Simplified "Copy & Paste" Data Management
- Simplified Units Unification Tool
- Based on MATLAB® Computational Engine Environment
- Universal File Format (UFF) Data Access
- Individual Data Channel Calibration
X-Modal III is a comprehensive modal analysis package featuring intuitive, task oriented user interfaces, extensive modal parameter estimation algorithms, parallel display capabilities, flexible data management, and embedded data acquisition capabilities.
Developed by one of the leading research universities in modal analysis and structural dynamics, and supported by leading structural testing groups in aerospace, defense and automotive industries,X-Modal III is used for the most complicated modal test applications in the world.
X-Modal III is based on MATLAB®, an open-source programming environment, and offers the user the ability to take advantage of leading edge technology for modal testing. X-Modal III fully supports the SentinelEX Series of Smart Dynamic Signal Analyzers (DSA’s), as well as VTI’s VT143x family.
- Modal Analysis
- Ground Vibration Testing
- MIMO Shaker Testing
- Multi-Reference Impact Testing
- Problem Analysis and Troubleshooting
More Product Information
- Dual Voltage ranges that support over voltage testing on 480V based systems
- Instrument Setups for quickly re-establishing the known instrument state
- 500uS time resolution for Transients
- Virtual Panels control software included
- Non-Linear current waveform programming during Load mode
- Phase coordination among multiple units (LKM/LKS)
- Powerful set of analog controls for PHIL and Modulation tests
- Trigger In & Out to permit extensive coordination with external systems
- Extensive Onboard diagnostics
- Digital I/O, including RS232, USB, Ethernet (GPIB optional)
- Intuitive 5” color display for ease of navigation
- Auto-paralleling for maximum flexibility with multi-chassis configurations
- Separate terminal blocks for single-phase and three-phase AC outputs
- High Current - 300 mA Sink
- High Density - 64 Channels / Card
- Isolation - 1000 V
- Multiple Digital Logic Levels - LV TTL - TTL - 60 V Max, User Defined
- Flexible Configurations - Dedicated Input - Dedicated Output - Eight, 8-Bit Ports
- Flexible Software - Embedded Soft Front Panel - Common IVI Software Drivers
The SMP6xxx product family is made up of the SMP6001, SMP6002, SMP6004, SMP6005, SMP6006, SMP6101, SMP6102, SMP6103, SMP6122, SMP6144, SMP6202, SMP6301 (pictured), SMP6301T, and SM6306.
The PXIe chassis include 18-slot chassis (CMX18 and CMX18A) and 9-slot chassis, pictured (CMX09 and CMX09A).
The EMX-4xxx product family contains high-performance breakout boxes (EMX-4008 and EMX-4016), smart high density dynamic signal analyzers (EMX-4250 and EMX-4251), smart PXIe 625 KSA/s 4-channel digizers (EMX-4350), and charge and IEPE PXIe 625 KSA/s 4-channel digitizers (EMX-4380).
- Combine up to 6 SPDT and 6 multiport high-performance building blocks in a 2U footprint
- Extended life and self-terminating options provide maximum design flexibility
- Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world
- Flexible API supports IVI and Linux development environments minimizing software investment
- LXI Trigger Event implementation provides seamless test synchronization with external devices
- Highest resolution – 12 bits all the time
- More capability – integrates multiple instruments into one
- Comprehensive probe support – supports over 30 probes in 9 categories
- MAUI with OneTouch user interface for intuitive and efficient operation
- 96 digital lines configurable as either input or output
- Five available power supply rails for custom designs
- Mix and match with standard SMIP switching and digital I/O modules to create high density configurations
- VXI plug&play driver simplifies software development
- On-board connector header for simplified migration to PCB implementation
- Access to 16 MHz clock for use in complex designs
- Multiple front panel connector options
PureLine 3 Technology
- Provides an effectively noise free environment around the device under test (DUT)
- First automated probe station to achieve -190dB spectral noise*
- Up to 32x lower noise (1kHz), for improved device characterization and modelling at the 7/5/2 nm technology nodes targeted for 5G and beyond applications
- Eliminates over 97% of the environmental noise experienced in previous probe systems
- Extensive collection of FormFactor patents, electrical design knowledge, and measurement system IP
Plug In and Go
- World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
- Eliminates all ground-loop induced TestCell noise
- Low field emissions
- Provides fully managed and filtered AC power to the entire system, prober and instruments
See "Specifications & Details" tab for more key features
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