High density switch matrix models in 1 wire and 2 wire configurations

• High-density, compact (1U) precision data acquisition instruments 
• LXI™ LAN connectivity 
• Fully integrated signal conditioning maximizes performance and accuracy 
• Easily integrate thermocouples, voltages, RTDs, thermistors, frequency, strain and pressure on an per-channel basis 
• Distributed, synchronized measurements over the wire 
• Scalable architecture easily expands from tens to thousands of channels 
• DC version available for test cells requiring closer proximity to test article 
• End-to-end self-calibration ensures optimum runtime performance 
• Web-based access for monitoring and control 
• Exlab turnkey software for simplified setup, control and data display

• Modular 6.5 digit DMMs for the EX1200 mainframes 
• Tightly integrated into mainframes, allowing high-speed, synchronized scanning measurements without the need for external cabling. 
• Input can be routed directly to the DMM or through an internal analog bus on the backplane. 
• Super fast scanning with no processor intervention required 
• Scanning configuration can be saved in the DMM’s non-volatile memory allowing quick recall of saved states 
• Integrating ADC for with adjustable integration time depending on the level of accuracy required. 
• “True RMS” AC readings 
• Frequency and temperature measurements

RF/Coax switching modules up to 26 GHz for high frequency and communication switching needs

• Combine up to 6 SPDT and 6 multiport high-performance building blocks in a 2U footprint 
• Extended life and self-terminating options provide maximum design flexibility 
• Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world 
• Flexible API supports IVI and Linux development environments minimizing software investment 
• LXI Trigger Event implementation provides seamless test synchronization with external devices

• 8 frequency counter channels, 16 isolated digital I/O channels, 2 isolated DAC channels in a single card 
• Single frequency measurement range that works from 0.05 Hz to 1 MHz 
• Very stable TCXO base clock, 50 MHz ±1 ppm 
• 195 kΩ Input impedance with selectable coupling (AC/DC) 
• Wide differential input voltage range (±48 V) with up to 250 V working common mode voltage 
• Programmable threshold and hysteresis levels with 1 mV resolution 
• Support for quadrature encoder 
• Isolated DIO channels with up to 60 V compliance 
• Isolated and independent 16-bit DAC channels, configurable for voltage or current output

• Ideal for UUT loading or simulation 
• Wide resistance range from 0.5 Ω to 1.5 MΩ 
• 0.1 Ω step size 
• Over-voltage, over-current, and over-temperature sensing protects unit under test 
• External voltage and current sense for monitoring built-in

• Intuitive, icon-based setup and control
•  Spreadsheet-style channel configuration 
• Snapshot display with data export 
• Independent sampling rates for each instrument 
• Real-time online graphical data analysis 
• Client / server architecture with multiple displays 
• Synchronization of different data sources 
• Detect/process events for close-loop control 
• Post-acquisition analysis methods and data playback 
• Easily create Virtual/Calculated channels based on physical channel data

• Highest resolution – 12 bits all the time 
• More capability – integrates multiple instruments into one 
• Comprehensive probe support – supports over 30 probes in 9 categories 
• MAUI with OneTouch user interface for intuitive and efficient operation