• Directly compatible with most commercial VNA’s
• Available as polynomial and characterized device kits
• Measure S-Parameters with uncertainty when used in conjunction with Maury’s Insight software platform

Maury offers coaxial and waveguide VNA calibration kits.

Coaxial calibration kits are offered in Polynomial SOLT, Characterized Device (CD) SOLT, and TRL, depending on the connector series. Where available, CD kits improve calibration accuracy when compared to SOLT kits based on polynomial definitions as each calibration kit is provided with individually characterized short, open and fixed load standards, whose S-parameters can be loaded into commercial VNAs directly or when used with Maury’s Insight™ software platform. When combined with Insight™, users will be able to quantify the uncertainty contribution of their calibration kit to their overall measurements. CD cal kits result in TRL-like accuracy with fixed-load SOLT ease-of-use.

• SOSA Aligned 
• 3U VPX Form-Factor 
• Reduced SWaP applications 
• Ruggedization Level 200 
• 11 Radial Clock Outputs 
• OpenVPX Backplane support for 1000BASE-KX or 10GBASE-KR 
• Optional Chip Scale Atomic Clock (CSAC) Holdover 
• Optional Low Phase Noise (LPN) Analog output 
• Optional secure GPS (M-code) 
• Optional Timecode I/O

The BARCUDA VP230 is the right system if you are looking for a complete turnkey solution for flexible testing and programming of your electronic assemblies. The stand-alone unit uses the technologies of embedded JTAG solutions such as VarioTAP or ChipVORX. However, you can also expand these to meet the functional test requirements of your electronics production.

With BARCUDA VP230 you can test and program assemblies with or without JTAG/Boundary Scan - with no need to configure a special in-house test system.

With a standard, robust interface "VPC G12 Receiver" from Virginia Panel Corporation (VPC), you can choose the adapter supplier (for needle bed adapters) for contacting your assembly and implement any mechanical requirements.

BARCUDA VP230 is equipped with a complete power-up unit and TAP control for 16 boards, which can be scaled up to 32 boards. It can also be expanded with analogue measurement cards, additional I/O channels and your specific hardware.

• Revolutionary technology advancement for wafer and die-level photonics probing
• Real-time in-situ calibrations
• Singulated die testing
• True die-level edge coupling
• In-situ power measurements
• Advanced calibration technologies
• Enables autonomous measurements

See "Specifications & Details" tab for more key features

The VectorStar ME7838 Series broadband VNA offers the widest available single frequency sweep from 70 kHz to 110, (ME7838AX to 125), (ME7838EX to 125), to 145 GHz, and to 220 GHz with mmWave bands to 1.1 THz. 

• The ME7838AX or ME7838EX version can easily be upgraded to 145 GHz and to 220 GHz
• All versions may be configured to include banded millimeter-wave modules up to 1.1 THz
• Industry-best calibration and measurement stability: 0.1 dB vs 0.6 dB over 24 hrs.
• All versions support the 3744x-Rx receiver for noise figure measurements, including the ability to characterize differential noise figure, to 125 GHz
• Compact, lightweight mmWave modules (0.6 lb vs 7+ lbs and 1/50 the volume) offer low cost installation on smaller probe stations.

• Calibration-grade metrology standards
• Used for VNA calibration and/or calibration validation

Shielded, coaxial opens are used in the calibration of vector network analyzers to provide a nominal 180° phase offset from a compatible reference short over a wide range of frequencies. At these frequencies, open circuit terminations are inherently imperfect. Shielding the open essentially eliminates radiation loss, but creates a residual frequency-sensitive capacitance. An accurate knowledge of the open’s effective capacitance is essential to an accurate calibration of the analyzer. Maury opens are characterized for effective capacitance versus frequency by means of a fourth order polynomial curve fit, and the nominal capacitance coefficients are provided with each unit.

The VTI Instruments 16-Channel bridge and strain gauge measurement instrument

• 24-bit, delta-sigma ADC, simultaneous sampling
• Programmable Sample Rate up to 128kSPS
• Full, Half & Quarter Bridge with 120Ω, 350Ω & 1kΩ bridge completion
• Voltage Excitation: 0.5V to 10V
• Current Excitation: 0.46mA
• 2-Wire & 4-Wire Ohms/RTD
• Bridge Zero Balancing
• Built-In-Self-Test (BIST)
• Strain Lead Wire Calibration
• Shunt Calibration: 50kΩ, 100kΩ & External provided by User
• TEDS Support
• LXI Ethernet Interface
• IEEE-1588 Synchronization
• Power over Ethernet (PoE) or 10–50 V DC input
• Built-in Parallel Data Streaming
• Full-featured Embedded Web Interface
• Compact 1U Half-rack Form Factor

• Speed: Calibration is faster since there is no need to manually connect and disconnect standards.
• Accuracy: Eliminates errors caused by manual handling, such as connector inconsistencies and improper torquing.
• Ease of Use: Minimal user interaction is required, making calibration simpler and more accessible.
• Reliability: Reduces wear and tear on VNA ports and connectors, prolonging their lifespan.
• Consistency: Provides repeatable results across multiple calibration sessions and users.

Resistance decade box designed for RTD and other resistance-based sensors' simulation. 0.1°C accuracy and 5W load capacity.

• Real resistors switched by relays
• Custom temperature scales
• No residual resistance
• 5 W load capacity
• Six different languages