Teledyne LeCroy - PXP-100B PCI Express® Test Platform
- Provides a passive PCIe® backplane for test applications
- Self-contained, portable and self-powered
- Supplies power for +3.3V, +3.3Vaux and +12V rails
- Generates PCIe reference clock
- Accepts external clock inputs
- Generates valid PERST# bus reset that can be activated by manual push button
- Includes two mid-bus probe footprints for traffic monitoring
- Supports two PCIe x16 sockets which accept cards of any link width (x1, x4, x8, x16)
- Provides indication of valid connection of PRSNT1# and PRSNT2# lines for each card
- Supports data rates of 2.5 GT/s and 5.0 GT/s
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
Full-featured, convenient and portable, the PXP-100B simplifies the experimental setup during testing of new PCIe products.
Teledyne LeCroy is the main supplier of protocol analyzers and exercisers to companies developing SSD and other similar storage products using the new NVMe, SATA Express and SCSI Express high-speed serial data standards. Protocol analyzers and exercisers are used by developers and validation engineers to directly record and examine data traffic on serial data communication links between devices and systems. This equipment enables developers to reduce debug and test schedules, lower engineering development costs on new products and meet aggressive time-to-market requirements.
As storage developers make the transition from legacy SAS and SATA protocol-based SSDs to the more advanced NVMe and SATA Express technologies, they are encountering limitations in available design and test tools including limited trace recording times and a lack of standardized analysis reports for PCIe-based storage. These two issues are significant for the newer technologies of NVMe and SATA Express due to the following:
- High performance SSD testing can require recording data traffic beyond a few minutes. This is not possible for many protocol analyzers due to limitations in their recording architectures.
- While some test tool suppliers have claimed support for the NVMe and SATA Express protocols, support for these protocols has remained minimal. This has hampered developer's productivity due to the use of reporting systems designed for the older technologies, which are not optimized for quality testing on NVMe and SATA Express products.
The Summit T34 protocol analyzer, specifically targeted at PCIe storage applications, now supports long trace recordings with a new NVMe Enhanced Mode. The Summit T34 can also be configured with up to 64 GB of trace recording memory. NVMe Enhanced Mode builds on and optimizes the existing deep buffer memory to allow users long recording time capability. Depending on the speed of the DUT (Device Under Test), the recording time can be maximized to up to several hours for a single trace capture. This feature is useful for tasks such as measuring performance or determining how well your Queue handling algorithms are functioning. An example of the metrics that are now available include the ability to measure the NVMe queue distribution over a sustained period of time. The ability to gather queue behavior for long periods helps driver and OS developers fine tune their applications and balance queue loads for optimized product performance.
With over a decade of experience in providing PCI Express, SAS/SATA and other serial data protocols with standardized error analysis and product performance reports, Teledyne LeCroy has now created an NVMe and SATA Express SSD Performance and Analysis capability. Trace Expert™, a new feature in the PCIe Protocol Suite, creates a detailed report that the SSD industry requires to obtain a common understanding of how their SSD or storage systems are operating and includes information on the necessary PCIe based components. Information such as NVMe queues, commands, doorbell and control registers and many other metrics are captured, analyzed and organized into a detailed report providing developers a comprehensive status document for their products including a wide range of performance statistics.
In addition to the standard storage protocols, all of our NVMe platforms also fully support, Trusted Computer Group (TCG), Single Root I/O Virtualization (SRIOV), Multi-Root I/O Virtualization (MRIOV) and Address Translation Services (ATS). A full list of capabilities, views and reports can be found on the product pages (listed below) for each of our analyzers.
NVMe over PCIe Specification Decoding and Analysis - NVMe Initialization Decoding
- Decode NVMe Commands
- Analyze NVMe Queues
- NVMe Multiple Pointer Based Transactions
- NVMe Power Management
- Extract the PCIe SSD Base Address automatically
More Product Information
With the ProBus interface, the ZD500, 1000, and 1500 becomes an integral part of the oscilloscope. All probe gain and offset controls are transparent to the user, making it easier to probe the circuit without concern for which gain setting to choose. When used with a LeCroy digital oscilloscope, no external power supply is required.
With the ProBus interface, the ZD500, 1000, and 1500 becomes an integral part of the oscilloscope. All probe gain and offset controls are transparent to the user, making it easier to probe the circuit without concern for which gain setting to choose. When used with a LeCroy digital oscilloscope, no external power supply is required.
The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications
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Teledyne e2v Sapphire CMOS sensor
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Switchable shutter modes
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Power over Ethernet
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60 fps at full resolution
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Monochrome (G-192B) and color (G-192C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
- Up to 4 GHz Bandwidth
- ±60 V Offset Capability
- ±800 mV Dynamic Range
- 50 kΩ DC Input Impedance
- 1.2x Attenuation for low additive noise
- MCX terminated cable with wide variety of connections:
- Solder-in (4 GHz)
- Coaxial Cable to U.FL receptacle (3 GHz)
- MCX PCB Mount (4 GHz)
- Browser (500 MHz)
- ProBus Interface
Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 1kOhm), the input impedance of these probes remains nearly constant over their entire frequency range. A traditional /10 passive probe will have a 10 MOhm) input impedance at DC, however this impedance drops rapidly with frequency, passing below the input impedance of a transmission line probe at less than 100 MHz.
Differential active probes are like two probes in one. Instead of measuring a test point in relation to a ground point (like single-ended active probes), differential probes measure the difference in voltage of a test point in relation to another test point
- Four operating modes: – CC, CV, CR, CP
- Static, Dynamic and Sequence mode support
- Built in Application Functions - Short Circuit Test, Battery Test Mode, CR-LED Mode, OCP and OPP Test
- Provides a load of up to 300 Watts
- Programmable and analog external control
- All Digital IF technology
- 10.1” WVGA (1024 x 600) Display
- Frequency range from 9 KHz up to 3.2 GHz
- -161 dBm/Hz Displayed Average Noise Level (Typ)
- -98 dBc/Hz @ 10 khz Offset Phase Noise (Typ)
- Total Amplitude Accuracy < 0.7 dB
- 1 Hz Minimum Resolution Bandwidth (RBW)
- Comes with Preamplifier
Teledyne LeCroy
Teledyne LeCroy is a leading provider of oscilloscopes, protocol analyzers and related test and measurement solutions that enable companies across a wide range of industries to design and test electronic devices of all types. Since our founding in 1964, we have focused on creating products that improve productivity by helping engineers resolve design issues faster and more effectively.
Oscilloscopes are tools used by designers and engineers to measure and analyze complex electronic signals in order to develop high-performance systems and to validate electronic designs in order to improve time to market. Protocol analyzers are tools used by designers and engineers to generate and monitor traffic over high speed serial data interfaces, including DDR, PCI Express, Fibre Channel, Serial ATA, SAS, USB and others. Both products are critical in the development of a wide variety of demanding design applications.
We utilize both of these important product areas in combination to tackle the most demanding serial data test applications, offering tailored solutions to help our customers perfect their chips, interfaces, subsystems and products which utilize these important communications standards. With the explosion in the use of serial data communications technologies in semiconductors, between devices on circuit boards and between computers and peripherals, we are aimed at a growing and important market.
Our oscilloscopes offer a powerful combination of large and informative displays combined with advanced waveshape analysis capabilities typically tailored to enhance the productivity of engineers in specific applications areas such as serial data test, disk drive test and automotive bus analysis.
Headquartered in Chestnut Ridge, New York, LeCroy has sales, service and development subsidiaries in the US and throughout Europe and Asia. LeCroy products are employed across a wide variety of industries, including semiconductor, computer, consumer electronics, military/aerospace, automotive/industrial, and telecommunications.
Contact Details
Headquarters Teledyne LeCroy
700 Chestnut Ridge Road, Chestnut Ridge, NY 10977-6499, USA
Phone: 800-553-2769 or 845-425-2000
Phone Support: 1-800-553-2769
Fax Sales: 845-578-5985
Email Sales: contact.corp@teledynelecroy.com
Email Support: support@teledynelecroy.com (Oscilloscopes, Waveform Generators, Signal Integrity)
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