NEO NXB - 12020A Voltage / Current Breakout Test Box
- On-Off power switch
- 20 A Circuit Breaker
- 8’ Flexible Power Cord
- Outlets – (4) 5-20R
Test Tap:
- 3ft.
- (2) fork terminals (current)
- (1) fork terminals (ground)
- (2) Shielded Banana (voltage)
Multiple outlets provide flexibility in connecting equipment under test. Tester pigtail interface simplifies connecting to a variety of voltage/current measuring systems.
| Voltage | Current | Input | Output | Test Output | Switch/Breaker |
| 120/240 | 20A | AC Line - Cord | 5-20 R [4] | Pigtail | Yes |
Application
More Product Information
- Robust case seals against extraneous light
- Central control unit
- Semi-automatic focussing and illumination
- Safe from impacts and vibrations
- Quasi shadow free transmitted light
- Optimal system status for lighting, optics and camera
- A measurement with 2 cameras is possible
- Adjustable operation distance for 2D measurements in laboratories
- Very precise measurement due to high resolution sensors
- Standardised individual components
- Very easy measuring procedure
- Suitable software VELOX and CAQ-System ProCable available
- Image circle: 43.2 mm - 82 mm
- 4 focal lengths: 40 mm - 100 mm
- Homogeneous imaging performance across the entire image field
- Very low distortion and high resolution
- V38-Mount, compatible to theV38 mounting system
- Initial apertures: F2.8 - F5.6
- 600 MHz of instantaneous bandwidth per channel
- Timing synchronization up to 16 channels
- Link Emulation including:
- Phase continuous delay, Doppler, and attenuation changes
- AWGN and Eb/No
- 12 tap (path) multipath fading with Rayleigh, Rician & CW. Angle of Arrival (AOA), k-factor, and correlation controls
- RF frequency agile up/down converters
- Payload Emulation including:
- IMUX/OMUX amplitude and group delay distortion
- Amplifier Compression (AM/AM and AM/PM)
- Phase Noise
- Static and dynamic link emulation
- Ephemeris data generation using SATGEN
- Remote instrument control through ACEClient application
- Up to 96 differential channels per full rack mainframe
- Constantly monitor input signals for fault conditions
- Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
- Inputs can be masked, inverted, and combined to produce interrupts
- Can be used as a time stamp module and as a digital I/O
- Programmable debounce circuitry prevents erroneous readings
- 10 V and 100 V input ranges
- On-board memory stores events with IEEE 1588 timestamps
- Synchronize reading of input states with other scanned analog channels
- 2 in 1: device contains the Hot Set Test as well as the Heat Pressure Test
- Robust and compact set including the device and an equipment case
- Possibility to attach a thermometer directly near the sample
- Measurement according to the cable standards IEC 60811 -507 (Hot Set Test) and IEC 60811 -508 (Heat Pressure Test) regarding sample attachment and weight attachment
- Precise choice of weights due to practical containers
- Simultaneous measurement of up to 3 cable or tube samples
EMI Measurements:
- FFT-based dual-channel receiver
- According to CISPR16-1-1
- Peak, Quasi-Peak, and Average Detectors
- Resolution Bandwidth Filters of 200 Hz, 9 kHz, and 120 kHz (CISPR), and 1 kHz and 10 kHz (MIL)
- The fastest receiver in the market: Line and Neutral measurements with the 3 detectors simultaneously (6 simultaneous measurements)
NEO
NEO offers a line-up of Power measurement breakout boxes designed for use with Yokogawa's precision power analyzers.
