• 24-bit, delta-sigma ADC, simultaneous sampling 
• Programmable Sample Rate up to 128kSPS 
• Full, Half & Quarter Bridge with 120Ω, 350Ω & 1kΩ bridge completion 
• Voltage Excitation: 0.5V to 10V 
• Current Excitation: 0.46mA 
• 2-Wire & 4-Wire Ohms/RTD 
• Bridge Zero Balancing 
• Built-In-Self-Test (BIST) 
• Strain Lead Wire Calibration 
• Shunt Calibration: 50kΩ, 100kΩ & External provided by User 
• TEDS Support 
• LXI Ethernet Interface 
• IEEE-1588 Synchronization 
• Power over Ethernet (PoE) or 10–50 V DC input 
• Built-in Parallel Data Streaming 
• Full-featured Embedded Web Interface 
• Compact 1U Half-rack Form Factor

NEO X01 3000 PSI Adapters

• Improves your QA through configurable logging 
• Allows you to retain power of control on how boards are tested by third parties 
• User-friendly environment reduces your training costs for production operatives 
• Ability to test multiple boards, simultaneously, by using multiple XJLinks

NEO 901 3000 PSI Adapters

NEO 001F 3000 PSI Adapters

NEO X05 5080 PSI Adapters

• On-Off power switch
• 15 A Circuit Breaker
• Inlet - IEC C14 for use with any cordset
• Outlets – (8) IEC C13

• 3ft.
• (2) fork terminals (current)
• (1) fork terminals (ground)
• (2) Shielded Banana (voltage)

NEO 005F 5080 PSI Adapters

• Up to 96 differential channels per full rack mainframe 
• Constantly monitor input signals for fault conditions 
• Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths 
• Inputs can be masked, inverted, and combined to produce interrupts 
• Can be used as a time stamp module and as a digital I/O 
• Programmable debounce circuitry prevents erroneous readings 
• 10 V and 100 V input ranges 
• On-board memory stores events with IEEE 1588 timestamps 
• Synchronize reading of input states with other scanned analog channels