• Precise: 0.5 µm resolution with absolute sensor
• High Push Force: 2N
• Low Power: 6 V DC, < 1 A
• Embedded: Closed-loop positioning
• Zero power Hold: With rigidity and no jitter

• Tiny “all-in-one” solution: no external control board needed 
• Superior image quality: sub-micron lens movement with very low tilt. Now with higher dynamic stability 
• Low voltage & power: 3.3 VDC input, zero power position hold 
• Simple system integration: accepts high-level motion commands over standard serial interface (I2C or SPI) 
• Flexible, production-ready system: compatible with M8 to M16 lenses and with typical image formats from 1/3” to 1/1.8” 
• Lowest cost, fastest time to market: Fully-engineered “plug and play” solution

LSS-EF01 series

This simulator evaluates the immunity of electronic equipment by simulating "highenergy induced lightning noise" induced in power distribution lines and communication lines due to fluctuations in the earth's potential caused by lightning strikes. This is an entry model of the LSS-F03 series. (Maximum output voltage 6kV)

LSS-F03 series

A tester simulatively generates "High energy induced lightning noise" which induced to distribution lines or communication lines by ground potential fluctuation caused by lightning strikes.

• The SL1236 is characterized as a Large Aimed Spot Light. 
• Precisely aimed LEDs provide a level of lighting control not found in traditional illuminators. 
• A range of standoffs and fields of view may be specified at the time of order. 
• The spot light is available in a wide range of wavelengths from UV to IR, including a 3 channel RGB version. 
• Diffuser and polarizer options are also available. 
• The SL1236 provides 14kLux at a working distance of 4” (100mm).

With the ProBus interface, the ZD500, 1000, and 1500 becomes an integral part of the oscilloscope. All probe gain and offset controls are transparent to the user, making it easier to probe the circuit without concern for which gain setting to choose. When used with a LeCroy digital oscilloscope, no external power supply is required.

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements

• Industry Leading Power Density – Up to 1700 Watts in 1U 
• Standard Digital Interfaces – USB&RS232/485 
• LXI Ethernet and Isolated analog interfaces 
• Power Factor Correction-PFC and universal AC input 
• “Green” Sleep Mode – Automatically “sleeps” after period of non-use 
• Built in sequencing - Unload your system controller 
• Programmable fold-back protection delay

Flexibility

• Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided
• Temperatures range from -60°C to +300°C
• Surfaces are nickel or gold-plated
• Hybrid chuck design – operation with and without cooling unit
• Field-upgradeable: On-site cold upgrades for all main prober platforms

Highest Efficiency for Reduced Cost of Test

• Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
• Up to 15% faster transition times than other systems on the market

• High ENR
• Wide frequency range
• Custom frequencies available

The NC3600 Series coaxial noise sources are an excellent choice for applications requiring high ENR, such as ATE, radiometer, and radar systems.

An SMA male connector is standard for the RF output and feed thrus for bias input. SMA female is an option. Custom frequencies and flatness available. Contact the factory with your request.