Anritsu

Overview
Specifications & Details
Datasheets & Downloads
Videos

Broadest frequency span from a single coaxial test port covering 70 kHz to 70 GHz in a single instrument and 70 kHz to 145 GHz in the Broadband configuration. Extendable to 1.1 THz
Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction.
IMDView™ software coupled with the internal combiner option offers the ability to switch from S parameters to IMD measurements in a single connection
Highest performance pulse measurements— PulseView™ offers 2.5 ns pulse resolution with 100 dB dynamic range
4-port single-ended or balanced measurements using DifferentialView™ analysis
Internal trace-based eye diagram option provides the ability to display Time Domain, S-Parameters, and Eye Diagram analysis with active sweep updates
Superior Dynamic Range - up to 142 dB
High available power - up to +14 dBm
Best test port characteristic performance - up to 50 dB in Directivity
Best time domain analysis
Fast and accurate optoelectronic measurements from 70 kHz to 40, 70 GHz and 110 GHz, at 850, 1060, 1310 and 1550 nm wavelengths, using MN4765B O/E Calibration module

The VectorStar™ family is Anritsu's Premium VNA line, providing the highest overall performance on a modern platform. The MS4640B VectorStar VNA offers the broadest coverage in a single instrument, 70 kHz to 70 GHz. The additional two decades at the low end are even more impressive than the guaranteed 70 GHz coverage on the high end.

IMDView™ provides active menu sidebar with real time measurement display while modifying critical IMD parameters. The internal combiner option offers single connection testing of active devices for automatically switching between S parameter and IMD measurements without the need for reconnecting the DUT.

PulseView™, when combined with the innovative IF digitizing option, offers industry-leading 2.5 ns pulse resolution and 100 dB dynamic range with no compromises or trade-offs due to varying duty cycles. PulseView provides real time display of pulse measurements while dynamically modifying pulse parameters for immediate design validation.

DifferentialView™, when combined with the dual internal source option, offers real time display analysis of differential devices, drivers, and components while actively modifying phase and magnitude relationships of the internal dual sources.

The noise figure option is based on a cold source technique for improved noise figure measurement accuracy. VectorStar is the only VNA platform capable of measuring noise figure from 70 kHz to 125 GHz and available with an optimized noise receiver for measurements from 30 GHz to 125 GHz. Additionally, VectorStar is the only VNA that offers a Differential Noise Figure option for characterizing the noise figure of differential devices.

For broadband applications, the ME7838 Series offers superior performance and coverage spanning a range from 70 kHz to 110 GHz, 125 GHz and 145 GHz in a single coaxial test port. The Anritsu developed Non-linear Transmission Line mmWave module is compact while providing high performance up to 145 GHz.

The Anritsu MS4640B Vector Network Analyzer offers a new level of performance for device modeling engineers struggling to accurately and reliably characterize their devices, for R&D engineers pushing the last fraction of a dB out of their state-of-the-art designs, and for the manufacturing engineer trying to maximize throughput without sacrificing accuracy. Backed by a 3-year warranty and the most responsive sales support team, the MS4640B is the VNA of choice for the discerning engineer.

Options

Key Configuration Items:

MS4642B	VNA, 10 MHz — 20 GHz, 2-port, K(male)
MS4644B	VNA, 10 MHz — 40 GHz, 2-port, K(male)
MS4647B	VNA, 10 MHz — 70 GHz, 2-port, V(male)
Option 001	Rack Mount
Option 002	Time Domain with advanced capabilities
Option 007	Receiver Offset with Multiple Source Control for frequency-translated measurements
Option 021	Universal Fixture Extraction
Option 031	Dual Source
Option 032	Internal Combiner
Option 035	IF Digitizer
Option 036	Extended Memory (Must be purchased with Option 35)
Option 041	Noise Figure
Option 042	PulseView™
Option 043	DifferentialView™
Option 044	IMDView™
Option 046	Fast CW
Option 047	Eye Diagram
Option 048	Differential Noise Figure
Option 053	External ALC leveling
Option 05x	Direct Access Loops for total measurement flexibility
Option 06x	Active Measurement Suites with 2 or 4 attenuators
Option 070	70 kHz Low-end Frequency Extension for an unprecedented frequency coverage
Option 08x	Broadband/Milllimeter Wave Interface
MN469xC	4-port Test Sets, K and V for 70 kHz to 70 GHz multi-port solutions
MN4765B	Optical VNA measurements O/E Calibration Module. Options available for 40, 70 GHz and 110 GHz, at 850, 1060, 1310, and 1550 nm wavelengths

Software

AWR Connected™ to Anritsu VectorStar

Anritsu's VectorStar Vector Network Analyzer (VNA) uniquely combines design and measurement by including NI AWR Design Environment™ software as a standard feature within the instrument, as a separate application on your desktop.

You now have access to all of the design tools essential for high-frequency IC, PCB, and module design at your fingertips, right on your VNA, including:

Linear circuit simulators
Electromagnetic (EM) analysis tools
Integrated schematic and layout

The integration of high-frequency design tools within high-performance VNAs is the way of the future - but it's available today, only from Anritsu and AWR.

Users Site

VectorStar Users Site

The VectorStar Users Site is a location where you can obtain Software, O/S Patches, and needed Utilities for your VectorStar instruments.

Published Content

The following are various published works that have utilized the VectorStar vector network analyzer to conduct their measurements. These papers are the property of their authors who have given Anritsu permission to post these.

3D Smith charts scattering parameters frequency-dependent orientation analysis and complex-scalar multi-parameter characterization applied to Peano reconfigurable vanadium dioxide inductors

Mueller, Andrei A. et al; nature.com Scientific Reports, 04 Dec 2019

A novel reconfigurable CMOS compatible Ka band bandstop structure using split-ring resonators and Vadandium Dioxide (VO2) phase change switches

Muller, Anrei A. et al; Infoscience EPFL scientific publications, 22 Aug 2019

Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature

Muller, Anrei A. et al; ACS Applied Electronic Materials, 16 Apr 2020

Third Party Solutions

Anritsu has partnered with the following industry-leading companies to provide a variety of proven material measurement capabilities that are compatible with the VectorStar and ShockLine vector network analyzer families.

Material Measurements

	Compass Technology Choose from off-the-shelf or custom-designed RF material measurement systems able to measure material properties from 100 MHz to 90 GHz. These solutions include: focused beam, resonant cavity, waveguides, spot probes, free space measurement systems, and more. Anritsu and Compass Technology Group Material Measurements Solutions Compass Technology Group VectorStar Integration [video]
	Keycom Technologies Select from a variety of material measurement solutions that leverage various methods including: resonator, frequency change, probe type, co-axial tube and waveguide type S-parameter, free space, capacitance, epsilometery, and more. Anritsu and Keycom Material Measurement Solution
	SWISSto12 Providing hardware and software technology capable of measuring: solid samples; soft sample and foam; liquid samples and powder; thin films; dielectric coatings and multilayer materials; alumina plate; and more. Anritsu and SWISSto12 Material Measurement Solution

Brochure	Release Date
Anritsu's RF and Microwave Test and Measurement Solutions Product Brochure	5/27/2020
Vector Network Analysis Product Portfolio	4/7/2020
VNA Fundamentals Poster	1/29/2020
VectorStar MS4640B Series Product Brochure	1/29/2020
VectorStar E and W Band Millimeter-Wave VNA System Quick Fact Sheet	11/6/2019

Datasheet	Release Date
VectorStar MS464xB Product Information, Compliance, and Safety	6/5/2020
VectorStar MS464xB Series Microwave Vector Network Analyzer Technical Data Sheet	6/5/2020
Multiport VectorStar MN469xC Technical Data Sheet and Configuration Guide	3/10/2020
VectorStar (Microwave Vector Network Analyzer) Declaration of Conformity	6/9/2017

Application Note	Release Date
Accessing 43.5 GHz Measurements with Traceability Application Note	6/30/2020
Material Measurements with Vector Network Analyzers Application Note	5/26/2020
On-Wafer Biasing Using Anritsu Kelvin Bias Tees on VectorStar ME7838x Broadband Systems Application Note	2/12/2020
Electro-Optical Measurements Using Anritsu VNAs	1/24/2020
Configuring IC-CAP 2018 for VectorStar Operation	8/27/2019
Generating Eye Diagrams in VectorStar VNAs Including PAM-4	6/21/2019
Distinction Between TRL and LRL	3/26/2019
Performing Differential Noise Figure Measurements Application Note	12/4/2018
Technique for Improving Low Insertion Loss VNA Measurements Application Note	9/25/2018
Electrical-to-Optical and Optical-to-Electrical (E/O and O/E) converter measurements	2/6/2018
Understanding Vector Network Analysis	7/27/2017
De-embedding and Network Extraction	5/24/2017
LRL-LRM Calibration Theory and Methodology Application Note	3/21/2017
Vector Network Analyzer Use in Antenna Measurement Systems	10/25/2016
VNA Signal Integrity Measurement Challenges Application Brief	9/12/2016
Procedure for a Higher Accuracy Receiver Calibration for Use in mm-Wave Noise Figure Measurements	9/18/2015
IMD Measurements Using Dual Source and Multiple Source Control	5/27/2015
IMD Measurements with IMDView	5/18/2015
NxN Measurements using VectorStar	3/6/2015
Externally Synchronized VNA Measurements	12/4/2014
Mixer Measurements utilizing the Mixer Setup Application and Dual Sources on VectorStar VNAs	10/29/2014
Creating Eye Diagrams using VectorStar™ SnP files and AWR Microwave Office®	9/22/2014
True Mode Stimulus Measurements	9/18/2014
On making corrected measurements of multipliers	9/15/2014
Understanding PulseView Measurements	4/11/2014
PulseView™ Calibrations	3/3/2014
Radar Pulse Measurement Application Brief	8/19/2013
Passive Components Test Application Brief	8/19/2013
Time Domain Measurements Using Vector Network Analyzers	8/19/2013
Pulse Measurements	8/19/2013

Leaflet	Release Date
Anritsu and Compass Technology Group Material Measurements Solution	5/28/2020
Anritsu and SWISSto12 Material Measurements Solution	5/28/2020
Anritsu and Keycom Material Measurement Solution	5/28/2020
Anritsu Vector Network Analyzers — The Perfect Tool for Electro-Optical Measurements	2/6/2018

White Paper	Release Date
Millimeter-wave Partial Information De-embedding: Errors and Sensitivities White Paper	8/23/2018
Superposition vs. True-Balanced: What's Required for your Signal Integrity Application White Paper	8/23/2018
Wideband Optical Modulator and Detector Characterization	2/6/2018
Sequential Peeling: a Model-Based Approach to Structure Identification and De-embedding	6/6/2017
Scaling the Test Equipment Size to Match Millimeter Wave Test Needs	2/14/2017
Modern Architecture Advances Vector Network Analyzer Performance White Paper	11/8/2016
A Guide to Making RF Measurements for Signal Integrity Applications	10/31/2016
Measuring Channel Operating Margin	10/10/2016
Optimizing Your Millimeter-Wave Test Capability White Paper	10/10/2016
PAM4 Demands Accurate S-parameters	9/19/2016
Using VNA’s as a Tool for Signal Integrity in High Speed Digital Systems	5/3/2016
Pulse-to-Pulse Stability Measurements	10/29/2014
Technologies and approaches for improved mixer measurements	9/15/2014
Open-ended coaxial probe for permittivity measurements to 125 GHz	9/15/2014
Higher Data Rates Require New De-embedding Techniques	8/19/2013
Overcoming High-Speed Interconnect Challenges	8/19/2013
Signal Integrity- Frequency Range Matters	8/19/2013

Case Study	Release Date
activCirk looks to Anritsu's VectorStar broadband VNA system for its unsurpassed performance in device modeling	3/31/2016

Catalog	Release Date
Precision RF & Microwave Components Catalog	6/30/2020

Quick Reference Guide	Release Date
VectorStar Broadband/Banded Millimeter-Wave Module Reference Manual	11/15/2019
365xx-x Mechanical Calibration Kits Reference Manual	3/27/2018
3655x Waveguide Calibration Kit Coefficients	7/29/2014
3656B W1 (1mm) Calibration and Verification Kit Product Summary	3/26/2013

Quick Start Guide	Release Date
366xX-1 Verification Kits and 3-2300-527 (67688) Performance Verification Software for VectorStar MS4640B Series VNAs	10/4/2017
VectorStar MN4690C Series Multiport VNA Test Set Quick Start Guide	7/14/2017
VectorStar 2300-531-R MS464x Instrument Test Software Quick Start Guide	9/8/2016
VectorStar MN4690B Series Multiport VNA Test Set Quick Start Guide	10/21/2009

Operations Manual	Release Date
VectorStar MS464xB Operation Manual	6/5/2020

User Guide	Release Date
VectorStar MS464xB Series User Interface Reference Manual	6/5/2020
3659 0.8 mm Calibration/Verification Kit and 2300-580-R System Performance Verification Software User Guide	1/28/2020
3656B W1 Calibration/Verification Kit and 2300-584-R System Performance Verification Software User Guide	8/29/2019
366xX-1 Verification Kits and 2300-579-R Performance Verification Software Application	10/4/2017

Measurement Guide	Release Date
VectorStar MS464xB Series Calibration and Measurement Guide	6/5/2020

Instruction Sheet	Release Date
Connector Care Instruction Sheet	10/8/2019

Installation Guide	Release Date
VectorStar ME7838A4 Multiport Broadband VNA Installation Guide	12/19/2019
Multiport VectorStar MN4690C Installation Guide	7/14/2017
VectorStar Pulse Modulator Test Set SM66xx Installation Guide	2/8/2017
Multiport VectorStar MN4690B Installation Guide	7/14/2010

Online Help System	Release Date
VectorStar MS464xB Online Help System	6/5/2020

Programming Manual	Release Date
VectorStar MS464xB Programming Manual	6/5/2020
VectorStar MS464xB Programming Manual Supplement	9/30/2016

Maintenance Manual	Release Date
VectorStar MS464xB Maintenance Manual	4/10/2019
VectorStar MN469xC Series Multiport Test Set Maintenance Manual	3/27/2018
Precision AutoCal 36585 Series Reference Manual	5/27/2015
VectorStar MN4690B Series Multiport Test Set Maintenance Manual	11/16/2011

Articles	Release Date
VNA Eases On-Wafer Measurements to 110GHz	10/5/2011

https://www.anritsu.com/en-US/test-measurement/

Since its founding in 1895, Anritsu has been a pioneer in the telecommunications field, marking its 120 years of growth with achievements that include creating the world’ s first practical wireless telephone, which paved the way for today’s smartphones. We would like to express our sincere gratitude to our customers and everyone else who has made this possible.

With its measurement business as the pillar supporting the further advancement of its mobile broadband services, Anritsu offers solutions that are indispensable for building a safer and more secure society in a broad range of fields including quality assurance inspection equipment for foods and pharmaceutical products, remote monitoring and control systems, traffic shapers, and high-speed electronic devices.