Probe Systems
Products
![FormFactor - Cascade EPS200MMW - mmW probing up to THz and load-pull FormFactor - Cascade EPS200MMW - mmW probing up to THz and load-pull](/sites/default/files/styles/max_650x650/public/eps200mmw-pm8-probesystem-vdi_0.jpg?itok=_VE9Evly)
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Combined eye-pieces and CCD camera mount
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3x zoom and quick lens exchange
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Engraved guides on mmW platen
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Supports broadband, load pull, coax RF and banded waveguide configuration
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Rock-solid mechanical design
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Submicron stage accuracy
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![FormFactor - Cascade EPS200RF - 200 mm manual probe system for RF test up to 67 GHz FormFactor - Cascade EPS200RF - 200 mm manual probe system for RF test up to 67 GHz](/sites/default/files/styles/max_650x650/public/eps200rf-1.jpg?itok=GB1KCBf9)
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Infinity Probe: best for Al (Si)
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ACP Probe: best for AU (III-Vs)
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|Z| Probe: robust solution (long lifetime)
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RF chuck ±3 μm surface planarity
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Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
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Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
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Automated calibration monitoring
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![FormFactor - Cascade eVue Microscope - Digital imaging system FormFactor - Cascade eVue Microscope - Digital imaging system](/sites/default/files/styles/max_650x650/public/evue-1.jpg?itok=HAGVvO6N)
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Quick and easy probe tip navigation
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Z drive can work in the same range as the chuck
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Enables higher separation gap while the DUT stays in focus
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Automatically configure and optimize performance
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24/7 operating
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Increased MTBF
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Protects the measurement setup
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Prevents involuntary mechanical contact between lens and probes
See more Key Features in Specifications & Features tab
![FormFactor - Cascade Genius Education Kits - Turn-key S-parameter probe station for RF and microwave test FormFactor - Cascade Genius Education Kits - Turn-key S-parameter probe station for RF and microwave test](/sites/default/files/styles/max_650x650/public/mps150-rfgenius-front.png?itok=6hEHWTGA)
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Probe station
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Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
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Choice of probes
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Known measurement accuracy traced back to independent standards
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Uses best measurement practices for optimized measurements
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Best in class RF and Microwave performance
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Small benchtop footprint
See more Key Features on Specifications & Details tab
![FormFactor - Cascade IMS-K-DC - Integrated system with Keysight SPA for DC parametric measurements FormFactor - Cascade IMS-K-DC - Integrated system with Keysight SPA for DC parametric measurements](/sites/default/files/styles/max_650x650/public/ims-k-dc-product-photo.jpg?itok=A1wzyhoq)
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
![FormFactor - Cascade IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements FormFactor - Cascade IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements](/sites/default/files/styles/max_650x650/public/ims-k-lfn-product-photo.jpg?itok=yRHZDQ2t)
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements
![FormFactor - Cascade IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz FormFactor - Cascade IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz](/sites/default/files/styles/max_650x650/public/ims-k-mmwthz-product-photo.jpg?itok=YSzMvdxf)
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz
![FormFactor - Cascade IMS-K-Power - Integrated system with Keysight PDA for power semiconductor device characterization FormFactor - Cascade IMS-K-Power - Integrated system with Keysight PDA for power semiconductor device characterization](/sites/default/files/styles/max_650x650/public/ims-k-power-product-photo.jpg?itok=V1zKutLx)
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements
![FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software](/sites/default/files/styles/max_650x650/public/ims-k-siph-product-photo.jpg?itok=izGjDxyV)
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight Photonics Application