• High Voltage (500V) Input 
• Digital control loop technology 
• Two models: 375W & 750W 
• Up to 750W/500V 
• Parallel up to 8 automatically 
• Modular 
• High Power Density 
• Simple integration

AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.

Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.

From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.

Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.

The optoCAN-FD system can be used for the bidirectional optical transmission of CAN-signals with transmission rates of up to 10 Mbit/s. It consists of two identical battery supplied transceivers connected to each other with an optical fiber. With the optical transmission and the shielded case, the system is well equipped for EMI and EME tests.

The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.

• Vector Network Analyzer Frequency Range from 10 MHz up to 3.2 GHz
• Spectrum Analyzer Frequency Range from 9 kHz up to 3.2 GHz
• -156 dBm/Hz Displayed Average Noise Level (Typ.)
• -98 dBc/Hz @10 kHz Offset Phase Noise (1 GHz, Typ.)
• Total Amplitude Accuracy < 1.2 dB
• 1 Hz Minimum Resolution Bandwidth (RBW)
• All-Digital IF Technology
• Standard Preamplifier
• Distance to fault capability using VNA time domain analysis
• Up to 1.5 GHz Tracking Generator Kit
• Built-in Advanced Measurement capability (CHP, ACPR, OBW, CNR, TOI, etc)
• 10.1 lnch WVGA (1024 x 600) Display

Linea line scan cameras deliver the performance and features usually found in high-end cameras at an attractive price point. Based on advanced CMOS line scan technology, Linea GigE cameras have a 2k or 4k single line 7.04 µm x 7.04 µm pixel array. With excellent sensitivity and speed, Linea surpasses the requirements of demanding applications —such as materials grading and inspection, transportation safety, and general purpose machine vision.

Very useful where space is restricted, the EMC chamber EMC-MC will settle into almost any office space. Its small overall size results from the use of our modular SmartShield chamber lined with our AEPH HyPyr-LossTM absorber technology requiring less volumetric space than in a traditional chamber. This mini compact EMC chamber is applicable in EMC pre compliance and general Research & Development RF testing.

• Reliably and efficiently acquire at up to 25 Gigabit/s per port through onboard packet processing 
• Maintain maximum flexibility with support for generic GigE Vision cameras 
• Readily and cost-effectively support multi-camera setups through two ports, together capable of handling up to 32 cameras 
• Cater to a range of cabling needs with support for copper and fiber-optic Ethernet cabling 
• Directly license Aurora software, formerly Matrox Imaging Software, with integrated license fingerprint and storage 
• Monitor and troubleshoot acquisition performance in detail using Aurora Gecho event-logging tool