Maury MW - VNA Calibration Standard - Short Circuit Termination Series
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Fixed flush and fixed offset short circuit terminations (shorts) are used to establish reference planes in transmission systems and as key elements in the calibration of vector network analyzers (VNAs). Offset shorts can be used for banded calibrations of VNA. Those with the longest offset are often used to evaluate the calibration effectiveness of a VNA by measuring the effective source match after calibration.
|
Frequency Range (Coaxial) |
Frequency Range (Waveguide) |
Reflection Coefficient |
|---|---|---|
|
DC to 67 GHz |
2.6 to 50 GHz | 0.98 to 0.995 |
More Product Information
- Automatic calibration for the whole test frequency range
- Application of all test frequencies automatically. The level can be selected or automatic.
- NO need to manually configure the measurement equipment
- NO need to manually integrate the transfer function of probes and attenuators
- Generation of test reports: NO need to record all values read from the measurement equipment
- Generation of calibration reports: NO need to record all calibration setting parameters
- Rack together and add CS101, CS109, and RS101 (sections 18, 19, and 20 of the RTCA DO-160G are also available.)
Not all amplifiers are created equal, so how can you be certain that an amplifier will work for your needs? You deserve to be confident that the amplifiers used with your test-and measurement lab benches will meet the requirements of your specific applications, are reliable, and are equally well-supported pre-and post-sale. When it comes to application expertise, reliability and support, there is no company that does it better than Maury.
Transcat is your source for premium used test & measurement equipment. We carefully refurbish used test equipment and subject it to an uncompromising calibration and certification process to ensure it is ready for operation on day one. Our 6 month warranty guarantee you a successful used instrument purchase.
- Easy to Use
- No need to break the circuit or insert a shunt
- Small form factors for use on crowded boards
- Variety of Applications
- Bandwidths up to 100 MHz
- Peak currents up to 700 A
- Sensitivities down to 1mA/div
- High Precision Measurements
- Low frequency accuracy of 1%
- Integrated autozero capability
- Fully Integrated with Teledyne LeCroy Oscilloscope
- No additonal hardware is required
- Power is supplied from oscilloscope ProBus connection
- Automatic display of waveforms in Amps and calculated power traces scaled correctly in Watts
- Degauss and Autozero directly from oscilloscope user interface
- DCS025 Deskew Calibration Source
- Provides ability to precisely deskew most voltage probes along with 30, 150 and 500A current probes
Three Probe Technologies
- Infinity Probe: best for Al (Si)
- ACP Probe: best for AU (III-Vs)
- |Z| Probe: robust solution (long lifetime)
- Precision contact on a wide variety of materials from 26 GHz to 67 GHz
- Accurate results with excellent crosstalk
- Matching cables and substrates included
Precise Contact Solution
- RF chuck ±3 μm surface planarity
- Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
- Precision probe alignment
- Consistent contact force and overtravel
- Stable contact performance
WinCal Calibration Software
- Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
- Automated calibration monitoring
- Unique measurement & analysis methods
- Accurate S-parameter measurements
- Automatic calibration setup for higher efficiency
- Fast and easy data interpretation and reporting
- Directly compatible with most commercial VNA’s
- Available as polynomial and characterized device kits
- Measure S-Parameters with uncertainty when used in conjunction with Maury’s Insight software platform
Maury offers coaxial and waveguide VNA calibration kits.
Coaxial calibration kits are offered in Polynomial SOLT, Characterized Device (CD) SOLT, and TRL, depending on the connector series. Where available, CD kits improve calibration accuracy when compared to SOLT kits based on polynomial definitions as each calibration kit is provided with individually characterized short, open and fixed load standards, whose S-parameters can be loaded into commercial VNAs directly or when used with Maury’s Insight™ software platform. When combined with Insight™, users will be able to quantify the uncertainty contribution of their calibration kit to their overall measurements. CD cal kits result in TRL-like accuracy with fixed-load SOLT ease-of-use.
Junkosha’s new mmWave VNA Test Cable Assembly exhibits excellent phase (within +/- 4.5˚ at 50 GHz), and amplitude (within +/- 0.08 dB at 50 GHz) stability in flexure alongside strong phase stability in temperature through its 50 GHz bandwidth, available with NMD connector.
The assembly also displays impressive performance durability, surpassing 40,000 tick tock cycles during testing. The cable is bent 180˚ on a 2.25” radius mandrel with ease, demonstrating superior flexibility and no spring back. A ruggedized port side NMD connector is also available to ensure reliable connections to the VNA.
- Capture/display/analyze peak and average power
- Frequency range from 4 kHz to 40 GHz
- Industry-leading video bandwidth (195 MHz) and rise time (3 ns)
- Industry-leading 100,000 measurements per second
- Industry-leading 100 ps time resolution
- Synchronous multi-channel measurements (up to 4 channels)
- Sensors can be used as standalone instruments
From calibration to consultative support, Transcat ensures you get reliable tools tailored to your needs.
- Calibrated, ready-to-use equipment
- Same-day shipping on most items
- Consultative Services
- Product selection expertise
Maury Microwave
Maury Microwave is a pioneering leader in the design and manufacture of precision RF and Microwave calibration, test & measurement, and modeling solutions that are powering global efforts toward a more secure, more connected, future.
Maury Microwave offers Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50Ω X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters.