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Maury MW - Calibrated Noise Sources - NC346 Series
- Broadband coverage
- Extremely good temperature stability
- Superior voltage stability
- Noise figure meter-compatible
The NC346 Series is designed for precision noise figure measurement applications. Each module’s low VSWR reduces multiple reflections and significantly increases the measurement accuracy for most noise figure test configurations.
|
Calibration |
Temperature Coefficient |
Operating Temperature |
Input Power |
VSWR |
Regulator |
Voltage Coefficient |
|---|---|---|---|---|---|---|
|
1 GHz steps |
Less than 0.009 dB/°C |
0°C to +55°C |
+28 VDC ±2 VDC at 15 mA typical for NC346 A, B & D | Less than 1.15:1 from 10 MHz – 5 GHz for units with 5 – 7 dB or 14 –16 dB ENR | Built-in | < 0.002 dB/%∆V |
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The overall performance of a power meter dependents on the power sensor employed. Maury has a variety of quality power sensors to meet virtually all applications. Maury has a complete line of Peak and Average power sensors up to 40 GHz for all of your fast rise time, wide bandwidth and wide dynamic range applications. In this document, browse through our large variety of advanced sensor solutions.
- S-parameters comparison of user-characterized and factory-characterized verification standards
- S-parameters comparison of user-characterized and factory-characterized verification standards with measurement uncertainty boundaries
- Includes beaded airline, mismatch airline, offset shorts and fixed loads
- Low Noise Amplifier (preamp)
- 9 kHz - 8 GHz
- Typical gain: 27 dB
- Noise Figure: 2.7 dB
- All Digital IF technology
- 10.1” WVGA (1024 x 600) Display
- Frequency range from 9 KHz up to 3.2 GHz
- -161 dBm/Hz Displayed Average Noise Level (Typ)
- -98 dBc/Hz @ 10 khz Offset Phase Noise (Typ)
- Total Amplitude Accuracy < 0.7 dB
- 1 Hz Minimum Resolution Bandwidth (RBW)
- Comes with Preamplifier
- High speed 60 kHz x3 (Color) or 120 kHz (Mono), and high resolution 28 μm or 900 dpi
- No missing or interpolated pixels
- Exposure control
- RGB colors (Color) or Mono/HDR mode
- Precalibrated pixel size for metrology applications
- Camera Link HS fibre interface
- SOSA Aligned
- 3U VPX Form-Factor
- Reduced SWaP applications
- Ruggedization Level 200
- 11 Radial Clock Outputs
- OpenVPX Backplane support for 1000BASE-KX or 10GBASE-KR
- Optional Chip Scale Atomic Clock (CSAC) Holdover
- Optional Low Phase Noise (LPN) Analog output
- Optional secure GPS (M-code)
- Optional Timecode I/O
- Real-Time Full Bandwidth Data Acquisition
- Versatile – Reconfigurable Front End
- Measure: PM / AM / Baseband / Spurious / Jitter
- Isolated AM / PM
- Automated Residual Measurements
- Outstanding Accuracy
The HA7163A is a heterodyne downconversion system that is designed to seamlessly integrate with Holzworth’s real time phase noise analysis products as a calibrated frequency extension. The HA7163A provides for both absolute and residual (additive) measurements to 50GHz, making it the only solution available on the market for taking accurate additive phase noise measurements at frequencies of greater than 18GHz, without using external mixers.
- 5 MHz or 10 MHz Outputs Available
- Reference Frequency Input Option
- Auto Changeover with Ref. Input Option
- Low Phase Noise Outputs
- Twenty four Outputs
- Front Panel Status Indicators
- Fault Discrete Inputs
- Compact 1U, 19” rack mount
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Precision waveguide sections are a useful component in the VNA calibration validation process, and can also be used as sample holders for material measurements.
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Maury Microwave is a pioneering leader in the design and manufacture of precision RF and Microwave calibration, test & measurement, and modeling solutions that are powering global efforts toward a more secure, more connected, future.
Maury Microwave offers Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50Ω X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters.
