Maury MW - VNA Calibration Standard - Mismatch Load Series
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Precision standard mismatches are fixed coaxial terminations, which are used to introduce a known VSWR into a 50 ohm transmission system. These mismatches are extremely useful in a wide variety of applications and are quick and easy to use. They can be used to calibrate swept reflectometers, verify network analyzer calibration, establish impedance references in TDR measurements.
|
Frequency Range |
Measurement Range |
|---|---|
| DC to 50 GHz | 1.2:1, 1.5:1, 2:1 |
More Product Information
- Dual-channel and differential voltage measurements
- 1% accuracy at full scale
- True RMS response below 30 mV
- Optional low-frequency probe for measurements from 10 Hz to 100 MHz
- DC recorder output
- IEEE-488 interface standard, RS-232
The 9240 series is the latest addition to the popular 9200 series of RF voltmeters. It combines accuracy, smart probes, and operator features that have never before been available in its price range. It is simple to use on the bench, and comprehensive enough to integrate into an ATE system. Boonton’s proven voltage probes directly measure from 200 μV to 10 V with usable indication as low as 50 μV and have true RMS response below 30 mV.
Not all amplifiers are created equal, so how can you be certain that an amplifier will work for your needs? You deserve to be confident that the amplifiers used with your test-and measurement lab benches will meet the requirements of your specific applications, are reliable, and are equally well-supported pre-and post-sale. When it comes to application expertise, reliability and support, there is no company that does it better than Maury.
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Precision standard mismatches are fixed coaxial terminations, which are used to introduce a known VSWR into a 50 ohm transmission system. These mismatches are extremely useful in a wide variety of applications and are quick and easy to use. They can be used to calibrate swept reflectometers, verify network analyzer calibration, establish impedance references in TDR measurements.
OptoVue
- Revolutionary technology advancement for wafer and die-level photonics probing
- Real-time in-situ calibrations
- Singulated die testing
- True die-level edge coupling
- In-situ power measurements
- Advanced calibration technologies
- Enables autonomous measurements
Horizontal Die-Level Edge Coupling
- Highest accuracy in test results
- Lowest coupling loss
- Repeatable measurement results due to exclusive automated fiber-to-facet alignment technology
- Reduced risk of damaging fibers with collision avoidance technology
- Ease of use for less experienced users
- Enables close simulation of real-world conditions with device performance closest to the final application
See "Specifications & Details" tab for more key features
The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.
- Complete bias circuits
- Requires no external components
- Optimizations available for frequency range and output levels
The NC520 low voltage (surface mount) noise module is an economic solution for built-in test requirements. It contains complete bias circuits and require no external components.
The surface mount package is suitable for mounting on microstrip. The modules produce extremely flat output power versus frequency characteristic that is insensitive to temperature and voltage variations.
Typical applications for the NC520 module includes built-in test equipment (bite), signal strength meters for cellular, pcs, catv, calibrators, spectrum analyzers, radar warning receivers (rwr), and dither A/D quantization error. Maury can optimize frequency range and output levels for specific applications.
- Directly compatible with most commercial VNA’s
- Available as polynomial and characterized device kits
- Measure S-Parameters with uncertainty when used in conjunction with Maury’s Insight software platform
Maury offers coaxial and waveguide VNA calibration kits.
Coaxial calibration kits are offered in Polynomial SOLT, Characterized Device (CD) SOLT, and TRL, depending on the connector series. Where available, CD kits improve calibration accuracy when compared to SOLT kits based on polynomial definitions as each calibration kit is provided with individually characterized short, open and fixed load standards, whose S-parameters can be loaded into commercial VNAs directly or when used with Maury’s Insight™ software platform. When combined with Insight™, users will be able to quantify the uncertainty contribution of their calibration kit to their overall measurements. CD cal kits result in TRL-like accuracy with fixed-load SOLT ease-of-use.
- Real-Time Full Bandwidth Data Acquisition
- Versatile – Reconfigurable Front End
- Measure: PM / AM / Baseband / Spurious / Jitter
- Isolated AM / PM
- Automated Residual Measurements
- Outstanding Accuracy
The HA7163A is a heterodyne downconversion system that is designed to seamlessly integrate with Holzworth’s real time phase noise analysis products as a calibrated frequency extension. The HA7163A provides for both absolute and residual (additive) measurements to 50GHz, making it the only solution available on the market for taking accurate additive phase noise measurements at frequencies of greater than 18GHz, without using external mixers.
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz
Maury Microwave
Maury Microwave is a pioneering leader in the design and manufacture of precision RF and Microwave calibration, test & measurement, and modeling solutions that are powering global efforts toward a more secure, more connected, future.
Maury Microwave offers Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50Ω X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters.