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8 Independent Channels, 2 Output Connectors
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Includes built-in pre-programmed sequencing.
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Provides control for computational imaging, including photometric stereo, extended depth of field, combined bright field + dark field, high dynamic range, and high resolution color.
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Ideal for multi-channel lights and multi-light stations. Due to power output constraints, some configurable light lengths may be limited.
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Housed within a compact enclosure with DIN rail mounting.
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Driven with SignaTech™ for improved safety and easy operation.
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NOTE: NOT COMPATIBLE WITH C1 CONNECTORS
Amplifier Research - Multi-Tone Test Systems
AR’s state-of-the-art multi-tone systems are designed to test RF Radiated and Conducted Immunity faster than ever before. Both the MT2IEC10V3M and MT4IEC10V3M fully comply with IEC 61000-4-3:2020 Edition 4, allowing for multiple tone testing, reducing test time by up to 74%. Commercial, aviation, and automotive industries, will perform RF radiated and conducted immunity testing faster, more accurately, more efficiently, and more closely to a real-world environment.
With the inclusion of instrumentation hardware and AR’s emcware® software, the MT2IEC10V3M and MT4IEC10V3M are full turn-key systems in one rack, capable of producing 18 V/m CW (10 V/m AM). The MT2IEC10V3M reduces test time by up to 50% and the MT4IEC10V3M reduces test time by up to 74%. Customized systems achieving higher field strengths are also available, using this approach.
AR Multi-Tone Testing Systems offer a complete testing solutions to the following standards:
Radiated Immunity
- EN/IEC 61000-4-3
- ISO11452-2 Auto (ALSE)
- ISO11452-3 Auto (TEM cells)
- ISO11451-5 Auto (Strip Line)
- ISO11451-2 Full Vehicle
- DO-160 Section 20.5 (Substitution Method)
- EN/IEC 60601-1, -2
- EN 50130-4
- EN 61000-6-1/2
- EN 55024
Conducted Immunity
- EN/IEC 61000-4-6
- ISO11452-4 Auto (BCI Method)
- DO-160 Section 20.4 (Substitution Method)
- MIL STD 461 CS114
- EN/IEC 60601-1, -2
Model Number |
Description |
---|---|
Full turn-key system in one rack allowing for two-tone multi-tone testing. Capable of producing 18 V/m CW (10 V/m AM) |
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Full turn-key system in one rack allowing for four tone multi-tone testing. Capable of producing 18 V/m CW (10 V/m AM) |
More Product Information
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NTP time server
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PTP v2 Grand Master Clock
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PTP v2 Transparent Clock
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PTP v2 Slave Clock
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NTP client
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PTP protocol supports:
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Multicast
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Layer 2 or IP
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2-step clock
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Peer-to-Peer (P2P) or End-to-End (E2E) delay mechanism
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Built-in GPS receiver (GMC variant) with time accuracy to absolute time < 50ns (with GPS lock)
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PTP accuracy < 20 nanosecond (*)
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4 x 10/100/1000BASE-T(x) ports
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4 x 10/100/1000BASE-X combo ports
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Wide operating temperature: [-40°F to 158°F] / [-40°C to 70°C]
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100-240AC power input
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Network redundancy: RSTP protocol
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Network management: Web, telnet, CLI and SNMP v1/v2/v3 with RMON
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Multicast filtering: IGMP snooping or static multicast filters
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IEEE802.1Q VLAN
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Event notification: through Syslog, Email, and SNMP trap
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Calibrated for high absolute accuracy
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Fast response time
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Capable of measuring from -70 to +275 degrees C.
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Rugged sensor packages, qualified to same rigorous standards applied to electronic gages
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Double-ended design supports multiplexing of many sensors on one fiber
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Included in ENLIGHT’s sensor templates – allows for quick and easy optical to mechanical conversions
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Fiber coupled to allow easy movement
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Ultra-broadband measurement
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Transmitted or reflected data collection
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Mates with collinear adapter (AXA40n1)
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High signal to noise ratio
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Hot swappable with other transmitters
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Low noise to enable rapid data collection
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Adjustable lens tube for focusing
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Multiple lenses available
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Enables wafer probing up to 100 A pulsed and 10A DC
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Innovative multi-fingertip design provides even distribution of current
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Supports up to 500 V
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Replaceable Tungsten probe tips
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Temperature range of -60°C to 300°C
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Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
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Prevents against thermal runaway
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Measure devices on wafer at higher currents than ever before
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Small scrub minimizes damage to aluminum pad
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Small footprint – tip fits on a 1 mm pad
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Modular
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Assemble your own system. Plug-in RF modules and COTS-based CPUs, GPUs, FPGAs. Selection of JTNC SCA devices (Ethernet, GPS, audio, etc.)
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Multi-Domain
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Use across your entire organization. Develop for tactical radio, radar, electronic warfare, and signal intelligance domains
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Integrated
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Accelerate time to market with seamlessly integrated hardware an d osftware. Leverage pre-loaded NordiaSoft SCARI Software Suite
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Multi-Purpose
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Reduce cost. Support full life cycle development. Simulate design, emulate, and test on one integrated system
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Scalable
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Protect your investment. Benefit from a true component-based architecture for hardware and software
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Universal
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Future-proof your products. Leverage open, standards-based COTS software and hardware
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Monochrome (G-419B) and color (G-419C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system cost
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
AR E-field generators offer exceptional uniformity between the elements. Our ATE10K30M uses low inductance high-power internal load resistors to terminate RF power, and offers well-matched input VSWR. The ATE10K100M is our own patent-pending folded-dipole type design. And we haven’t yet found a test object the ATE10K25M–1 can’t handle.
These rugged, dependable high gain log periodic antennas give you the constant high intensity fields you need for RFI and EMI testing in and out of a shielded room. They deliver frequency response and field intensity beyond the norm. AR’s log periodics are designed for high power radiated testing and can be calibrated for emissions.
Their lightweight modular design makes assembly and relocation easy. And they’re built tough, so they can withstand extreme temperatures.
Amplifier Research
Founded in 1969, Amplifier Research is a world-class source for broadband high power, solid state, RF amplifiers and microwave amplifiers, TWT amplifiers, log periodic antennas and high-gain horn antennas, plus EMC test equipment, software and field probes and monitors. Throughout its 50 years (and counting), AR has been responsible for a number of “firsts” which have transformed not only EMC and RF testing but also the industries and equipment affected by these tests. A sampling of these innovations includes:
- 10,000-watt tube amplifiers,100-watt solid-state • 100-1000 MHz instantaneous bandwidth Class A amplifier
- First production 16,000-watt solid-state linear amplifier from 10 kHz to 225 MHz
- 50,000-watt Class A power amplifier up to 225 MHz
- 0.7 to 6 GHz high-power Class A & AB amplifier
Additionally, they push the limits of state-of-the-art design and have ruggedized their products to make them virtually indestructible. AR amplifiers are fully tested to the extreme to ensure customers receive a product that is built to last.
Contact Details
Amplifier Research Corporation, Ametek CTS
160 Schoolhouse Rd., Souderton, PA 18964-9990, USA
Phone: 215-723-8181
Customer Service: 215-723-0275