Amplifier Research - Multi-Tone Test Systems
AR’s state-of-the-art multi-tone systems are designed to test RF Radiated and Conducted Immunity faster than ever before. Both the MT2IEC10V3M and MT4IEC10V3M fully comply with IEC 61000-4-3:2020 Edition 4, allowing for multiple tone testing, reducing test time by up to 74%. Commercial, aviation, and automotive industries, will perform RF radiated and conducted immunity testing faster, more accurately, more efficiently, and more closely to a real-world environment.
With the inclusion of instrumentation hardware and AR’s emcware® software, the MT2IEC10V3M and MT4IEC10V3M are full turn-key systems in one rack, capable of producing 18 V/m CW (10 V/m AM). The MT2IEC10V3M reduces test time by up to 50% and the MT4IEC10V3M reduces test time by up to 74%. Customized systems achieving higher field strengths are also available, using this approach.
AR Multi-Tone Testing Systems offer a complete testing solutions to the following standards:
Radiated Immunity
- EN/IEC 61000-4-3
- ISO11452-2 Auto (ALSE)
- ISO11452-3 Auto (TEM cells)
- ISO11451-5 Auto (Strip Line)
- ISO11451-2 Full Vehicle
- DO-160 Section 20.5 (Substitution Method)
- EN/IEC 60601-1, -2
- EN 50130-4
- EN 61000-6-1/2
- EN 55024
Conducted Immunity
- EN/IEC 61000-4-6
- ISO11452-4 Auto (BCI Method)
- DO-160 Section 20.4 (Substitution Method)
- MIL STD 461 CS114
- EN/IEC 60601-1, -2
Model Number |
Description |
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Full turn-key system in one rack allowing for two-tone multi-tone testing. Capable of producing 18 V/m CW (10 V/m AM) |
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Full turn-key system in one rack allowing for four tone multi-tone testing. Capable of producing 18 V/m CW (10 V/m AM) |
More Product Information
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Ease of installation, simple and repeatable installation
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Discrete, low profile, multipoint up to 96 sensors on a single HYPERION instrument
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Multiparameter various physical parameters measurements coupled onto the same instrumentation platform
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Long distance, with over 10km of coverage
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Dual Voltage ranges that support over voltage testing on 480V based systems
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Instrument Setups for quickly re-establishing the known instrument state
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500uS time resolution for Transients
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Virtual Panels control software included
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Non-Linear current waveform programming during Load mode
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Phase coordination among multiple units (LKM/LKS)
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Powerful set of analog controls for PHIL and Modulation tests
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Trigger In & Out to permit extensive coordination with external systems
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Extensive Onboard diagnostics
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Digital I/O, including RS232, USB, Ethernet (GPIB optional)
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Intuitive 5” color display for ease of navigation
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Auto-paralleling for maximum flexibility with multi-chassis configurations
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Separate terminal blocks for single phase and 3 phase outputs
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Allows TekProbe interface level II probes to work with any ProBus-equipped Teledyne LeCroy oscilloscope
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Automatic probe detection
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Provides all necessary power and offset control to the attached probe
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Supports probes up to 4 GHz
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Easy firmware updates
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Wide variety of probes supported including:
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Preamplifiers
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Current Probes
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Single-Ended Active Probes
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Differential Active Probes
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- Reduce service stoppages with a fanless design
- Inspect multiple sites through the support for four GigE Vision and four USB3 Vision cameras
- Simplify cabling for GigE Vision installations using Powerover-Ethernet (PoE)-enabled ports
- Tackle deep learning and traditional machine vision applications with a mobile-class embedded twelfth-generation Intel Core processor
- Connect separately to the factory floor and enterprise networks via two more Gigabit Ethernet ports
- Synchronize with other equipment using the integrated real-time digital I/Os with rotary encoder support and RS-232/RS-485 ports
- Streamline application development using the Aurora Design Assistant flowchart-based IDE or the Aurora Imaging Library SDK
- Tackle machine vision applications with utmost confidence using field-proven tools for analyzing, locating, classifying, measuring, reading, and verifying
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Designed specifically for temperature compensation of os3100 strain gages relief.
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Ruggedized, weldable sensor package
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Qualified to same rigorous standards applied to electronic gages
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Spot-weld, epoxy, or screw mounted.
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Double-ended design supports multiplexing of many sensors on one fiber
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Included in ENLIGHT’s sensor templates – allows for quick and easy optical to mechanical conversions
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Tests FMCW radio altimeters including CDF types
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Fast detector for tracking LPI radio altimeters with TX power management
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Direct-connect to UUT transmit/receive port or to installed system via antenna couplers
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Ratio-metric RF loop test allows TX, RX, antenna or feeder faults to be identified
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Programmable multi-leg climb/descend profiles
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Large color touch-screen display with simple user interface
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Remote control interface (Ethernet)
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Lightweight and compact
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Battery 4 hours plus duration
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Software upgradeable
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A TEM horn antenna compliant with IEC 61000-4-39 Ed.1.
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Test without changing the antenna in the frequency range of 380MHz to 6GHz.
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Low VSWR and high GAIN enable efficient electromagnetic wave radiation.
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Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT.
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Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Ice- and condensation-free probing down to 77 K (liquid nitrogen) or below 20 K (liquid helium)
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Probe positioners placed inside vacuum chamber
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Joystick controller
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Manual probe positioners with rotary feed-throughs
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User-centered design minimizes training costs and enhances efficiency
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Comprehensive alignment functions – from simple wafer alignment and mapping to automated alignment and test of multiple singulated chips, like IR – Focal Plane Arrays
4U and 5U expansion chassis with ample power to run lots of PCIe slots and host multiple option cards. Provide total bidirectional throughtput between a host system and a target expansion system, delivering expanded I/O capabilities needed to support evolving workloads.
- Up to 18 Additional PCIe 3.0 Slots - Incorporate up to 18 additional PCIe 3.0 slots, allowing you to scale your system in response to your most complex application or program needs.
- System Design Flexibility - Connect host card to any system with a x16 slot. Easily add or remove I/O devices or make changes to existing components.
- Performance Optimization - Offload tasks from the host system and dedicate specific tasks to separate option cards, reducing congestion, latency, and resource contention.
Amplifier Research
Founded in 1969, Amplifier Research is a world-class source for broadband high power, solid state, RF amplifiers and microwave amplifiers, TWT amplifiers, log periodic antennas and high-gain horn antennas, plus EMC test equipment, software and field probes and monitors. Throughout its 50 years (and counting), AR has been responsible for a number of “firsts” which have transformed not only EMC and RF testing but also the industries and equipment affected by these tests. A sampling of these innovations includes:
- 10,000-watt tube amplifiers,100-watt solid-state • 100-1000 MHz instantaneous bandwidth Class A amplifier
- First production 16,000-watt solid-state linear amplifier from 10 kHz to 225 MHz
- 50,000-watt Class A power amplifier up to 225 MHz
- 0.7 to 6 GHz high-power Class A & AB amplifier
Additionally, they push the limits of state-of-the-art design and have ruggedized their products to make them virtually indestructible. AR amplifiers are fully tested to the extreme to ensure customers receive a product that is built to last.
Contact Details
Amplifier Research Corporation, Ametek CTS
160 Schoolhouse Rd., Souderton, PA 18964-9990, USA
Phone: 215-723-8181
Customer Service: 215-723-0275