• Reduced dark noise levels and improved dark offset 
• Improved sensitivity, including NIR response 
• In-camera image pre-processing (lens shading correction, pixel correction) 
• Large full well when using in-sensor binning >142Ke 
• Thousands of frames per second in Partial Scan Mode (ROI) 
• Multi-ROI support (up to 32 ROI) and Cycling Mode 
• Advanced Sequencer functions of different features

• Choice of Series resistance or Termination (signal line to ground)
• Use of High Performance RF Resistors
• Choice of Resistor values available
• Choice of body styles, Infinity, ACP or FPC
• Can help to stabilize oscillations in high-gain devices
• Impedance match to low dynamic resistance laser diodes
• Custom configured for your application

An EMC Chamber with 5 meter test range ensuring EMC compliance testing for Emission and Immunity testing. Ferrite and hybrid pyramidal absorbers are combined in a unique pattern within a SmartShield high performance chamber. Operating at a 5m test distance, this EMC chamber is compliant to CISPR-16-1-4 / ANSI C63.4 with a measurement zone diameter of 2 to 4 meters.

• The Narrow Linear Diffuse Light series is ideal for precision scanning of highly reflective materials. 
• The DL151 is available in a wide range of wavelengths and provides up to 28kLux at a 1” (25mm) standoff. 
• The extruded aluminum enclosure can be expanded in 2″ (51mm) increments from 2″ to 70″ (1778mm).

AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.

Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.

From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.

Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.

The Xena B720/2400 is a 4U modular chassis that can be equipped with up to 12 Ethernet test modules to provide high port density and low power consumption.

There are 2 versions of the Xena chassis: the standard B720 and the high-performance B2400.

• Dual Voltage ranges that support over-voltage testing on 480V-based systems 
• Separate terminal blocks for single-phase and three-phase AC power supply outputs 
• High Power AC and DC Source 
• Auto paralleling for higher power system expansion 
• Single and three-phase modes 
• Arbitrary & Harmonic Waveform Generation 
• Standard LXI LAN, USB, and RS-232, Optional GPIB 
• Step, list, and pulse voltage transients with down to 500usec resolution 
• Complete avionics power quality test suites 
• 15kVA to 1MVA Power Levels 
• Intuitive 5” color display for ease of navigation 
• Internationally accepted test routines for EMI/EMC, Safety Compliance