AMETEK - Avionics ATE Power Subsystem for Transportable Military Test Stand
Power Subsystem for Transportable Military test stand
- Provides eight channels of programmable DC power with output isolation function
- Output disconnect function
- Total control via Ethernet within power supply
- Mounted in custom in transportable shock-mount case
More Product Information
- Eight channel, universal, 2-/4-wire RTD simulator
- Fast, monotonic, glitch-free resistance value programming
- Suitable for simulating resistors, platinum/copper/nickel RTDs
- Suitable for pulsed and continuous excitation inputs
- Direct temperature value programming
- Extensive triggering capability
- Synchronize level changes with input measurements to facilitate test sequencing
- The Direct PC bus access data acquisition system provides the required sampling rate and resolution to meet IEC 61000-4-7 measurement requirements and supports high-speed data transfers.
- PC-based Harmonic and Flicker test software provides real-time full-color data display updates and continuous PASS/FAIL monitoring.
- Automatic calculation of the maximum permissible system impedance Zsys, using the Zref and measured Flicker parameters, as required per EN/IEC 61000-3-11.
- Intuitive operating software provides IEC test setup, data analysis, display, with test reports in and MS Word format.
- High resolution, no gap acquisition data storage to ensure that all data can be streamed to disk (in ASCII format if needed) for later review and replay of the actual test.
- Single Step and Fast playback mode of test results.
- High Power Density: Up to 15 kW in 3U, 30 kW in a 6U chassis
- Wide Voltage Range: 0-10V up to 0-1000V, from 4 to 30 kW
- Fast Load Transient Response: Protection from undesired voltage excursions
- Low Ripple and Noise
- Intuitive Touch Screen Display
- Parallelable up to 150 kW
- Sequencing: Free system controller & speed up test
- Low audible noise: Temperature controlled variable speed fans
- Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
- Guarantees fully-guarded measurements to fA and fF levels
- Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
- Allows probing of different pad materials and sizes
- Fast replacement of worn probes without the need for tools
- Support the most high-performance Camera Link cameras with available support for Full and 80-bit mode at up to 85 MHz
- Perform deterministic image acquisition by way of the jitter-free Camera Link 2.1 interface
- Maximize system compatibility with the choice of PCIe® 2.1 x1, x4 or x8 connectivity
- Eliminate missed frames with ample onboard buffering and PCIe bandwidth
- Optimize multi-camera applications via support for up to four Base or two Full/80-bit Camera Link cameras per board
- Minimize space requirements and maximize PC compatibility through a half-length design with mini Camera Link connectivity for true single-slot operation
- Improve and simplify system connectivity with Power-overCamera-Link (PoCL) support at extended cable lengths
- Smallest size: 11.75 x 21.9 x 16 mm including controller
- Closed-loop controller embedded in micro stage
- No separate electronics needed
- 3.3 VDC input
- Direct input of motion commands (I2C, SPI, UART or analog servo)
- Angular resolution ~ 0.022 deg closed loop Absolute encoding and position feedback
- Millisecond step and settle times
- Point-to-point angular positioning with closed-loop bandwidth ~100Hz
- Holds position with zero power and no jitter
- Fast integration for embedded motion in smaller instruments
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- Guaranteed performance to 43.5 GHz with Extended K™ ports
- High output power allows measurement of high attenuation devices
- Wide dynamic range enables measurement of very low reflection artifacts
- Excellent corrected directivity minimizes measurement uncertainty
- SmartCal™ auto calibration unit reduces calibration and setup time
- Time domain with time gating option grants easier and faster fault identification
- Modern LAN interface for remote control is faster than GPIB
- A common GUI and SCPI interface within the ShockLine family
- Bias tee option simplifies test setups where the DUT needs DC biasing
- Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction
- E-Band VNA
- Extended frequency range covering E-band and major parts of V band
- Fully assembled test system eliminates setup errors and increases reliability
- Tethered modules connect directly to the DUT increasing measurement stability
AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.
Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.
From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.
Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.
AMETEK Programmable Power
Programmable Precision AC & DC Sources, Loads and Custom Power Solutions