• Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
• Online design configuration tool helps you to specify your probe in minutes
• All designs are fully quadrant compatible
• Full solution includes probes, calibration substrates, stations, accessories and software
• Scalable architecture for future needs

EMI Camera for Low Emission / High Field Use

• 30x Optical Zoom
• Low light uses 0,05 lux (day) and 0,005 lux (night)
• Integrated microphone
• Battery or wall-powered
• Single Fiber operation (duel direction)
• Local controls on back (zoom/pan/tilt/focus/..)
• Options for Pan/Tilt, Joystick, HIRF, recording, motion triggering, OCR, ...

• Ideal for engineering lab use 
• Digital features with analog controls 
• Remote control for bench, system & ATE applications. 
• "P" models have RS-232, USB & LAN (LXI compliant, class C) standards. 
• S-Lock: Set and lock the voltage. 
• V-Span: user-defined voltage limits 
• Small benchtop footprint

• Hardware Agnostic: Digitizer COTS Server
• LAN/WAN Resilient: Lossless transmission protocol network bandwidth reduction
• Multi-Mission: Radio validation, RF compatibility, in-orbit operations in LEO, MEO, GEO
• Cortex Hereitage, Cortex ICD and configuration management (CTX and MCS files)

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz

• Spin mode is a dynamic mode intended to provide a simulation of a spinning satellite. 
• Enhanced Eclipse mode is a dynamic mode that allows the user to easily program and initiate an eclipse event with total control over all of the V-I curve parameters and dwell times. 
• Operates with Sequential Shunt Regulators and Maximum Power Point Trackers 
• Multiple redundant OVP/OIP layers

• PowerFlex design provides higher currents at lower voltages enabling one model to meet many different voltage/current requirements. 
• Compact design for bench use or rack mounting (1/2 or 1/4 rack width) 
• True analog controls with digital settings locking (S-Lock) 
• Mixed-mode regulation with linear final regulation for low noise 
• Dual models have isolated voltage tracking and synchronous on/off. 
• P models have RS-232, USB, and LXI-compliant LAN interfaces plus duplicate rear terminals. GPIB Optional.

The VTI Instruments 16-Channel bridge and strain gauge measurement instrument

• 24-bit, delta-sigma ADC, simultaneous sampling
• Programmable Sample Rate up to 128kSPS
• Full, Half & Quarter Bridge with 120Ω, 350Ω & 1kΩ bridge completion
• Voltage Excitation: 0.5V to 10V
• Current Excitation: 0.46mA
• 2-Wire & 4-Wire Ohms/RTD
• Bridge Zero Balancing
• Built-In-Self-Test (BIST)
• Strain Lead Wire Calibration
• Shunt Calibration: 50kΩ, 100kΩ & External provided by User
• TEDS Support
• LXI Ethernet Interface
• IEEE-1588 Synchronization
• Power over Ethernet (PoE) or 10–50 V DC input
• Built-in Parallel Data Streaming
• Full-featured Embedded Web Interface
• Compact 1U Half-rack Form Factor

• The Direct PC bus access data acquisition system provides the required sampling rate and resolution to meet IEC 61000-4-7 measurement requirements and supports high-speed data transfers.
• PC-based Harmonic and Flicker test software provides real-time full-color data display updates and continuous PASS/FAIL monitoring.
• Automatic calculation of the maximum permissible system impedance Zsys, using the Zref and measured Flicker parameters, as required per EN/IEC 61000-3-11.
• Intuitive operating software provides IEC test setup, data analysis, display, with test reports in and MS Word format.
• High resolution, no gap acquisition data storage to ensure that all data can be streamed to disk (in ASCII format if needed) for later review and replay of the actual test.
• Single Step and Fast playback mode of test results.