Only BSDL files required to get the board up and running  Set up pin states – e.g. low, high, toggling  Trace shorts, opens and other signals  Easy low-level access to device pins/busses  Clear display of the pins/balls with variable zoom levels and split screen  View JTAG chain data as waveforms  Quickly find and monitor changing pins  Program devices with SVF and STAPL files  Real-time interaction  XJIntegration (use XJAnalyser functionality from other software)

Reduce your time spent debugging boards due to high precision fault isolation  Improve your time to market and reduce project risk by early design verification  Reduce your test development time by reusing tests from prototype/design in manufacturing and field support  Ongoing time savings by test reuse across projects

Reduce flash programming times  SPI, QSPI, parallel NOR flash devices supported  Support for NAND flash devices available on request  Shortened development cycles  No need for additional equipment  Can be used for fast firmware upgrade  No FPGA development required

Repair-focused environment for XJDeveloper / XJRunner tests.  Full Connection test.  RAM, Flash and other non-JTAG device tests.  Flash, FPGA, CPLD and EEPROM programming.  Layout Viewer* to show the physical location of faulty nets, pins and components.  Schematic Viewer* to show the circuit design around faults.  Direct control of the pins/balls of JTAG devices.  View pin states graphically in real time or capture them in the Waveform Viewer.  Trace signals to identify shorts, opens and other faults.

Improve reliability of your boards by increasing analogue and digital test coverage  Reduce your debug time by enhanced fault isolation  XJTAG can reduce the cost and complexity of your custom test jigs  Reach your devices on non-JTAG boards with ‘Black box’ testing

Small, lightweight, portable design: ideal for lab and field work  Self-contained licence so you can use the XJTAG system on multiple PCs  Re-configurable unit for multiple UUTs saving costs

Improves your QA through configurable logging  Allows you to retain power of control on how boards are tested by third parties  User-friendly environment reduces your training costs for production operatives  Ability to test multiple boards, simultaneously, by using multiple XJLinks

Reduce service stoppages with a fanless design Inspect multiple sites through the support for four GigE Vision and four USB3 Vision cameras Simplify cabling for GigE Vision installations using Powerover-Ethernet (PoE)-enabled ports Tackle deep learning and traditional machine vision applications with a mobile-class embedded twelfth-generation Intel Core processor Connect separately to the factory floor and enterprise networks via two more Gigabit Ethernet ports Synchronize with other equipment using the integrated real-time digital I/Os with rotary encoder support and RS-232/RS-485 ports

Tackle demanding imaging applications using an eighth-generation Intel Core processor Capture directly from GigE Vision® and USB3 Vision® cameras Broaden support for Camera Link® , CoaXPress® , DisplayPort, HDMI, and SDI video interfaces using Zebra frame grabbers Customize I/O capabilities through four PCIe slots accepting full-height, half-length cards Install in space-limited industrial environments given its small footprint and rugged design Streamline application development using the Aurora Design Assistant flowchart-based IDE or the Aurora Imaging Library SDK

Leverage dual-camera single-laser design to deliver exceptionally high 3D reproduction fidelity  Scan scenes quickly with profiling rates of up to 11,000 per second  Gain from unique embedded algorithms to generate consistent profiles, depth maps, or point clouds  Benefit from truly standard GigE Vision® interface to work directly with Zebra Imaging and third-party vision software  Simplify cabling with Power-over-Ethernet (PoE) support  Deploy confidently in tough industrial settings thanks to a solid IP67-rated2 aluminum housing and M12 connectors  Benefit from several fastening points to facilitate fixing one or more sensors to gantries and robots 

Solve machine vision applications efficiently by constructing flowcharts instead of writing program code, using field-proven tools for analyzing, classifying, locating, measuring, reading and verifying Use a single program for creating both application logic and operator interface Leverage deep learning for visual inspection through image classification and segmentation tools Rely on a common underlying vision library for the same results with an Iris GTX smart camera, vision systems or third-part computer Work with multiple cameras all within the same project or per project running concurrently and independently from one another, platform permitting

Solve applications rather than develop underlying tools by leveraging a toolkit with a more than 25-year history of reliable performance Tackle applications with utmost confidence using field-proven tools for analyzing, classifying, locating, measuring, reading and verifying Base analysis on monochrome and color 2D images as well as 3D profiles, depth maps and point clouds Harness the full power of today's hardware through optimizations exploiting SIMD, multi-core CPU and multi-CPU technologies Support platforms ranging from smart cameras to HPCs via a single consistent and intuitive API