VTI Instruments - EX1200 Series Sensor Simulator (EX1200-7008)
- Eight channel, universal, 2-/4-wire RTD simulator
- Fast, monotonic, glitch-free resistance value programming
- Suitable for simulating resistors, platinum/copper/nickel RTDs
- Suitable for pulsed and continuous excitation inputs
- Direct temperature value programming
- Extensive triggering capability
- Synchronize level changes with input measurements to facilitate test sequencing
The EX1200-7008 is a multichannel resistance temperature detector (RTD) sensor simulation card, with the versatility to precisely simulate a variety of RTD types on a single module. This card provides eight channels of independent resistance outputs, which can be configured under program control to characterize the behavior of a measurement/signal conditioning system. Synchronized simulation of multiple channels can be used to create virtual thermal environments for evaluating the performance of safety systems.
SUPERIOR ACCURACY AND STABILITY
The EX1200-7008 implements advanced solid-state servo mechanisms to produce bounce-less changes in the resistance, and smooth ramps at the required rate of change. Ageing effects are nullified, as the resistance value is continuously monitored in a closed loop and corrected for errors.
WIDEST RANGE OF SIMULATION
Each EX1200-7008 can be programmatically configured to simulate platinum, copper, and nickel RTD types with configurable co-efficient values, and meets the DIN, IEC, JIS, 1989, and ITS-90 curve fitting standards. Required temperature values can be directly commanded, eliminating the need to derive conversion algorithms in application software. Resistance values up to 6500 Ω with 125 mΩ resolution can be realized, with the ability to achieve 20 mΩ resolution for lower ranges. It can also accept continuous or pulsed type current excitation sources, which makes it truly “universal”. It can even be used in cryogenic applications.
More Product Information
VXI Chassis include 6-slot VXIbus mainframes (CT-100C), 5-slot VXIbus mainframes (CT-310A), and modular 13-slot VXIbus mainframes (CT-400, pictured).
- Highest resolution – 12 bits all the time
- More capability – integrates multiple instruments into one
- Comprehensive probe support – supports over 30 probes in 9 categories
- MAUI with OneTouch user interface for intuitive and efficient operation
The EMX-2500 is a Gigabit Ethernet LXI Controller for the EMX Series of PXIe Instruments.
- 96 digital lines configurable as either input or output
- Five available power supply rails for custom designs
- Mix and match with standard SMIP switching and digital I/O modules to create high density configurations
- VXI plug&play driver simplifies software development
- On-board connector header for simplified migration to PCB implementation
- Access to 16 MHz clock for use in complex designs
- Multiple front panel connector options
- 4-Channel, 204.8 Ksa/s per channel, 24-Bit DACs
- -115 dB spurious free dynamic range
- Integrated 2-Channel 64-bit tachometer
- Integrated 4-Channel DIO
- Tight synchronization with DSA analyzers
- Ideal for rotational measurement, and stimulus-response applications such as vibration test
- Output modes including Sine, Burst Sine, Chirp, Burst-random and continuous random
- Eight channel, universal, 2-/4-wire RTD simulator
- Fast, monotonic, glitch-free resistance value programming
- Suitable for simulating resistors, platinum/copper/nickel RTDs
- Suitable for pulsed and continuous excitation inputs
- Direct temperature value programming
- Extensive triggering capability
- Synchronize level changes with input measurements to facilitate test sequencing
- Combine up to 12 fail-safe building blocks, dual SPDT, SP4T, SP6T, or transfer switch in a compact 1U footprint
- Front “pluggable” relays facilitate field maintenance
- Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world
- Flexible API supports IVI and Linux development environments minimizing software investment
- LXI Trigger Event implementation provides seamless test synchronization with external devices
- Store up to 128 relay state configurations for quick recall, including an automatic power up state
- Define exclude lists to avoid setting an undesirable configuration
- Relay odometer tracks closures to facilitate preventative maintenance
- 24-bit, delta-sigma ADC, simultaneous sampling
- Programmable Sample Rate up to 128kSPS
- Full, Half & Quarter Bridge with 120Ω, 350Ω & 1kΩ bridge completion
- Voltage Excitation: 0.5V to 10V
- Current Excitation: 0.46mA
- 2-Wire & 4-Wire Ohms/RTD
- Bridge Zero Balancing
- Built-In-Self-Test (BIST)
- Strain Lead Wire Calibration
- Shunt Calibration: 50kΩ, 100kΩ & External provided by User
- TEDS Support
- LXI Ethernet Interface
- IEEE-1588 Synchronization
- Power over Ethernet (PoE) or 10–50 V DC input
- Built-in Parallel Data Streaming
- Full-featured Embedded Web Interface
- Compact 1U Half-rack Form Factor
The EMX-4xxx product family contains high-performance breakout boxes (EMX-4008 and EMX-4016), smart high density dynamic signal analyzers (EMX-4250 and EMX-4251), smart PXIe 625 KSA/s 4-channel digizers (EMX-4350), and charge and IEPE PXIe 625 KSA/s 4-channel digitizers (EMX-4380).
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