Optical Component Test
Products
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Accurate return loss (RL) and insertion loss (IL) analyzer
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Track and analyze return loss (RL) and insertion loss (IL) versus length
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Analyze components in both reflection and transmission
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Spectral analysis of IL and RL
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Automatic RL/IL event detection
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Measurement length to 500 m (in reflection, with Luna 6435)
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Remote control via SCPI commands
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Single scan measurement of IL, RL and PDL
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High resolution (1.6 pm) and sensitivity (80 dB dynamic range)
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Integrated tunable light source
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Measure in transmission or reflection
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Complete full band measurement scan in less than 3 seconds
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User-friendly interface
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Distributed reflectivity measurement
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Event detectionLarge RL range
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High spatial resolution
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Clear identification of large and small peaks enables easier data interpretation
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Single measurement, all-parameter analysis
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Full characterization of components in less than 3 seconds
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Complete polarization response
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With single scan, simultaneously measure loss, polarization, dispersion, phase and time domain response
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Available for C and L band, or O band
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30 ms measurement speed
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Wide wavelength range
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High PDL accuracy
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OLED display and analog output
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User calibration function to optimize DOP and SOP accuracies at arbitrary wavelengths and temperatures
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Real time Poincaré Sphere display, analog voltage output for SOP/DOP/power for ATE integration
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Data logging of SOP up to 1 billion points
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Averaged DOP measurement function for scrambled-input measurement
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Flexible setup for different measurements
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Simultaneous measurement of DGD, SOPMD, PDL
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Jones or Mueller Matrix methods
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Free space PSA input enables absolute SOP measurements
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GPIB control of external lasers
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High crosstalk sensitivity
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High spatial resolution
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Large fiber measurement range