Easy-to-use UI (“2-clicks” to get a stream running) Wide range of optical & copper test modules for testing all speeds up to 800GE Thor-400G-7S-1P & Thor-100G5S-1P are the only test modules on the market that can test AN/ LT as well as PAM4-based speeds (50, 100, 200 and 400GE) and NRZ based speeds (10, 25, 40, 50 and 100GE)

World’s fastest production line tester Ultra-simple web-browser UI - 3 clicks to complete test cycle Seamless parallel test case execution Displays test status, progress, and real time logs

Responsive and easy to use management software Highly scalable UDP/TCP layer 4 traffic generation High performance TLS testing suite

Xena OpenAutomation (XOA) is an open-source test automation framework for use with Xena’s Valkyrie & Vulcan Traffic Generation & Analysis (TGA) solutions and Chimera, our network impairment emulator. Fast, easy to use and extremely flexible, XOA features a Python API that runs on any OS.

Fast flash programming  Increases UUT test coverage with additional interface connectivity  Easy integration with XJTAG test systems

Only BSDL files required to get the board up and running  Set up pin states – e.g. low, high, toggling  Trace shorts, opens and other signals  Easy low-level access to device pins/busses  Clear display of the pins/balls with variable zoom levels and split screen  View JTAG chain data as waveforms  Quickly find and monitor changing pins  Program devices with SVF and STAPL files  Real-time interaction  XJIntegration (use XJAnalyser functionality from other software)

Reduce your time spent debugging boards due to high precision fault isolation  Improve your time to market and reduce project risk by early design verification  Reduce your test development time by reusing tests from prototype/design in manufacturing and field support  Ongoing time savings by test reuse across projects

Reduce flash programming times  SPI, QSPI, parallel NOR flash devices supported  Support for NAND flash devices available on request  Shortened development cycles  No need for additional equipment  Can be used for fast firmware upgrade  No FPGA development required

Repair-focused environment for XJDeveloper / XJRunner tests.  Full Connection test.  RAM, Flash and other non-JTAG device tests.  Flash, FPGA, CPLD and EEPROM programming.  Layout Viewer* to show the physical location of faulty nets, pins and components.  Schematic Viewer* to show the circuit design around faults.  Direct control of the pins/balls of JTAG devices.  View pin states graphically in real time or capture them in the Waveform Viewer.  Trace signals to identify shorts, opens and other faults.

Improve reliability of your boards by increasing analogue and digital test coverage  Reduce your debug time by enhanced fault isolation  XJTAG can reduce the cost and complexity of your custom test jigs  Reach your devices on non-JTAG boards with ‘Black box’ testing

Small, lightweight, portable design: ideal for lab and field work  Self-contained licence so you can use the XJTAG system on multiple PCs  Re-configurable unit for multiple UUTs saving costs

Improves your QA through configurable logging  Allows you to retain power of control on how boards are tested by third parties  User-friendly environment reduces your training costs for production operatives  Ability to test multiple boards, simultaneously, by using multiple XJLinks