Products
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Reduce flash programming times
SPI, QSPI, parallel NOR flash devices supported
Support for NAND flash devices available on request
Shortened development cycles
No need for additional equipment
Can be used for fast firmware upgrade
No FPGA development required
Repair-focused environment for XJDeveloper / XJRunner tests.
Full Connection test.
RAM, Flash and other non-JTAG device tests.
Flash, FPGA, CPLD and EEPROM programming.
Layout Viewer* to show the physical location of faulty nets, pins and components.
Schematic Viewer* to show the circuit design around faults.
Direct control of the pins/balls of JTAG devices.
View pin states graphically in real time or capture them in the Waveform Viewer.
Trace signals to identify shorts, opens and other faults.
Improve reliability of your boards by increasing analogue and digital test coverage
Reduce your debug time by enhanced fault isolation
XJTAG can reduce the cost and complexity of your custom test jigs
Reach your devices on non-JTAG boards with ‘Black box’ testing
Small, lightweight, portable design: ideal for lab and field work
Self-contained licence so you can use the XJTAG system on multiple PCs
Re-configurable unit for multiple UUTs saving costs
Improves your QA through configurable logging
Allows you to retain power of control on how boards are tested by third parties
User-friendly environment reduces your training costs for production operatives
Ability to test multiple boards, simultaneously, by using multiple XJLinks