Schneider Optics - AMBER Large Format Lenses
- Image circle: 43.2 mm - 82 mm
- 4 focal lengths: 40 mm - 100 mm
- Homogeneous imaging performance across the entire image field
- Very low distortion and high resolution
- V38-Mount, compatible to theV38 mounting system
- Initial apertures: F2.8 - F5.6
Our AMBER Lenses for Large Format Sensors
This vibration-resistant lens is designed for use with large-area and line-scan sensors in harsh conditions, as encountered in many industrial applications. Its highly homogeneous imaging performance across the entire image field, combined with low chromatic aberrations and geometric distortions, ensures very high image quality across a wide magnification range. The V38 mount is compatible with the modular V38 system and its wide range of accessories, including focusing mounts, extension tubes and camera adapters.
Discover the compatibility of AMBER lenses with top sensor brands
Check out the optimal sensor compatibility for AMBER lenses. Our selection includes a variety of compatible sensors from leading manufacturers such as Sony, OnSemi, GPixel, Teledyne e2V, ams. Improve your imaging efficiency and accuracy with the ideal lens-sensor combination.
The V38-Mount System for AMBER Lenses
The compact and robust V38-Mount System, consisting of Schneider-Kreuznach lenses in a special iris mount, focusing mounts, extension tubes and camera adapters. It is the best choice for larger image circles and flexible flange-to-image distances. The system can be adapted on many different cameras for industrial and scientific applications. For assembly in reverse position special adapters are available which can be screwed into the filter thread of the lens.
The V38-Mount System provides a uniform interface with three lock-screws that engage into a groove. This guarantees a stable and durable connection and makes it possible to use multiple combinations of the individual components.
Lens Models
|
Lens |
Focal Length |
Aperture Range |
Max. Sensor Size |
Mount |
Special Feature |
Datasheet |
|---|---|---|---|---|---|---|
|
40 mm |
F2.8-F22 |
(43.2 mm) |
V38-Mount |
- |
||
|
60 mm |
F4.0-F32 |
(62.5 mm) |
V38-Mount |
- |
||
|
80 mm |
F4.0-F32 |
(82 mm) |
V38-Mount |
- |
||
|
100 mm |
F5.6-22 |
(82 mm) |
V38-Mount |
- |
Didn't find the right fit?
If these models don’t meet your requirements or specifications, explore our complete lens portfolio using our lens selector.
Applications & Markets of the AMBER lens
Machine vision enables machines to recognize objects, patterns and other visual features through the integration of lenses and image processing.
>>>Automated Optical Inspection
Automated optical inspection (AOI) uses cameras and software to inspect and analyze components for defects in a manufacturing process.
PCB inspection is the checking of printed circuit boards for faults and deviations to ensure that they meet the requirements.
In Logistics vision systems can scan the dimensions and volume of objects to calculate weight and palletize them.
Environmental Facts of the AMBER lenses
Our AMBER V38 lenses are tested to DIN standards to ensure they meet stringent environmental requirements. These tests check the durability of the V38 lenses, their resistance to temperature changes and their ability to withstand shock tests and sinusoidal vibration. This ensures that the industrial lenses are up to the task in demanding industrial applications such as machine vision or automated optical inspection, providing consistent performance and reliability over time.
Testing Criteria for Environmental Durability
|
Slow Temperature Cycling |
Damp Heat, Cyclic |
Shock Testing |
Sinusoidal Vibration |
|---|---|---|---|
|
-25°C - +70°C 5 cycles a 12h DIN ISO 9022-2-14-03 -1 |
-23°C - +40°C 80% - 95% rel. humidity DIN ISO 9022-2-16-01-1 |
50 g / 11 ms 18 shocks DIN ISO 9022-3-30-06-1 |
2 g 10-500 Hz DIN ISO 9022-3-36-04-1 |
Optical Filters
By protecting the lens, eliminating unwanted wavelengths and enhancing contrast, optical filters improve the image quality of your lens in industrial applications.
>>>You may need an optical filter as well? Click here for more information
More Product Information
The CISPR25 emc chamber is designed for emc compliance benchtop testing of automotive components and wiring harnesses . The MVG CISPR25 emc chamber is designed for the emc measurements using the requisite 1 m test distance and for a “typical bench” configuration of 2.5 m x 1.0 m. The unique design requires less volumetric space than traditional absorbers and still provides the volume required to have the requisite distances between the EUT and the walls and the emc absorber and the walls & ceiling. The chamber is designed with anechoic treatment that meets the specified attenuation in the CISPR 25 standard, and it is designed to meet the Long Wire testing specified in Annex J. The polypropylene emc absorber does not undergo the typical age-related deterioration of the typical “foam” polyurethane absorbers. The UH-series, polypropylene emc absorber is also applicable to the radar pulse testing required in some automotive test standards.
- 1.3" (24 mm) max. sensor size
- Resolution down to 2.4µm pixel size
- Low chief ray angle suits all SONY Pregius™ generations
- 8 focal lengths: 16 mm - 50 mm
- Initial aperture: F2 - F2.8
- Extremely high resolution down to 2.8 µm pixel size
- Very large image circle of 82 mm
- Optimized for 5x magnification
- Suitable for line and array sensors
- Working with SONY IMX461, IMX661, IMX811 and others
- Interchangeable steel dipping caps
- V-Mount for easy installation
- Extremely fast lens with F0.95
- 1" (16 mm) max. sensor size
- C-Mount lens
- Focal length: 25 mm
- Version with fixed iris F0.95 available
Very useful where space is restricted, the EMC chamber EMC-MC will settle into almost any office space. Its small overall size results from the use of our modular SmartShield chamber lined with our AEPH HyPyr-LossTM absorber technology requiring less volumetric space than in a traditional chamber. This mini compact EMC chamber is applicable in EMC pre compliance and general Research & Development RF testing.
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Die-to-die stepping time of under 100 ms
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Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
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Even extreme variations in height, such as the case with warped wafers, can be compensated
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Interfaces to all major analysis instrumentation, optics software and testers
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Access to top side and bottom side of device under test (DUT)
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Highly accurate light measurement
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Test automation out-of-cassette for 24/7 operation
See more Key Features on Specifications & Details tab
- All-in-One Support for RF Measurements and Protocol Tests in FR1 (to 7.125 GHz) and FR2 (Millimeter Wave) Bands
- Supports mm-wave band RF measurements and beam forming tests combined use with the RF chamber.
- Flexible Platform using Modular Architecture
- Supports Existing LTE Test Environment
- Supports various functional tests by GUI operation only without requiring difficult scenario development
- Measures maximum IP data throughput for wide variety of band, CA, and MIMO combinations
Note: The design, explanation and appearance are subject to change without notice.
- Extremely high resolution down to 3.5µm pixel size
- Image circle: 62.5 mm - 82 mm
- Optimized for specific magnifications
- 11 magnifications available: 0.07x - 2.0x
- Version with Beamsplitter available
- Best azimuth marking
- V70-Mount for easy installation
- Device and operation according to the standard IEC 60811-504
- The complete set consists of various winding spindles and cable guides for various diameters: Winding spindles: 10, 12, 14.5, 18, 22, 27, 33.5, 41, 50 mm | 0.4, 0.5, 0.57, 0.7, 0.86, 1.06, 1.32, 1.61, 1.96 Inch outer diameter; Cable guides: 3.2, 4, 5, 6.2, 7.7, 9.6, 12, 15 mm | 0.12, 0.15, 0.19, 0.24, 0.30, 0.38, 0.5, 0.59 Inch inner diameter
- The winding spindles and cable guides interlock easily and are easily fastened
- Maneuver Ratio: 5/1: 5x Crank rotation = 1x spindle rotation
- Spindle/Guide diameter ratio: 0.8x sample diameter
- Device suitable for positioning in a cold chamber - Product No.: 402.0020.04
Schneider Optics
Large Format, Telecentric and Line Scan Lensing
