Goepel - SCANFLEX II - JTAG/Boundary Scan Controller for Embedded Test and Programming
SCANFLEX II CUBE is the new generation modular JTAG/Boundary Scan controller. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for the Embedded JTAG Solutions. The multifunctional architecture of the SCANFLEX II CUBE allows users to combine numerous technologies flexibly and with high performance on a single platform.
- 8 independent and parallel Test Access Ports (TAP) for up to 100 MHz
- Synchronized operation of embedded test, debugging and programming
- Programmable multifunctional 64 channel I/O signal unit
- Programmable TAP protocols for numerous processor debug interfaces
- Support of up to 31 parallel controlled SCANFLEX I/O modules
- Controllable via USB 3.0 and GBit LAN
Embedded Board Test: significantly improved test depth for complex boards even without the need for needles
Embedded Functional Test in parallel with Embedded Programming
No external programmers necessary
Now available as 19 inch rack version
SCANFLEX® II BLADE 4 RMx1/2/3
1, 2 or 3 SFX II BLADE 4 in a 19 inch 1U housing
- the industrial version of the SCANFLEX II CUBE in a 19 inch 1U housing with 1, 2 or 3 units
- four independent and parallel Test Access Ports (TAP) for up to 100 MHz
- support of up to 30 parallel controlled SCANFLEX I/O modules
- each individual controller is independent, with separate USB/LAN and power port
SCANFLEX® II BLADE 8 RMxX-A/B/C
Two times eight TAPs (Test Access Ports) for executing a variety of different test projects simultaneously
- unified control platform with 1 x 8 or 2 x 8 independent, true parallel Test Access Ports (TAP) for up to 100 MHz
- 1 or 2 programmable, multifunctional 64-channel I/O mixed-signal units
- support of up to 30 or 60 SFX I/O modules
- USB 3.0 and Gbit LAN control interfaces
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More Product Information
SCANFLEX II CUBE is the new generation modular JTAG/Boundary Scan controller. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for the Embedded JTAG Solutions. The multifunctional architecture of the SCANFLEX II CUBE allows users to combine numerous technologies flexibly and with high performance on a single platform.
- 8 independent and parallel Test Access Ports (TAP) for up to 100 MHz
- Synchronized operation of embedded test, debugging and programming
- Programmable multifunctional 64 channel I/O signal unit
- Programmable TAP protocols for numerous processor debug interfaces
- Support of up to 31 parallel controlled SCANFLEX I/O modules
- Controllable via USB 3.0 and GBit LAN
- support of many programmable devices, e.g. eMMC, NOR and NAND, CPLDs, FPGAs
- programming interfaces e.g. SPI, SWD, I2C, JTAG, UART, DAP
- support of data streaming for flexible programming data handling
- real parallel high-speed programming
- FlashFOX® master unit with up to 8 high-speed programming channels to the POD
- very compact POD unit for easy integration into ATE systems
- simple adaptation to existing systems on the hardware side
- API available for easy software integration in existing systems
- suitable for industrial use in 24/7 operation
- anti-piracy protection (security)
The BARCUDA VP230 is the right system if you are looking for a complete turnkey solution for flexible testing and programming of your electronic assemblies. The stand-alone unit uses the technologies of embedded JTAG solutions such as VarioTAP or ChipVORX. However, you can also expand these to meet the functional test requirements of your electronics production.
With BARCUDA VP230 you can test and program assemblies with or without JTAG/Boundary Scan - with no need to configure a special in-house test system.
With a standard, robust interface "VPC G12 Receiver" from Virginia Panel Corporation (VPC), you can choose the adapter supplier (for needle bed adapters) for contacting your assembly and implement any mechanical requirements.
BARCUDA VP230 is equipped with a complete power-up unit and TAP control for 16 boards, which can be scaled up to 32 boards. It can also be expanded with analogue measurement cards, additional I/O channels and your specific hardware.
RAPIDO is a multi-site programmer for inline programming and testing.
Are you developing your next electronic assembly and are dealing with "test and programming" concerns?
Your complex boards feature difficult to contact fine-pitch components (e.g. BGA, FPGA) while test and programming still must be efficient?
RAPIDO is an outstanding, "lightning-fast" solution for programming and test using embedded system access (ESA) technologies. Special mechanics ensure precise board contacting from both sides, even for high probe counts.
The system can easily be integrated into a production line, keeping up even with high-volume manufacturing cycle times.
SCANBOOSTER II
- controller for Embedded Testing and Programming
- high flexibility through multifunctional I/O channels for mixed-signal tests ·
- modularity and scalability due to configurable TAP Interface Cards
- integrated compact unit controllable via USB 2.0 and GBit-LAN
PicoTAP ATE
- Controller for embedded testing and programming
- Low-cost module with high performance and multifunctional architecture
- available in a housing or as a PCBA for spacesaving installation in the test system
- integrated compact unit controllable via USB 2.0
JULIET is a professional JTAG / Boundary Scan Tester suitable for production. It combines the complete system electronics together with the adaptation of the UUT via an exchangeable adaptor in a compact system.
The JULIET testers are based on standard components like SYSTEM CASCON™, SCANBOOSTER™, and SCANFLEX® II, hence they are compatible to systems already used in development, and flexibly upgradable. A total of six different JULIET versions cover all possible production applications, from the simple test execution to the complete repair station with graphical failure visualisation, and make the system ideal for fast prototyping and low volume production.
- a fully integrated software platform
- maximum productivity due to intelligent tools
- maximum safety for the test vectors
- extended test depth for non-scannable circuitry
- combination of state-of-the-art test and programming strategies
- deep interaction and integration capability for other ATEs
- maximum modularity and scalability
- personalisation of the entire system (myCASCON)
- support during the entire product life cycle
- a portfolio containing more than 100 software tools and edition
Goepel Electronics
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With advanced testing and inspection systems for electronic assemblies and printed circuit boards, GÖPEL electronic helps discerning customers from various industry sectors to maintain their commitment to quality.
The company’s wide range of technology provides a basis for finding manufacturing defects at every stage of the product life cycle – from design to end-of-line.
