No Internal Valve

Parts in compliance with all SMOT document requirements.

Aperture field probe systems are used to evaluate the extraneous signals that exist in the area surrounding the device under test due to reflections and other transmitting sources.

MVG offers a complete range of field probes of varying sizes and configurations to meet diverse testing requirements.

NEO 901 3000 PSI Adapters

• Up to 96 differential channels per full rack mainframe 
• Constantly monitor input signals for fault conditions 
• Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths 
• Inputs can be masked, inverted, and combined to produce interrupts 
• Can be used as a time stamp module and as a digital I/O 
• Programmable debounce circuitry prevents erroneous readings 
• 10 V and 100 V input ranges 
• On-board memory stores events with IEEE 1588 timestamps 
• Synchronize reading of input states with other scanned analog channels

• 24-bit, delta-sigma ADC, simultaneous sampling 
• Programmable Sample Rate up to 128kSPS 
• Full, Half & Quarter Bridge with 120Ω, 350Ω & 1kΩ bridge completion 
• Voltage Excitation: 0.5V to 10V 
• Current Excitation: 0.46mA 
• 2-Wire & 4-Wire Ohms/RTD 
• Bridge Zero Balancing 
• Built-In-Self-Test (BIST) 
• Strain Lead Wire Calibration 
• Shunt Calibration: 50kΩ, 100kΩ & External provided by User 
• TEDS Support 
• LXI Ethernet Interface 
• IEEE-1588 Synchronization 
• Power over Ethernet (PoE) or 10–50 V DC input 
• Built-in Parallel Data Streaming 
• Full-featured Embedded Web Interface 
• Compact 1U Half-rack Form Factor

NEO X01 3000 PSI Adapters

NEO X05 5080 PSI Adapters