Webinar

Analytical waveform views, Measurement Parameters, Parameter Testing

Debug Embedded Systems with Your Oscilloscope - Part One: Signal Display and Measurement Fundamentals

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Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Signal Display and Measurements

In this session (Part 1), we will discuss the various signal display and measurement tools available in oscilloscopes and how to avoid the traps and pitfalls that lead to inaccurate or inefficient measurements. We will also review how to extract circuit details from both short and long record acquisitions to aid in debugging of embedded designs.

Topics to be included:

  • Improving measurements with multi-grids
  • Analytical waveform views
  • Using measurement parameters effectively
  • Best uses of statistical data and views
  • Pass/Fail parameter testing

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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