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FormFactor - Akari - Multi-site and single-site cards for LED testing

FormFactor - Akari - Multi-site and single-site cards for LED testing

Long life probe over 15M touch downs on gold pads Accurate tip positioning enables pad size reduction, allowing more die per wafer for higher throughput, and more...
FormFactor - Altius - Enables test of high performance very large I/O logic devices with fine pitch micro-bumps

FormFactor - Altius - Enables test of high performance very large I/O logic devices with fine pitch micro-bumps

Minimum grid-array pitch of 45 µm Ultra-low probe force for direct probing on copper through silicon vias or solder microbumps, ~1 gram per probe at...
FormFactor - Apollo - Designed for fine-pitch flip-chip applications with high current carrying capability - copper pillar and solder bumps

FormFactor - Apollo - Designed for fine-pitch flip-chip applications with high current carrying capability - copper pillar and solder bumps

Broad range of vertical and vertical MEMS probe options, scalable to 80 um pitch Proprietary manufacturing technology for reduced Cres and improved wafer yield...
FormFactor - Cantilever - Wafer test probe cards for fine pitch, wire bond logic devices

FormFactor - Cantilever - Wafer test probe cards for fine pitch, wire bond logic devices

Supports 40 um pitch, 20/40 um staggered design Short-beam option for high speed testing, up to 3 GHz @-3 dB Uniform scrub performance for...
FormFactor - Genus - 300 mm NAND Flash Probe Card Architecture

FormFactor - Genus - 300 mm NAND Flash Probe Card Architecture

Increase throughput to test in excess of 35,000 probes Test speeds of 125 MHz capable Scalable 2D MEMS MicroSpring™ technology enables...
FormFactor - HFTAP Series - High Frequency Test at Probe

FormFactor - HFTAP Series - High Frequency Test at Probe

K32 (up to 3.2 GHz/6.4 Gbps) high-speed test capable at wafer level Supports advanced packaging requirements for at speed testing Enables testing...
FormFactor - Hikari - CMOS image sensor probe card

FormFactor - Hikari - CMOS image sensor probe card

Optimized array configuration with parallelism for fewer touchdowns – industry’s first x32 and x64 arrays in production Small scrub mark over wide...
FormFactor - Kepler™ - High parallelism vertical probe card for large active area

FormFactor - Kepler™ - High parallelism vertical probe card for large active area

Thermally stable vertical spring architecture to support wide temperature range of automotive test requirement Excellent XYZ tip position performance...
FormFactor - PH Series - For integrated, wafer testing with probe head sizes ranging from 50 mm to 100 mm

FormFactor - PH Series - For integrated, wafer testing with probe head sizes ranging from 50 mm to 100 mm

3D MEMS MicroSpring contact design with high pin count and small pad size capability Wide temperature compatibility for more controlled probing and faster setup,...
FormFactor - Pyramid Accel Test Fixture Probe Card

FormFactor - Pyramid Accel Test Fixture Probe Card

Excellent signal integrity, all the way to the package DUT pin. Multi-DUT capability enables faster debug of complex test programs. Compatible...
FormFactor - Pyramid Calibration Substrate

FormFactor - Pyramid Calibration Substrate

Ability to match DUT layout improves RF calibration for better yield Reduced site-to-site variation in probe cards eliminates the need for correlation...
FormFactor - Pyramid Parametric Probe Card

FormFactor - Pyramid Parametric Probe Card

Guarded traces to probe tips with lowest leakage Excellent measurement fidelity with low leakage (1 fA/V), fast settling time, and reduced cross talk...
FormFactor - Pyramid RF - High-performance RF probe card for wireless RF and microwave production test

FormFactor - Pyramid RF - High-performance RF probe card for wireless RF and microwave production test

High-bandwidth RF microstrip transmission lines to probe tips guarantee performance and ensure low signal loss. Patented ground and power planes, with bypass...
FormFactor - Pyramid-MW Probe Card

FormFactor - Pyramid-MW Probe Card

Ship high-yield KGD: Consistent low contact resistance and low-inductance probe tips ensure accurate and repeatable mmW RF measurements. Stable DUT operation:...
FormFactor - QiLin - For advanced wafer-level chip scale packaged (WLCSP) devices with a pitch range of 250-500μm

FormFactor - QiLin - For advanced wafer-level chip scale packaged (WLCSP) devices with a pitch range of 250-500μm

Broad range of spring pins options for targeted application, with pitch ranging 250 – 500 um Variety of tip materials for maximum lifetime...
FormFactor - SmartMatrix - Full-area 300-mm wafer testing for advanced devices

FormFactor - SmartMatrix - Full-area 300-mm wafer testing for advanced devices

Higher parallelism, higher test efficiency, and lower cost of test by using Advanced TRE technology (ATRE) Excellent contact stability and electrical performance...
FormFactor - TouchMatrix - For 200 mm and 300 mm NAND and NOR Flash wafer testing

FormFactor - TouchMatrix - For 200 mm and 300 mm NAND and NOR Flash wafer testing

One-touchdown probing Field-adjustable planarity Efficient, high-integrity electrical test  
FormFactor - TrueScale - For advanced wire bond logic and SoC devices

FormFactor - TrueScale - For advanced wire bond logic and SoC devices

Support for single-row pad layout down to 50 um pitch Excellent positional accuracy over more than 1 million touchdowns Minimization of false test failures Wire...