Reduce flash programming times  SPI, QSPI, parallel NOR flash devices supported  Support for NAND flash devices available on request  Shortened development cycles  No need for additional equipment  Can be used for fast firmware upgrade  No FPGA development required

Repair-focused environment for XJDeveloper / XJRunner tests.  Full Connection test.  RAM, Flash and other non-JTAG device tests.  Flash, FPGA, CPLD and EEPROM programming.  Layout Viewer* to show the physical location of faulty nets, pins and components.  Schematic Viewer* to show the circuit design around faults.  Direct control of the pins/balls of JTAG devices.  View pin states graphically in real time or capture them in the Waveform Viewer.  Trace signals to identify shorts, opens and other faults.

Improve reliability of your boards by increasing analogue and digital test coverage  Reduce your debug time by enhanced fault isolation  XJTAG can reduce the cost and complexity of your custom test jigs  Reach your devices on non-JTAG boards with ‘Black box’ testing

Small, lightweight, portable design: ideal for lab and field work  Self-contained licence so you can use the XJTAG system on multiple PCs  Re-configurable unit for multiple UUTs saving costs

Improves your QA through configurable logging  Allows you to retain power of control on how boards are tested by third parties  User-friendly environment reduces your training costs for production operatives  Ability to test multiple boards, simultaneously, by using multiple XJLinks