VTI Instruments - EX1200 Series Digital I/O (EX1200-7500)
- Eight ports of 8 I/O bits each
- High current capability for control of external relays, 300 mA sink
- Simulate and receive digital data at up to 2 MHz sample rates
- Selectable output voltages range from 3.3 V to 60 V
- Setup outputs and scan inputs as part of EX1200 measurement sequencing engine
The EX1200-7500 is a high-performance I/O module with eight 8-bit ports (64 channels). Each port may be configured as an input or output under program control. The I/O may be single buffered, to provide real time data access, or double buffered, to provide synchronized data.
The EX1200-7500 has the flexibility to source the input and output clocks from the front panel allowing very large numbers of channels to be synchronized to collect or present data to a UUT. Additionally, input data can be timestamped to IEEE-1588 precision as part of the EX1200 scan engine. Deep on board memory (up to 1 MB) can be used to generate patterns on output channels at rates up to 2 MHz. In order to ease overall system cabling, all clamping diodes and open collector channels can be pulled up internally, rather than on a per channel basis.
Each channel can sink 300 mA, and includes built-in clamping diodes making this module ideal for driving and sensing external devices such as relays.
More Product Information
- Eight ports of 8 I/O bits each
- High current capability for control of external relays, 300 mA sink
- Simulate and receive digital data at up to 2 MHz sample rates
- Selectable output voltages range from 3.3 V to 60 V
- Setup outputs and scan inputs as part of EX1200 measurement sequencing engine
- High power density in 1U / 2U / 4U / 14U chassis up to 18kVA
- Intuitive touch panel control
- Innovative iX2™ current doubling technology
- Multi-language display for global operation
- Auto paralleling for higher power
- Single phase 1U models and 1 or 3 phase selectable 2U / 4U / 14U models
- Complete avionic test suites (optional)
- ATE version available in 1U, 2U and 4U models
- Standard LXI LAN, USB and RS232, optional GPIB
- Legacy CSW5550 Emulation on the AST6003A1 Model
Optimized Measurement Setup
- Multi-purpose SIGMA instrument integration kit
- Shorter cabling and universal chuck connection
- Triax probe with protected guard
- Optimized signal path
- Safe probe tip exchange
- Seamless integration of various analyzers
High Power Chuck
- Triax design for low-leakage measurements up to 3 kV
- Special chuck surface coating
- High-isolation ready
- High-current measurement up to 100 A with lowest contact resistance
- Optional upgrade for 10 kV (coax) operating voltage
- Thin wafer handling capability
Safe Operation
- Arcing protection
- Shield Enclosure with interlock
- Advanced grounding concept
- Maximum protection from high-voltage shock for users and devices
- Common ground protection for all instruments
- EMI/light-tight shielded environment
- 96 digital lines configurable as either input or output
- Five available power supply rails for custom designs
- Mix and match with standard SMIP switching and digital I/O modules to create high density configurations
- VXI plug&play driver simplifies software development
- On-board connector header for simplified migration to PCB implementation
- Access to 16 MHz clock for use in complex designs
- Multiple front panel connector options
- 4 Independent Channels
- 1Ω Resistance Increments
- Precision Sensor Simulation Capability
- Low Thermal Offset
- Independent Sense Feedback
- Parallel and Series Operation
- Dynamic Soft Front Panel
- IVI-COM, IVI-C, LabVIEW™ Drivers
- Monitoring the Set Values Without Disconnecting Channels Connections
- 3-Year Warranty
PureLine 3 Technology
- Provides an effectively noise free environment around the device under test (DUT)
- First automated probe station to achieve -190dB spectral noise*
- Up to 32x lower noise (1kHz), for improved device characterization and modelling at the 7/5/2 nm technology nodes targeted for 5G and beyond applications
- Eliminates over 97% of the environmental noise experienced in previous probe systems
- Extensive collection of FormFactor patents, electrical design knowledge, and measurement system IP
Plug In and Go
- World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
- Eliminates all ground-loop induced TestCell noise
- Low field emissions
- Provides fully managed and filtered AC power to the entire system, prober and instruments
See "Specifications & Details" tab for more key features
- Up to 96 differential channels per full rack mainframe
- Constantly monitor input signals for fault conditions
- Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
- Inputs can be masked, inverted, and combined to produce interrupts
- Can be used as a time stamp module and as a digital I/O
- Programmable debounce circuitry prevents erroneous readings
- 10 V and 100 V input ranges
- On-board memory stores events with IEEE 1588 timestamps
- Synchronize reading of input states with other scanned analog channels
- Combine up to 12 fail-safe building blocks, dual SPDT, SP4T, SP6T, or transfer switch in a compact 1U footprint
- Front “pluggable” relays facilitate field maintenance
- Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world
- Flexible API supports IVI and Linux development environments minimizing software investment
- LXI Trigger Event implementation provides seamless test synchronization with external devices
- Store up to 128 relay state configurations for quick recall, including an automatic power up state
- Define exclude lists to avoid setting an undesirable configuration
- Relay odometer tracks closures to facilitate preventative maintenance
High density switch matrix models in 1 wire and 2 wire configurations
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