• All-in-one microstage - no separate controller 
  • Direct high-level command interface (I²C or SPI) 
  • USB adapter enables direct connection to PC 
• Small: < 32x32x11 mm including controller 
• Absolute encoding: high repeatability, no homing 
• Low power: 6 VDC, ~5 W (only when moving) 
  • For integration into battery powered devices 
• Long stroke: 15 mm 
• High force: 1 N (~100g load vertical, ~200g horizontal) 
• High stiffness with crossed roller bearing design

• Device is according to the standard IEC 60811 -501, -507 (heat elongation test, tensile test)
• The samples are taken from the inner side of the sheath and isolator
• All grooves and/or conductive layers are removed
• Developed to slice samples according to IEC 60811 with a thickness between 0.8 and 2.0 mm (0.04” – 0.08”)

• Device and operation according to the standard IEC 60811-504
• The complete set consists of various winding spindles and cable guides for various diameters: Winding spindles: 10, 12, 14.5, 18, 22, 27, 33.5, 41, 50 mm | 0.4, 0.5, 0.57, 0.7, 0.86, 1.06, 1.32, 1.61, 1.96 Inch outer diameter; Cable guides: 3.2, 4, 5, 6.2, 7.7, 9.6, 12, 15 mm | 0.12, 0.15, 0.19, 0.24, 0.30, 0.38, 0.5, 0.59 Inch inner diameter
• The winding spindles and cable guides interlock easily and are easily fastened
• Maneuver Ratio: 5/1: 5x Crank rotation = 1x spindle rotation
• Spindle/Guide diameter ratio: 0.8x sample diameter
• Device suitable for positioning in a cold chamber - Product No.: 402.0020.04

• Robust and compact design, easy to handle
• Fast, reliable and highly accurate measuring process
• Integrated hardware and software, touch monitor for intuitive operationReliable, high-precision clamping of the test specimen (including conical tools / conical wire guides)
• The highly precise alignment of camera and test object chuck both enable a highly accurate measurement
• No extraneous light influences thanks to measuring behind closed sliding door

• Standard-compliant, fully automated measurement
• Your guarantee for secure quality testing of geometrical attributes of cables, isolated conductors and hosepipes
• Excellent traceability and repeatability
• Reliable evaluation of obtained measuring results
• Intuitive operation – designed for use directly next to the extrusion line
• Operation possible without training – highly complex in the background – but easy, safe and quick to use
• All measurements are performed with image processing algorithms of the latest generation
• Modularly expandable (database interfaces, special geometries/shapes …)
• Clear, individually configurable and comprehensive result display
• The report design can be modified on an Excel basis

• Measuring device to detect the twist/lay/pitch length of sheathed cables
• Measurements according to the standards LV212 und LV122
• The twist length of the sample is measured without removing the sheath → this ensures a precise measurement
• Traditional methods manipulate the sample (cable stripping or unwinding of conductors) → a precise measurement is not possible anymore
• Via a PC connection, the measuring results can directly be exported
• Fully automatic: By clicking one button, the measuring sensor automatically moves along the sample

• 2 in 1: device contains the Hot Set Test as well as the Heat Pressure Test
• Robust and compact set including the device and an equipment case
• Possibility to attach a thermometer directly near the sample
• Measurement according to the cable standards IEC 60811 -507 (Hot Set Test) and IEC 60811 -508 (Heat Pressure Test) regarding sample attachment and weight attachment
• Precise choice of weights due to practical containers
• Simultaneous measurement of up to 3 cable or tube samples

• Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
• Guarantees fully-guarded measurements to fA and fF levels
• Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
• Allows probing of different pad materials and sizes
• Fast replacement of worn probes without the need for tools

Three Probe Technologies

• Infinity Probe: best for Al (Si)
• ACP Probe: best for AU (III-Vs)
• |Z| Probe: robust solution (long lifetime)
• Precision contact on a wide variety of materials from 26 GHz to 67 GHz
• Accurate results with excellent crosstalk
• Matching cables and substrates included

Precise Contact Solution

• RF chuck ±3 μm surface planarity
• Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
• Precision probe alignment
• Consistent contact force and overtravel
• Stable contact performance

WinCal Calibration Software

• Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
• Automated calibration monitoring
• Unique measurement & analysis methods
• Accurate S-parameter measurements
• Automatic calibration setup for higher efficiency
• Fast and easy data interpretation and reporting