FormFactor - Cascade Shield Enclosure Light-tight probing
-
Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
-
Application flexibility, ideal for use in high frequency applications
-
Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
-
Suitable for integration with vibration isolating tables
Shield Enclosures are designed for durable stability and sized to accommodate analytical probers equipped with all kinds of accessories, including thermal chucks, laser cutters, TV and emission cameras. The EMI-shielded version guarantees a light-tight and electromagnetically shielded environment for all sensitive measurements.
More Product Information
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Ice- and condensation-free probing down to 77 K (liquid nitrogen) or below 20 K (liquid helium)
-
Probe positioners placed inside vacuum chamber
-
Joystick controller
-
Manual probe positioners with rotary feed-throughs
-
User-centered design minimizes training costs and enhances efficiency
-
Comprehensive alignment functions – from simple wafer alignment and mapping to automated alignment and test of multiple singulated chips, like IR – Focal Plane Arrays
-
Interposers: x8 and x16 Slot, x4 Flying Lead pod, x4 M.2, x4 U.2 (available in dual port), and x16 SFF-8644
-
1U+ chassis with 128GB memory (64GB upstream and 64GB downstream)
-
Host-Client connection for remote debugging using Ethernet or local debugging using USB
-
SMB capture and trigger for NVMe Management Interface (NVMe-MI) observability
-
Simultaneously Analyze and Jam on a single chassis using one interposer
-
Decodes all PCIe and NVMe traffic at all layers of the stack including the TLP, DLLP, and PHY layer logic sub-blocks
-
Trigger and Search events include training sequences, ordered sets, queue pairs, PRPs, Scatter/Gather Lists (SGL), SMB, etc.
-
The Tap Upstream and Downstream ports allow AJA configuration Jamming
-
Cascade up to 4 Xgig captures into a single trace view
-
Full support of LTSSM for PCI Express
-
Memory segmentation for capture of multiple traces
-
Field replaceable modular fan and power supply assemblies
-
Portable, lightweight, and stand-alone
-
One-year hardware and three-year software warranties for the Xgig 4K16 PCI Express 4.0 Protocol Analyzer/Jammer
- On-Off power switch
- 20 A Circuit Breaker
- 8’ Flexible Power Cord
- Outlets – (4) 5-20R
- 3ft.
- (2) fork terminals (current)
- (1) fork terminals (ground)
- (2) Shielded Banana (voltage)
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
-
Best price per contact – typically over one million (1,000,000) touchdowns
-
RF/Microwave signal is shielded and completely air isolated in the probe body
-
Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
-
Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
-
Probe on any pad material with minimal damage
-
Replace costly and inflexible test fixtures with easy-to-use probe tips
-
Long lifetime – typically over 1,000,000 contacts
-
GS/SG footprint up to 4 GHz and GSG up to 20 GHz
-
High-power RF test: up to 30 Watts
-
Test at temperatures from -60°C to 200°C
-
Probe loss is 3 dB typical between 140 and 200 GHz, S11/S22 15 dB typical
-
Reduced unwanted couplings and transmission modes
-
Able to shrink pad geometries to 25 x 35 µm (best case)
-
Typical contact resistance < 0.05 Ω on Al, < 0.02 Ω on Au
-
WR15, WR12, WR10, WR8, WR6, WR4, WR3, and WR2 bands available.
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Probe positioners placed inside vacuum chamber
-
Short and stable probe arms
-
Joystick controller
-
Manual probe positioners with rotary feed-throughs
-
Software control of chuck for fast step-and-repeat testing of the entire wafer
-
Fast step-and-repeat testing of the whole wafer
-
User-centered design minimizes training costs and enhances efficiency
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000