Products
Displaying 1 - 8 of 8
Accurate return loss (RL) and insertion loss (IL) analyzer
Track and analyze return loss (RL) and insertion loss (IL) versus length
Analyze components in both reflection and transmission
Spectral analysis of IL and RL
Single scan measurement of IL, RL and PDL
High resolution (1.6 pm) and sensitivity (80 dB dynamic range)
Integrated tunable light source
Measure in transmission or reflection
Distributed reflectivity measurement
Event detectionLarge RL range
High spatial resolution
Clear identification of large and small peaks enables easier data interpretation
Single measurement, all-parameter analysis
Full characterization of components in less than 3 seconds
Complete polarization response
With single scan, simultaneously measure loss, polarization, dispersion, phase and time domain response
30 ms measurement speed
Wide wavelength range
High PDL accuracy
OLED display and analog output
User calibration function to optimize DOP and SOP accuracies at arbitrary wavelengths and temperatures
Real time Poincaré Sphere display, analog voltage output for SOP/DOP/power for ATE integration
Data logging of SOP up to 1 billion points
Flexible setup for different measurements
Simultaneous measurement of DGD, SOPMD, PDL
Jones or Mueller Matrix methods
Free space PSA input enables absolute SOP measurements
High crosstalk sensitivity
High spatial resolution
Large fiber measurement range